developed piezoelectric self-excitation and selfdetection mechanism in PZT microcantilevers for dynamic scanning force microscopy in liquid

Size: px
Start display at page:

Download "developed piezoelectric self-excitation and selfdetection mechanism in PZT microcantilevers for dynamic scanning force microscopy in liquid"

Transcription

1 Development of a piezoelectric self-excitation and self-detection mechanism in PZT microcantilevers for dynamic scanning force microscopy in liquid Chengkuo Lee a) Tokyo 153, Japan, and Department of Manufacturing Systems, Mechanical Engineering Laboratory, AIST, MITI, Tsukuba, Ibaraki 305, Japan Toshihiro Itoh and Takahiro Ohashi b) Tokyo 153, Japan Ryutaro Maeda Department of Manufacturing Systems, Mechanical Engineering Laboratory, AIST, MITI, Tsukuba, Ibaraki 305, Japan Tadatomo Suga Tokyo 153, Japan Received 12 September 1996; accepted 4 March 1997 We report on the first successful operation of a cyclic contact scanning force microscope SFM using a self-excited cantilever in liquid. Based on a new structure including a PZT reference pattern and a free-standing PZT cantilever, the piezoelectric self-excitation and self-detection mechanism for a PZT microcantilever was developed successfully. The topography is recorded by measuring the piezoelectric current variation, which corresponds to the vibration. Since the acoustic excitation from the external oscillator no longer exits, a clear single resonance peak can be obtained by using this self-excited force sensing PZT cantilever. Clear grating imaging in liquid was demonstrated, and it is compatible with the image taken in air. The future potential of applying this piezoelectric SFM to the characterization of biological samples in liquid is very promising American Vacuum Society. S X I. INTRODUCTION Since scanning force microscopy SFM was introduced by Binnig et al. in 1986, 1 its applications in biological science have progressed rapidly. 2 Among those applications, imaging of DNA and living cells in solution has become one of the most importance. Many researchers have employed contact mode SFM in such applications, but the cantilever tip acting on the surface could be a major cause of possible deformation and the slight modification of soft biological samples. The use of the cyclic contact mode SFM, i.e., the so-called tapping mode SFM, for imaging soft biological samples can reduce the influence of lateral forces and incur less deformation on soft biological samples. 3,4 In the cyclic contact mode, the cantilever is oscillated near its resonance frequency and only periodically touches the sample surface at the bottom of each swing; then the variation of vibrational amplitude is recorded as the image signals for sample topography. A microcantilever, an external piezoelectric oscillator, and an optical displacement sensing component are necessary constituents for a cyclic contact mode SFM system. a Present address: Microsystems Lab., ITRI, Bldg. 52, 195 Sec. 4, Chung Hsing Rd., Chutung, Hsinchu, Taiwan 310, R.O.C.; Electronic mail: @hq.itri.org.tw b Present address: Toto Ltd., 2-8-1, Honson, Chigasaki-city, Kanagawa Prefecture 253, Japan. Three force sensing schemes, i.e., piezoresistive, piezoelectric, and capacitive, are applied to activate the force sensing cantilevers. 5 7 Use of these force sensing cantilevers can eliminate the optical displacement sensor that occupies most of the space in a SFM and that also imposes operational difficulty for the SFM due to unavoidable alignment problems. An external piezoelectric oscillator will induce a severe damping influence on the cantilever when it operates in a liquid environment because of its relatively large volume. Only the self-excited force sensing microcantilever based on the piezoelectric scheme can overcome the drawbacks caused by the optical sensor and external oscillator without loss of performance and resolution in the SFM For a SFM equipped with a self-excited force sensing piezoelectric microcantilever, the essential component for cyclic contact mode SFM becomes simply the piezoelectric cantilever itself. In this study a piezoelectric PZT microcantilever for the cyclic contact SFM in liquid is proposed. Based on the successfully developed piezoelectric self-excitation and selfdetection mechanism for this PZT microcantilever, the operation of such cantilevers in liquid is characterized. Clear images of a grating sample are obtained by a SFM using this self-excited force sensing PZT microcantilever operated in a liquid environment. The images are compatible with the images taken in an ambient air environment J. Vac. Sci. Technol. B 15(4), Jul/Aug X/97/15(4)/1559/5/$ American Vacuum Society 1559

2 1560 Lee et al.: Development of piezoelectric self-excitation 1560 FIG. 1. Schematic drawing of the self-excited force sensing PZT microcantilever for SFM used in liquid. II. PIEZOELECTRIC EXCITATION AND DETECTION MECHANISM The design and structure of the self-excited force sensing PZT microcantilever are schematically illustrated in Fig. 1. The m-thick PZT film is deposited by a sol-gel process. 12 Ar ion beam etching is used to pattern the electrodes and the PZT layer, while reactive ion beam etching of C 3 F 8 /O 2 is applied to pattern the SiO 2 layer. Details of the microfabrication process of the self-excited force sensing PZT microcantilever are reported elsewhere. 10 Characteristics of the microfabricated PZT cantilever are outlined in Table I. The piezoelectric PZT cantilever is able to be excited by an applied ac voltage via the inverse piezoelectric effect, while the force sensing is executed by recording the piezoelectric current change due to the fact that the PZT layer may give a sensitive field response to weak stress through the direct piezoelectric effect. In order to measure the piezoelectric current caused by the cantilever vibration precisely, the capacitance current output from the piezoelectric cantilever must be negated because the piezoelectric layer of the cantilever is a capacitor as well. 8 A piezoelectric excitation and detection method for piezoelectric ZnO microcantilevers was proposed by Itoh and Suga. 8 A reference CR circuit was used to compensate for the capacitance current from the ZnO cantilevers. For these the capacitor and resistor, which have the same values as the capacitance and resistance of the ZnO cantilevers, were chosen as the reference circuit. TABLE I. Characteristics of the self-excited force sensing PZT microcantilever. Lever Lever PZT layer Calculated length width length spring constant 160 m 50 m 135 m 10.5 N/m Resonance frequency in air Resonance frequency in 2-propanol Quality factor in air Quality factor in 2-propanol khz 60 khz The capacitance of the ZnO layer is about 1 pf, whereas the capacitance of the PZT layer is about 50 pf. The capacitance current from the PZT cantilever is higher than the capacitance current from the ZnO cantilever. In addition, the capacitance value of the PZT layer is found to be influenced by the value and frequency of applied ac voltages in the high frequency range. 13 The capacitance value of the PZT layer also varies slightly for each different PZT cantilever. These factors make the offset canceling operation via outside electronics difficult and clear piezoelectric current signals for the PZT cantilevers become impossible to be read. As a result, in the present study the new structure includes a free-standing cantilever, and a reference pattern is developed for making the offset cancellation. Since this PZT reference pattern is the same size as the PZT cantilever, it is expected to possess the same capacitance and resistance as the cantilever. A differential current amplifier is used to record the current output coming from the reference pattern and the microcantilever when they both receive the same ac voltage. The piezoelectric current signals can then be recorded by deducting the capacitance current, which is the output from the reference pattern, from the output signals of cantilever. The variation of the vibrational amplitude can be measured by recording the piezoelectric current signals from the differential current amplifier. Figure 2 a shows the current output versus the driving frequency from the cantilever and reference pattern when the current output from both is recorded separately. The piezoelectric current versus the driving frequency recorded from the output of a differential current amplifier is shown in Fig. 2 b. Successful offset cancellation was done easily using this cantilever reference pattern structure. Compared to use of outside electronics for cancellation of the different piezoelectric cantilevers, the outside electronics themselves have to be modified depending on the capacitance and resistance of the different cantilevers. The differential current amplifier used here is sufficient for different cantilevers. III. DYNAMIC PIEZOELECTRIC SFM IN LIQUID A. Vibration versus driving frequency characteristics For the cyclic contact mode operation in liquid, the cantilever has to be excited at its resonance. Hansma et al. used the piezoelectric scanner to excite the cantilever by acoustic waves through the surrounding liquid, 3 while Putman et al. used a cantilever holder with an external piezoelectric oscillator to oscillate the cantilever. 4 Due to the strong viscous damping effect caused by the external oscillator, the cantilever is acoustically excited rather than mechanically excited by the oscillator. 4 In present study, in order to compare the two methods to each other, the PZT cantilever is either excited by an external oscillator or self-excited. The cyclic contact mode SFM using the self-excited force sensing PZT cantilever in liquid is schematically depicted in Fig. 3. The liquid used is 2-propanol, CH 3 CH OH CH 3, which has a boiling point of 82.3 C and a density of 0.78 g/cm 3 from Wako Chemicals, Co., Ltd., Tokyo. In Fig. 3 the PZT cantilever is self-excited J. Vac. Sci. Technol. B, Vol. 15, No. 4, Jul/Aug 1997

3 1561 Lee et al.: Development of piezoelectric self-excitation 1561 FIG. 3. Schematic diagram of a dynamic SFM using the self-excited force sensing PZT cantilever in liquid. The xy scanning and feedback actuation of tip sample spacing are executed by the tube scanner. The 2-propanol is used as the liquid in the sample holder for imitating the high viscous environment. FIG. 2. a Current output of a 160- m-long PZT cantilever and its reference pattern vs the driving frequency. The curves from the cantilever and reference pattern are recorded separately when an ac voltage of 12.5 mv is applied. b Piezoelectric current spectrum of a self-excited force sensing 160- m-long PZT cantilever in air. The excitation ac voltage of 20 mv is directly applied to the cantilever and its reference pattern. The piezoelectric current is measured by subtracting the reference current from the current output of the cantilever via the differential current amplifier. The first mechanical resonance peak is at khz. by an applied ac driving voltage. The mechanical vibrational amplitude is represented in terms of the piezoelectric current signals from the differential current amplifier based on the mechanism discussed in Sec. II. However the driving voltage can also be applied to a piezoelectric oscillator that is connected with the cantilever; then the cantilever will be excited. Thereafter the piezoelectric charge output will vary with the change of mechanical vibrational amplitude; the difference between charge output and the setup value is taken as the feedback signal to the scanner for z actuation. This is the piezoelectric charge detection method. 14 Using this method the piezoelectric charge output from the cantilever vibrated by the oscillator in liquid can be recorded as the function of driving voltage frequency. The resulting curve is shown in Fig. 4 a. Although we did not immerse the external oscillator into the liquid, the substantial vibration from the bulk silicon base still imposed a strong damping influence on the vibration of the PZT cantilever. The curve is basically similar to the curve demonstrated by Putman et al. 4 Figure 4 b, on the other hand, shows the curve of the piezoelectric current signals versus driving frequency that is measured by the SFM shown in Fig. 3. A broad, but very clear, resonance peak near 60 khz is observed. It indicates that acoustic excitation is almost avoided by using the self-excited cantilever. The incremental trend on the piezoelectric current output as driving frequency is increased is attributed to the fact that the piezoelectric current is proportional to the driving ac voltage frequency. A modified current output versus driving frequency can be calculated from the curve of Fig. 4 b by deleting the factor ascribed to ac voltage frequency, as shown in Fig. 4 c. The quality factor is then calculated as 6 from Fig. 4 c. Comparing the curve in air, i.e., Fig. 2 b, with the one in liquid, i.e., Fig. 4 b, the earlier resonance frequency drops from to 60 khz, and the quality factor is 200 in air and 6 in liquid, while the driving voltage used in liquid is 7.5 times greater than that in air. The vibrational amplitude versus driving voltage at the resonance can be calculated from the output current based on the method discussed in Ref. 10, in which the vibrational amplitude at the resonance equals the product of the static actuation ability and vibrational quality factor. The corresponding values are 25.6 nm/mv in air and 0.31 nm/mv in liquid. The damping coefficient per unit length of the cantilever can be obtained from the mass of per unit length, m e, times the resonance frequency, f R, divided by the quality factor, Q, i.e., C m e f R /Q. The damping coefficient of the PZT cantilever in liquid, i.e., 2-propanol, can be calculated as 18 times larger than the one in air. A strong influence by viscous damping in liquid can be concluded. B. Force curve of the cyclic contact mode and the images derived Figure 5 a shows a curve of piezoelectric current signals versus driving frequency by another 160- m-long cantilever. JVST B - Microelectronics and Nanometer Structures

4 1562 Lee et al.: Development of piezoelectric self-excitation 1562 FIG. 5. a Piezoelectric current spectrum of a self-excited force sensing 160- m-long PZT cantilever in liquid with an applied voltage of 375 mv. b Force curve trace in liquid of the self-excited PZT cantilever used in a. FIG. 4. a Piezoelectric charge spectrum of a 160- m-long PZT cantilever in liquid. The cantilever is excited by an external oscillator. Details of the experimental setup of the piezoelectric charge detection method can be found in Ref. 14. b Piezoelectric current spectrum of a self-excited force sensing 160- m-long PZT cantilever in liquid. The excitation ac voltage is 150 mv. The earlier mechanical resonance peak drops from khz in air Fig. 2 b to 60 khz in liquid. The cantilever used here is the same one used in a. c A modified spectrum of b. The quality factor calculated is 6. A slight shift of resonance frequency is observed between Fig. 5 a and Fig. 4 b, and the piezoelectric current outputs are somewhat different from the data in Fig. 4 b. These differences may not be due only to the deviation of cantilever characteristics from different cantilevers, but may also be due to the amount of liquid used in experiment setup because the initial amount might be different, and this amount may decrease depending on an increase in the operation time. The force curve derived is shown in Fig. 5 b. It is measured by recording the current signals from the current amplifier while the dc actuation voltage is applied to the scanner to control the spacing between the sample surface and the cantilever end. The sensitivity of a 160- m-long PZT cantilever in liquid can be defined as the slope of the force curve and its value is 1.2 na/nm. The minimum piezoelectric current output is also derived from the magnified area of a segment in the force curve. Then the amplitude resolution can be estimated by the minimum detectable current output/slope of force curve, i.e., 0.32 na/1.2 na/nm 0.27 nm at a bandwidth of 125 Hz. Because there is an apparatus setup angle, here, 30, the vertical resolution equals the vertical vector of the amplitude resolution and its value is 2.3 Å. This vertical resolution is sufficient to image most of the biological samples. For imaging the sample, a feedback bias is needed to keep the vibrational amplitude at the set point. This bias signal is then recorded as the trace of sample displacement in the z direction, i.e., its topography. Figure 6 a shows a SFM image of a Au film coated 1.0 m pitch SiO 2 grating in 2-propanol, taken by cyclic contact SFM with a self-excited force sensing 160- m-long PZT cantilever. Figure 6 b shows an image for a similar sample taken by cyclic contact SFM with a self-excited force sensing 125- m-long PZT cantilever operated in air. 10 In general, these images agree. J. Vac. Sci. Technol. B, Vol. 15, No. 4, Jul/Aug 1997

5 1563 Lee et al.: Development of piezoelectric self-excitation 1563 structure, the piezoelectric current, which corresponds to the vibration, can be precisely measured. We also demonstrated cyclic contact mode SFM in liquid using this self-excited force sensing PZT cantilever. Since the acoustic excitation from the external oscillator no longer exists, a clear single resonance peak can be observed. A clear grating image in liquid was demonstrated, and it is compatible with the image taken in air. The potential of applying this piezoelectric SFM to the characterization of biological samples in a solution environment is optimistic. Because this piezoelectric SFM of the cyclic contact mode can offer a fast and convenient way for operation in liquid, it may also be possible to reduce the influence of lateral forces and limit deformation on soft biological samples. ACKNOWLEDGMENT The authors would like to thank the Japan Science and Technology Corporation ~JST! for offering the National Institute postdoctoral fellowship to one of the authors ~C.L.!. 1 G. Binning, C. F. Quate, and C. H. Gerber, Phys. Rev. Lett. 56, 930 ~1986!. M. Radmacher, R. W. Tillmann, M. Fritz, and H. E. Gaub, Science 257, 1900 ~1992!. 3 P. K. Hansma, J. P. Cleveland, M. Radmacher, D. A. Walters, P. E. Hillner, M. Bezanilla, M. Fritz, D. Vie, H. G. Hansma, C. B. Prater, J. Massie, L. Fukunaga, J. Gurley, and V. Elings, Appl. Phys. Lett. 64, 1738 ~1994!. 4 C. A. J. Putman, K. O. Van Der Werf, B. G. De Grooth, N. F. Van Hulst, and J. Greve, Appl. Phys. Lett. 64, 2454 ~1994!. 5 M. Tortonese, R. C. Barrett, and C. F. Quate, Appl. Phys. Lett. 62, 834 ~1993!. 6 T. Itoh and T. Suga, Nanotechnology 4, 218 ~1993!. 7 T. Goddenhenrich, H. Lemke, U. Hartmann, and C. Heiden, J. Vac. Sci. Technol. A 8, 383 ~1990!. 8 T. Itoh, T. Ohashi, and T. Suga, IEICE Trans. Electron. E78-C, 146 ~1995!. 9 T. Itoh and T. Suga, Sens. Actuators A 54, 477 ~1996!. 10 C. Lee, R. Maeda, T. Itoh, and T. Suga, Proceedings of the 3rd France Japan/1st Europe Asia Congress on Mechatronics, Besancon, France, 1 3 Oct. 1996, Vol. 1, p T. Itoh, C. Lee, and T. Suga, Appl. Phys. Lett. 69, 2036 ~1996!. 12 C. Lee, S. Kawano, T. Itoh, and T. Suga, J. Mater. Sci. 31, 4559 ~1996!. 13 J.-F. Li, D. Viehland, C. D. E. Lakeman, and D. A. Payne, J. Mater. Res. 10, 1435 ~1995!. 14 C. Lee, T. Itoh, and T. Suga, IEEE Trans. Ultrason. Ferroelectr. Freq. Control 43, 553 ~1996!. 2 FIG. 6. ~a! A cyclic contact SFM image of a Au film coated 1.0 mm pitch SiO2 grating in 2-propanol. The scanning rate is 2 Hz and the sampling points are ~b! A cyclic contact SFM image of a sample similar to that used in ~a! taken in air. The scanning rate is 0.5 Hz and sampling points are IV. CONCLUSIONS A new device that includes a PZT reference pattern and a free-standing PZT cantilever is proposed for the realization of a self-excited force sensing PZT cantilever. Using this JVST B - Microelectronics and Nanometer Structures

Vibration Studying of AFM Piezoelectric Microcantilever Subjected to Tip-Nanoparticle Interaction

Vibration Studying of AFM Piezoelectric Microcantilever Subjected to Tip-Nanoparticle Interaction Journal of Novel Applied Sciences Available online at www.jnasci.org 2013 JNAS Journal-2013-2-S/806-811 ISSN 2322-5149 2013 JNAS Vibration Studying of AFM Piezoelectric Microcantilever Subjected to Tip-Nanoparticle

More information

Integrating MEMS Electro-Static Driven Micro-Probe and Laser Doppler Vibrometer for Non-Contact Vibration Mode SPM System Design

Integrating MEMS Electro-Static Driven Micro-Probe and Laser Doppler Vibrometer for Non-Contact Vibration Mode SPM System Design Tamkang Journal of Science and Engineering, Vol. 12, No. 4, pp. 399 407 (2009) 399 Integrating MEMS Electro-Static Driven Micro-Probe and Laser Doppler Vibrometer for Non-Contact Vibration Mode SPM System

More information

Measurement of hardness, surface potential, and charge distribution with dynamic contact mode electrostatic force microscope

Measurement of hardness, surface potential, and charge distribution with dynamic contact mode electrostatic force microscope REVIEW OF SCIENTIFIC INSTRUMENTS VOLUME 70, NUMBER 3 MARCH 1999 Measurement of hardness, surface potential, and charge distribution with dynamic contact mode electrostatic force microscope J. W. Hong,

More information

Instrumentation and Operation

Instrumentation and Operation Instrumentation and Operation 1 STM Instrumentation COMPONENTS sharp metal tip scanning system and control electronics feedback electronics (keeps tunneling current constant) image processing system data

More information

Lecture 4 Scanning Probe Microscopy (SPM)

Lecture 4 Scanning Probe Microscopy (SPM) Lecture 4 Scanning Probe Microscopy (SPM) General components of SPM; Tip --- the probe; Cantilever --- the indicator of the tip; Tip-sample interaction --- the feedback system; Scanner --- piezoelectric

More information

Piezoelectric Actuator for Micro Robot Used in Nanosatellite

Piezoelectric Actuator for Micro Robot Used in Nanosatellite Piezoelectric Actuator for Micro Robot Used in Nanosatellite R Bansevicius, S Navickaite, V Jurenas and A Bubulis PIEZOELECTRIC ACTUATOR FOR MICRO ROBOT USED IN NANOSATELLITE. R Bansevicius 1, S Navickaite,

More information

Scanning Force Microscopy

Scanning Force Microscopy Scanning Force Microscopy Roland Bennewitz Rutherford Physics Building 405 Phone 398-3058 roland.bennewitz@mcgill.ca Scanning Probe is moved along scan lines over a sample surface 1 Force Microscopy Data

More information

Scanning Tunneling Microscopy

Scanning Tunneling Microscopy Scanning Tunneling Microscopy Scanning Direction References: Classical Tunneling Quantum Mechanics Tunneling current Tunneling current I t I t (V/d)exp(-Aφ 1/2 d) A = 1.025 (ev) -1/2 Å -1 I t = 10 pa~10na

More information

Force Measurement with a Piezoelectric Cantilever in a Scanning Force Microscope

Force Measurement with a Piezoelectric Cantilever in a Scanning Force Microscope Utah State University DigitalCommons@USU Space Dynamics Lab Publications Space Dynamics Lab 1-1-1992 Force Measurement with a Piezoelectric Cantilever in a Scanning Force Microscope J. Tansock C. C. Williams

More information

Institute for Electron Microscopy and Nanoanalysis Graz Centre for Electron Microscopy

Institute for Electron Microscopy and Nanoanalysis Graz Centre for Electron Microscopy Institute for Electron Microscopy and Nanoanalysis Graz Centre for Electron Microscopy Micromechanics Ass.Prof. Priv.-Doz. DI Dr. Harald Plank a,b a Institute of Electron Microscopy and Nanoanalysis, Graz

More information

Application of electrostatic force microscopy in nanosystem diagnostics

Application of electrostatic force microscopy in nanosystem diagnostics Materials Science, Vol., No. 3, 003 Application of electrostatic force microscopy in nanosystem diagnostics TEODOR P. GOTSZALK *, PIOTR GRABIEC, IVO W. RANGELOW 3 Fulty of Microsystem Electronics and Photonics,

More information

Dopant Concentration Measurements by Scanning Force Microscopy

Dopant Concentration Measurements by Scanning Force Microscopy 73.40L Scanning Microsc. Microanal. Microstruct. 551 Classification Physics Abstracts - - 61.16P 73.00 Dopant Concentration Measurements by Scanning Force Microscopy via p-n Junctions Stray Fields Jacopo

More information

Design and Analysis of Various Microcantilever Shapes for MEMS Based Sensing

Design and Analysis of Various Microcantilever Shapes for MEMS Based Sensing ScieTech 014 Journal of Physics: Conference Series 495 (014) 01045 doi:10.1088/174-6596/495/1/01045 Design and Analysis of Various Microcantilever Shapes for MEMS Based Sensing H. F. Hawari, Y. Wahab,

More information

Basic Laboratory. Materials Science and Engineering. Atomic Force Microscopy (AFM)

Basic Laboratory. Materials Science and Engineering. Atomic Force Microscopy (AFM) Basic Laboratory Materials Science and Engineering Atomic Force Microscopy (AFM) M108 Stand: 20.10.2015 Aim: Presentation of an application of the AFM for studying surface morphology. Inhalt 1.Introduction...

More information

SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]

SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM] G01Q SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM] Scanning probes, i.e. devices having at least a tip of nanometre sized dimensions

More information

Piezoelectric Resonators ME 2082

Piezoelectric Resonators ME 2082 Piezoelectric Resonators ME 2082 Introduction K T : relative dielectric constant of the material ε o : relative permittivity of free space (8.854*10-12 F/m) h: distance between electrodes (m - material

More information

Fabrication and performance of d 33 -mode lead-zirconate-titanate (PZT) MEMS accelerometers

Fabrication and performance of d 33 -mode lead-zirconate-titanate (PZT) MEMS accelerometers Fabrication and performance of d 33 -mode lead-zirconate-titanate (PZT) MEMS accelerometers H. G. Yu, R. Wolf*,K. Deng +,L.Zou +, S. Tadigadapa and S. Trolier-McKinstry* Department of Electrical Engineering,

More information

Contents. What is AFM? History Basic principles and devices Operating modes Application areas Advantages and disadvantages

Contents. What is AFM? History Basic principles and devices Operating modes Application areas Advantages and disadvantages Contents What is AFM? History Basic principles and devices Operating modes Application areas Advantages and disadvantages Figure1: 2004 Seth Copen Goldstein What is AFM? A type of Scanning Probe Microscopy

More information

Module 26: Atomic Force Microscopy. Lecture 40: Atomic Force Microscopy 3: Additional Modes of AFM

Module 26: Atomic Force Microscopy. Lecture 40: Atomic Force Microscopy 3: Additional Modes of AFM Module 26: Atomic Force Microscopy Lecture 40: Atomic Force Microscopy 3: Additional Modes of AFM 1 The AFM apart from generating the information about the topography of the sample features can be used

More information

Scanning capacitance spectroscopy of an Al x Ga 1Àx NÕGaN heterostructure field-effect transistor structure: Analysis of probe tip effects

Scanning capacitance spectroscopy of an Al x Ga 1Àx NÕGaN heterostructure field-effect transistor structure: Analysis of probe tip effects Scanning capacitance spectroscopy of an Al x Ga 1Àx NÕGaN heterostructure field-effect transistor structure: Analysis of probe tip effects D. M. Schaadt and E. T. Yu a) Department of Electrical and Computer

More information

Sensors and Actuators A: Physical

Sensors and Actuators A: Physical Sensors and Actuators A 161 (2010) 266 270 Contents lists available at ScienceDirect Sensors and Actuators A: Physical journal homepage: www.elsevier.com/locate/sna Magnetic force memory effect using a

More information

INTRODUCTION TO SCA\ \I\G TUNNELING MICROSCOPY

INTRODUCTION TO SCA\ \I\G TUNNELING MICROSCOPY INTRODUCTION TO SCA\ \I\G TUNNELING MICROSCOPY SECOND EDITION C. JULIAN CHEN Department of Applied Physics and Applied Mathematics, Columbia University, New York OXFORD UNIVERSITY PRESS Contents Preface

More information

Laser Interferometric Displacement Measurements of Multi-Layer Actuators and PZT Ceramics

Laser Interferometric Displacement Measurements of Multi-Layer Actuators and PZT Ceramics Ferroelectrics, 320:161 169, 2005 Copyright Taylor & Francis Inc. ISSN: 0015-0193 print / 1563-5112 online DOI: 10.1080/00150190590967026 Laser Interferometric Displacement Measurements of Multi-Layer

More information

Foundations of MEMS. Chang Liu. McCormick School of Engineering and Applied Science Northwestern University. International Edition Contributions by

Foundations of MEMS. Chang Liu. McCormick School of Engineering and Applied Science Northwestern University. International Edition Contributions by Foundations of MEMS Second Edition Chang Liu McCormick School of Engineering and Applied Science Northwestern University International Edition Contributions by Vaishali B. Mungurwadi B. V. Bhoomaraddi

More information

Friction Drive Simulation of a SAW Motor with Slider Surface Texture Variation

Friction Drive Simulation of a SAW Motor with Slider Surface Texture Variation Advances in Science and Technology Vol. 54 (28) pp 366-371 online at http://www.scientific.net (28) Trans Tech Publications, Switzerland Online available since 28/Sep/2 Friction Drive Simulation of a SAW

More information

Chapter 2 Surface Acoustic Wave Motor Modeling and Motion Control

Chapter 2 Surface Acoustic Wave Motor Modeling and Motion Control Chapter 2 Surface Acoustic Wave Motor Modeling and Motion Control 1 Abstract For miniaturization of ultrasonic transducers, a surface acoustic wave device has an advantage in rigid mounting and high-power-density

More information

MODELING OF T-SHAPED MICROCANTILEVER RESONATORS. Margarita Narducci, Eduard Figueras, Isabel Gràcia, Luis Fonseca, Joaquin Santander, Carles Cané

MODELING OF T-SHAPED MICROCANTILEVER RESONATORS. Margarita Narducci, Eduard Figueras, Isabel Gràcia, Luis Fonseca, Joaquin Santander, Carles Cané Stresa, Italy, 5-7 April 007 MODELING OF T-SHAPED MICROCANTILEVER RESONATORS Margarita Narducci, Eduard Figueras, Isabel Gràcia, Luis Fonseca, Joaquin Santander, Carles Centro Nacional de Microelectrónica

More information

STM: Scanning Tunneling Microscope

STM: Scanning Tunneling Microscope STM: Scanning Tunneling Microscope Basic idea STM working principle Schematic representation of the sample-tip tunnel barrier Assume tip and sample described by two infinite plate electrodes Φ t +Φ s =

More information

ELASTICITY CHARACTERIZATION OF PIEZOELECTRIC DOMAIN BOUNDARY BY ULTRASONIC ATOMIC FORCE MICROSCOPY

ELASTICITY CHARACTERIZATION OF PIEZOELECTRIC DOMAIN BOUNDARY BY ULTRASONIC ATOMIC FORCE MICROSCOPY ELASTICITY CHARACTERIZATION OF IEZOELECTRIC DOMAIN BOUNDARY BY ULTRASONIC ATOMIC FORCE MICROSCOY T. Tsuji 1, H. Ogiso 2, J. Akedo 2, S. Saito 1, K. Fukuda 1, K. Yamanaka 1 ; 1 Tohoku University, Sendai,

More information

CHAPTER 4 DESIGN AND ANALYSIS OF CANTILEVER BEAM ELECTROSTATIC ACTUATORS

CHAPTER 4 DESIGN AND ANALYSIS OF CANTILEVER BEAM ELECTROSTATIC ACTUATORS 61 CHAPTER 4 DESIGN AND ANALYSIS OF CANTILEVER BEAM ELECTROSTATIC ACTUATORS 4.1 INTRODUCTION The analysis of cantilever beams of small dimensions taking into the effect of fringing fields is studied and

More information

DAMPING CONTROL OF A PZT MULTILAYER VIBRATION USING NEGATIVE IMPEDANCE CIRCUIT

DAMPING CONTROL OF A PZT MULTILAYER VIBRATION USING NEGATIVE IMPEDANCE CIRCUIT International Workshop SMART MATERIALS, STRUCTURES & NDT in AEROSPACE Conference NDT in Canada 2011 2-4 November 2011, Montreal, Quebec, Canada DAMPING CONTROL OF A PZT MULTILAYER VIBRATION USING NEGATIVE

More information

DESIGN AND FABRICATION OF THE MICRO- ACCELEROMETER USING PIEZOELECTRIC THIN FILMS

DESIGN AND FABRICATION OF THE MICRO- ACCELEROMETER USING PIEZOELECTRIC THIN FILMS DESIGN AND FABRICATION OF THE MICRO- ACCELEROMETER USING PIEZOELECTRIC THIN FILMS JYH-CHENG YU and FU-HSIN LAI Department of Mechanical Engineering National Taiwan University of Science and Technology

More information

Linker Dependent Bond Rupture Force Measurements in Single-Molecule Junctions

Linker Dependent Bond Rupture Force Measurements in Single-Molecule Junctions Supplemental Information Linker Dependent Bond Rupture Force Measurements in Single-Molecule Junctions M. Frei 1, S Aradhya 1, M. S. Hybertsen 2, L. Venkataraman 1 1 Department of Applied Physics and Applied

More information

SURFACE-DISPLACEMENT IMAGING USING OPTICAL BEAM DEFLECTION. S.E. McBride* and G.C. Wetsel, Jr.* Southern Methodist University Dallas, Texas 75275

SURFACE-DISPLACEMENT IMAGING USING OPTICAL BEAM DEFLECTION. S.E. McBride* and G.C. Wetsel, Jr.* Southern Methodist University Dallas, Texas 75275 SURFACE-DISPLACEMENT IMAGING USING OPTICAL BEAM DEFLECTION S.E. McBride* and G.C. Wetsel, Jr.* Southern Methodist University Dallas, Texas 75275 INTRODUCTION Important information on subsurface material

More information

10 Measurement of Acceleration, Vibration and Shock Transducers

10 Measurement of Acceleration, Vibration and Shock Transducers Chapter 10: Acceleration, Vibration and Shock Measurement Dr. Lufti Al-Sharif (Revision 1.0, 25/5/2008) 1. Introduction This chapter examines the measurement of acceleration, vibration and shock. It starts

More information

Outline. 4 Mechanical Sensors Introduction General Mechanical properties Piezoresistivity Piezoresistive Sensors Capacitive sensors Applications

Outline. 4 Mechanical Sensors Introduction General Mechanical properties Piezoresistivity Piezoresistive Sensors Capacitive sensors Applications Sensor devices Outline 4 Mechanical Sensors Introduction General Mechanical properties Piezoresistivity Piezoresistive Sensors Capacitive sensors Applications Introduction Two Major classes of mechanical

More information

Scanning Probe Microscopy. Amanda MacMillan, Emmy Gebremichael, & John Shamblin Chem 243: Instrumental Analysis Dr. Robert Corn March 10, 2010

Scanning Probe Microscopy. Amanda MacMillan, Emmy Gebremichael, & John Shamblin Chem 243: Instrumental Analysis Dr. Robert Corn March 10, 2010 Scanning Probe Microscopy Amanda MacMillan, Emmy Gebremichael, & John Shamblin Chem 243: Instrumental Analysis Dr. Robert Corn March 10, 2010 Scanning Probe Microscopy High-Resolution Surface Analysis

More information

7.Piezoelectric, Accelerometer and Laser Sensors

7.Piezoelectric, Accelerometer and Laser Sensors 7.Piezoelectric, Accelerometer and Laser Sensors 7.1 Piezoelectric sensors: (Silva p.253) Piezoelectric materials such as lead-zirconate-titanate (PZT) can generate electrical charge and potential difference

More information

Atomic and molecular interactions. Scanning probe microscopy.

Atomic and molecular interactions. Scanning probe microscopy. Atomic and molecular interactions. Scanning probe microscopy. Balázs Kiss Nanobiotechnology and Single Molecule Research Group, Department of Biophysics and Radiation Biology 27. November 2013. 2 Atomic

More information

SENSORS and TRANSDUCERS

SENSORS and TRANSDUCERS SENSORS and TRANSDUCERS Tadeusz Stepinski, Signaler och system The Mechanical Energy Domain Physics Surface acoustic waves Silicon microresonators Variable resistance sensors Piezoelectric sensors Capacitive

More information

EE C245 / ME C218 INTRODUCTION TO MEMS DESIGN FALL 2009 PROBLEM SET #7. Due (at 7 p.m.): Thursday, Dec. 10, 2009, in the EE C245 HW box in 240 Cory.

EE C245 / ME C218 INTRODUCTION TO MEMS DESIGN FALL 2009 PROBLEM SET #7. Due (at 7 p.m.): Thursday, Dec. 10, 2009, in the EE C245 HW box in 240 Cory. Issued: Thursday, Nov. 24, 2009 PROBLEM SET #7 Due (at 7 p.m.): Thursday, Dec. 10, 2009, in the EE C245 HW box in 240 Cory. 1. Gyroscopes are inertial sensors that measure rotation rate, which is an extremely

More information

Scanning Tunneling Microscopy

Scanning Tunneling Microscopy Scanning Tunneling Microscopy References: 1. G. Binnig, H. Rohrer, C. Gerber, and Weibel, Phys. Rev. Lett. 49, 57 (1982); and ibid 50, 120 (1983). 2. J. Chen, Introduction to Scanning Tunneling Microscopy,

More information

Dynamic Strain of Ultrasonic Cu and Au Ball Bonding Measured In-Situ by Using Silicon Piezoresistive Sensor

Dynamic Strain of Ultrasonic Cu and Au Ball Bonding Measured In-Situ by Using Silicon Piezoresistive Sensor 2017 IEEE 67th Electronic Components and Technology Conference Dynamic Strain of Ultrasonic Cu and Au Ball Bonding Measured In-Situ by Using Silicon Piezoresistive Sensor Keiichiro Iwanabe, Kenichi Nakadozono,

More information

Functional Microcantilever for a Novel Scanning Force Microscope

Functional Microcantilever for a Novel Scanning Force Microscope Journal of the Korean Physical Society, Vol. 52, No. 5, May 2008, pp. 14961500 Functional Microcantilever for a Novel Scanning Force Microscope Dong-Weon Lee School of Mechanical Engineering, Chonnam National

More information

ACOUSTIC EMISSION MEASUREMENTS ON PIEZOELECTRIC/ FERROELECTRIC MATERIALS

ACOUSTIC EMISSION MEASUREMENTS ON PIEZOELECTRIC/ FERROELECTRIC MATERIALS ACOUSTIC EMISSION MEASUREMENTS ON PIEZOELECTRIC/ FERROELECTRIC MATERIALS HIDEAKI ABURATANI Kitakyushu National College of Technology, Kokura-minami, Kitakyushu, Fukuoka, Japan Abstract Ferroelectric materials

More information

Supplementary Methods A. Sample fabrication

Supplementary Methods A. Sample fabrication Supplementary Methods A. Sample fabrication Supplementary Figure 1(a) shows the SEM photograph of a typical sample, with three suspended graphene resonators in an array. The cross-section schematic is

More information

The interpretation of STM images in light of Tersoff and Hamann tunneling model

The interpretation of STM images in light of Tersoff and Hamann tunneling model The interpretation of STM images in light of Tersoff and Hamann tunneling model The STM image represents contour maps of constant surface LDOS at E F, evaluated at the center of the curvature of the tip.

More information

Supplementary Information. Characterization of nanoscale temperature fields during electromigration of nanowires

Supplementary Information. Characterization of nanoscale temperature fields during electromigration of nanowires Supplementary Information Characterization of nanoscale temperature fields during electromigration of nanowires Wonho Jeong,, Kyeongtae Kim,, *, Youngsang Kim,, Woochul Lee,, *, Pramod Reddy Department

More information

Lecture 19. Measurement of Solid-Mechanical Quantities (Chapter 8) Measuring Strain Measuring Displacement Measuring Linear Velocity

Lecture 19. Measurement of Solid-Mechanical Quantities (Chapter 8) Measuring Strain Measuring Displacement Measuring Linear Velocity MECH 373 Instrumentation and Measurements Lecture 19 Measurement of Solid-Mechanical Quantities (Chapter 8) Measuring Strain Measuring Displacement Measuring Linear Velocity Measuring Accepleration and

More information

Intermittent-Contact Mode Force Microscopy & Electrostatic Force Microscopy (EFM)

Intermittent-Contact Mode Force Microscopy & Electrostatic Force Microscopy (EFM) WORKSHOP Nanoscience on the Tip Intermittent-Contact Mode Force Microscopy & Electrostatic Force Microscopy (EFM) Table of Contents: 1. Motivation... 1. Simple Harmonic Motion... 1 3. AC-Mode Imaging...

More information

Program Operacyjny Kapitał Ludzki SCANNING PROBE TECHNIQUES - INTRODUCTION

Program Operacyjny Kapitał Ludzki SCANNING PROBE TECHNIQUES - INTRODUCTION Program Operacyjny Kapitał Ludzki SCANNING PROBE TECHNIQUES - INTRODUCTION Peter Liljeroth Department of Applied Physics, Aalto University School of Science peter.liljeroth@aalto.fi Projekt współfinansowany

More information

Noninvasive determination of optical lever sensitivity in atomic force microscopy

Noninvasive determination of optical lever sensitivity in atomic force microscopy REVIEW OF SCIENTIFIC INSTRUMENTS 77, 013701 2006 Noninvasive determination of optical lever sensitivity in atomic force microscopy M. J. Higgins a R. Proksch Asylum Research, 6310 Hollister Ave, Santa

More information

General concept and defining characteristics of AFM. Dina Kudasheva Advisor: Prof. Mary K. Cowman

General concept and defining characteristics of AFM. Dina Kudasheva Advisor: Prof. Mary K. Cowman General concept and defining characteristics of AFM Dina Kudasheva Advisor: Prof. Mary K. Cowman Overview Introduction History of the SPM invention Technical Capabilities Principles of operation Examples

More information

Atomic Force Microscopy imaging and beyond

Atomic Force Microscopy imaging and beyond Atomic Force Microscopy imaging and beyond Arif Mumtaz Magnetism and Magnetic Materials Group Department of Physics, QAU Coworkers: Prof. Dr. S.K.Hasanain M. Tariq Khan Alam Imaging and beyond Scanning

More information

High speed and quick response precise linear stage system using V-shape transducer ultrasonic motors

High speed and quick response precise linear stage system using V-shape transducer ultrasonic motors High speed and quick response precise linear stage system using V-shape transducer ultrasonic motors K. Asumi, T. Fujimura and M. K. Kurosawa Taiheiyo-cement Corporation, Japan Tokyo Institute of Technology,

More information

The activities of micro-force measurement below 10 mn in Center for Measurement Standards

The activities of micro-force measurement below 10 mn in Center for Measurement Standards The activities of micro-force measurement below 10 mn in Center for Measurement Standards Sheng-Jui Chen and Sheau-Shi Pan With contribution from : Ya-Ko Chih, Chung-Lin Wu, Fu-Lung Pan, Chin-Fen Tuan

More information

3rd International Symposium on Instrumentation Science and Technology

3rd International Symposium on Instrumentation Science and Technology Measurement of Longitudinal Piezoelectric Coefficients (d 33 of Pb(Zr 0.50,Ti 0.50 O 3 Thin Films with Atomic Force Microscopy LIU Meng-wei a, DONG Wei-jie b, TONG Jian-hua a, WANG Jing b, CUI Yan a, CUI

More information

Citation for published version (APA): Mendoza, S. M. (2007). Exploiting molecular machines on surfaces s.n.

Citation for published version (APA): Mendoza, S. M. (2007). Exploiting molecular machines on surfaces s.n. University of Groningen Exploiting molecular machines on surfaces Mendoza, Sandra M IMPORTANT NOTE: You are advised to consult the publisher's version (publisher's PDF) if you wish to cite from it. Please

More information

State Feedback Control for Adjusting the Dynamic Behavior of a

State Feedback Control for Adjusting the Dynamic Behavior of a State Feedback Control for Adjusting the Dynamic Behavior of a Piezo-actuated Bimorph AFM Probe Bilal Orun 1, Serkan Necipoglu 2, Cagatay Basdogan 1* and Levent Guvenc 2 1 College of Engineering, Koc University,

More information

NIS: what can it be used for?

NIS: what can it be used for? AFM @ NIS: what can it be used for? Chiara Manfredotti 011 670 8382/8388/7879 chiara.manfredotti@to.infn.it Skype: khiaram 1 AFM: block scheme In an Atomic Force Microscope (AFM) a micrometric tip attached

More information

Mechatronics II Laboratory EXPERIMENT #1: FORCE AND TORQUE SENSORS DC Motor Characteristics Dynamometer, Part I

Mechatronics II Laboratory EXPERIMENT #1: FORCE AND TORQUE SENSORS DC Motor Characteristics Dynamometer, Part I Mechatronics II Laboratory EXPEIMENT #1: FOCE AND TOQUE SENSOS DC Motor Characteristics Dynamometer, Part I Force Sensors Force and torque are not measured directly. Typically, the deformation or strain

More information

Nanometer scale lithography of silicon(100) surfaces using tapping mode atomic force microscopy

Nanometer scale lithography of silicon(100) surfaces using tapping mode atomic force microscopy Nanometer scale lithography of silicon(100) surfaces using tapping mode atomic force microscopy J. Servat, a) P. Gorostiza, and F. Sanz Department Química-Fisica, Universitat de Barcelona, 08028 Barcelona,

More information

A flexoelectric microelectromechanical system on silicon

A flexoelectric microelectromechanical system on silicon A flexoelectric microelectromechanical system on silicon Umesh Kumar Bhaskar, Nirupam Banerjee, Amir Abdollahi, Zhe Wang, Darrell G. Schlom, Guus Rijnders, and Gustau Catalan Supporting Information Figure

More information

PERFORMANCE OF HYDROTHERMAL PZT FILM ON HIGH INTENSITY OPERATION

PERFORMANCE OF HYDROTHERMAL PZT FILM ON HIGH INTENSITY OPERATION PERFORMANCE OF HYDROTHERMAL PZT FILM ON HIGH INTENSITY OPERATION Minoru Kuribayashi Kurosawa*, Hidehiko Yasui**, Takefumi Kanda** and Toshiro Higuchi** *Tokyo Institute of Technology, Dept. of Advanced

More information

Electrical Characterization with SPM Application Modules

Electrical Characterization with SPM Application Modules Electrical Characterization with SPM Application Modules Metrology, Characterization, Failure Analysis: Data Storage Magnetoresistive (MR) read-write heads Semiconductor Transistors Interconnect Ferroelectric

More information

The Fluid-Coupled Motion of Micro and Nanoscale Cantilevers

The Fluid-Coupled Motion of Micro and Nanoscale Cantilevers IOSR Journal of Mechanical and Civil Engineering (IOSR-JMCE) e-issn: 2278-1684,p-ISSN: 2320-334X PP. 54-58 www.iosrjournals.org The Fluid-Coupled Motion of Micro and Nanoscale Cantilevers T Paramesh Associate

More information

2.76/2.760 Multiscale Systems Design & Manufacturing

2.76/2.760 Multiscale Systems Design & Manufacturing 2.76/2.760 Multiscale Systems Design & Manufacturing Fall 2004 MOEMS Devices for Optical communications system Switches and micromirror for Add/drops Diagrams removed for copyright reasons. MOEMS MEMS

More information

PHENOMENA, THEORY AND APPLICATIONS OF NEAR-FIELD ACOUSTIC LEVITATION

PHENOMENA, THEORY AND APPLICATIONS OF NEAR-FIELD ACOUSTIC LEVITATION PHENOMENA, THEORY AND APPLICATIONS OF NEAR-FIELD ACOUSTIC LEVITATION PACS REFERENCE: 43.25.Uv Ueha Sadayuki Precision and Intelligence Laboratory, Tokyo Institute of Technology 4259, Nagatsuta, Midori-ku,

More information

Surface Acoustic Wave Linear Motor

Surface Acoustic Wave Linear Motor Proc. of 3rd Int. Heinz Nixdorf Symp., pp. 113-118, Paderborn, Germany, May, 1999 Surface Acoustic Wave Linear Motor Minoru Kuribayashi Kurosawa and Toshiro Higuchi Dept. of Precision Machinery Engineering,

More information

Towards nano-mri in mesoscopic transport systems

Towards nano-mri in mesoscopic transport systems Towards nano-mri in mesoscopic transport systems P. Peddibhotla, M. Montinaro, D. Weber, F. Xue, and M. Poggio Swiss Nanoscience Institute Department of Physics University of Basel Switzerland 3 rd Nano-MRI

More information

SUPPLEMENTARY NOTES Supplementary Note 1: Fabrication of Scanning Thermal Microscopy Probes

SUPPLEMENTARY NOTES Supplementary Note 1: Fabrication of Scanning Thermal Microscopy Probes SUPPLEMENTARY NOTES Supplementary Note 1: Fabrication of Scanning Thermal Microscopy Probes Fabrication of the scanning thermal microscopy (SThM) probes is summarized in Supplementary Fig. 1 and proceeds

More information

Optimal Design and Evaluation of Cantilever Probe for Multifrequency Atomic Force Microscopy

Optimal Design and Evaluation of Cantilever Probe for Multifrequency Atomic Force Microscopy 11 th World Congress on Structural and Multidisciplinary Optimisation 07 th -12 th, June 2015, Sydney Australia Optimal Design and Evaluation of Cantilever Probe for Multifrequency Atomic Force Microscopy

More information

MCE603: Interfacing and Control of Mechatronic Systems

MCE603: Interfacing and Control of Mechatronic Systems MCE603: Interfacing and Control of Mechatronic Systems Chapter 7: Actuators and Sensors Topic 7d: Piezoelectric Actuators. Reference: Various articles. Cleveland State University Mechanical Engineering

More information

Force-distance studies with piezoelectric tuning forks below 4.2K

Force-distance studies with piezoelectric tuning forks below 4.2K submitted to APPLIED SURFACE SCIENCE nc-afm 99, Pontresina Force-distance studies with piezoelectric tuning forks below 4.2K J. Rychen, T. Ihn, P. Studerus, A. Herrmann, K. Ensslin Solid State Physics

More information

Outline Scanning Probe Microscope (SPM)

Outline Scanning Probe Microscope (SPM) AFM Outline Scanning Probe Microscope (SPM) A family of microscopy forms where a sharp probe is scanned across a surface and some tip/sample interactions are monitored Scanning Tunneling Microscopy (STM)

More information

Imaging Methods: Scanning Force Microscopy (SFM / AFM)

Imaging Methods: Scanning Force Microscopy (SFM / AFM) Imaging Methods: Scanning Force Microscopy (SFM / AFM) The atomic force microscope (AFM) probes the surface of a sample with a sharp tip, a couple of microns long and often less than 100 Å in diameter.

More information

And Manipulation by Scanning Probe Microscope

And Manipulation by Scanning Probe Microscope Basic 15 Nanometer Scale Measurement And Manipulation by Scanning Probe Microscope Prof. K. Fukuzawa Dept. of Micro/Nano Systems Engineering Nagoya University I. Basics of scanning probe microscope Basic

More information

Evaluation of a surface acoustic wave motor with a multi-contact-point slider

Evaluation of a surface acoustic wave motor with a multi-contact-point slider Smart Mater. Struct. 7 (1998) 305 311. Printed in the UK PII: S0964-1726(98)91230-7 Evaluation of a surface acoustic wave motor with a multi-contact-point slider Minoru Kuribayashi Kurosawa, Makoto Chiba

More information

CNPEM Laboratório de Ciência de Superfícies

CNPEM Laboratório de Ciência de Superfícies Investigating electrical charged samples by scanning probe microscopy: the influence to magnetic force microscopy and atomic force microscopy phase images. Carlos A. R. Costa, 1 Evandro M. Lanzoni, 1 Maria

More information

A CONTROL SYSTEMS PERSPECTIVE ON NANOINTERROGATION

A CONTROL SYSTEMS PERSPECTIVE ON NANOINTERROGATION A CONTROL SYSTEMS PERSPECTIVE ON NANOINTERROGATION Scanning Probe Microscopy At the 1959 annual meeting of the American Physical Society, Richard Feynman gave a seminal talk titled There s Plenty of Room

More information

Revealing High Fidelity of Nanomolding Process by Extracting the Information from AFM Image with Systematic Artifacts

Revealing High Fidelity of Nanomolding Process by Extracting the Information from AFM Image with Systematic Artifacts Revealing High Fidelity of Nanomolding Process by Extracting the Information from AFM Image with Systematic Artifacts Sajal Biring* Department of Electronics Engineering and Organic Electronics Research

More information

AFM for Measuring Surface Topography and Forces

AFM for Measuring Surface Topography and Forces ENB 2007 07.03.2007 AFM for Measuring Surface Topography and Forces Andreas Fery Scanning Probe : What is it and why do we need it? AFM as a versatile tool for local analysis and manipulation Dates Course

More information

ARTICLE IN PRESS. Ultramicroscopy

ARTICLE IN PRESS. Ultramicroscopy Ultramicroscopy 110 (2010) 826 830 Contents lists available at ScienceDirect Ultramicroscopy journal homepage: www.elsevier.com/locate/ultramic Real-time atomic force microscopy in lubrication condition

More information

Keysight Technologies Measuring Substrate-Independent Young s Modulus of Low-k Films by Instrumented Indentation. Application Note

Keysight Technologies Measuring Substrate-Independent Young s Modulus of Low-k Films by Instrumented Indentation. Application Note Keysight Technologies Measuring Substrate-Independent Young s Modulus of Low-k Films by Instrumented Indentation Application Note Introduction In digital circuits, insulating dielectrics separate the conducting

More information

Scanning Probe Microscopy (SPM)

Scanning Probe Microscopy (SPM) Scanning Probe Microscopy (SPM) Scanning Tunneling Microscopy (STM) --- G. Binnig, H. Rohrer et al, (1982) Near-Field Scanning Optical Microscopy (NSOM) --- D. W. Pohl (1982) Atomic Force Microscopy (AFM)

More information

Amplitude curves and operating regimes in dynamic atomic force microscopy

Amplitude curves and operating regimes in dynamic atomic force microscopy Ultramicroscopy 82 (2000) 79}83 Amplitude curves and operating regimes in dynamic atomic force microscopy Ricardo GarcmH a*, Alvaro San Paulo Instituto de Microelectro& nica de Madrid, CSIC, Isaac Newton

More information

FEM-SIMULATIONS OF VIBRATIONS AND RESONANCES OF STIFF AFM CANTILEVERS

FEM-SIMULATIONS OF VIBRATIONS AND RESONANCES OF STIFF AFM CANTILEVERS FEM-SIMULATIONS OF VIBRATIONS AND RESONANCES OF STIFF AFM CANTILEVERS Kai GENG, Ute RABE, Sigrun HIRSEKORN Fraunhofer Institute for Nondestructive Testing (IZFP); Saarbrücken, Germany Phone: +49 681 9302

More information

AFM Imaging In Liquids. W. Travis Johnson PhD Agilent Technologies Nanomeasurements Division

AFM Imaging In Liquids. W. Travis Johnson PhD Agilent Technologies Nanomeasurements Division AFM Imaging In Liquids W. Travis Johnson PhD Agilent Technologies Nanomeasurements Division Imaging Techniques: Scales Proteins 10 nm Bacteria 1μm Red Blood Cell 5μm Human Hair 75μm Si Atom Spacing 0.4nm

More information

Magneto-Mechanical Modeling and Simulation of MEMS Sensors Based on Electroactive Polymers

Magneto-Mechanical Modeling and Simulation of MEMS Sensors Based on Electroactive Polymers Magneto-Mechanical Modeling and Simulation of MEMS Sensors Based on Electroactive Polymers F.J.O. RODRIGUES, L.M. GONÇALVES, J.H. CORREIA, P.M. MENDES University of Minho, Dept. Industrial Electronics,

More information

Supplementary information for

Supplementary information for Supplementary information for Transverse electric field dragging of DNA in a nanochannel Makusu Tsutsui, Yuhui He, Masayuki Furuhashi, Rahong Sakon, Masateru Taniguchi & Tomoji Kawai The Supplementary

More information

Resistance Thermometry based Picowatt-Resolution Heat-Flow Calorimeter

Resistance Thermometry based Picowatt-Resolution Heat-Flow Calorimeter Resistance Thermometry based Picowatt-Resolution Heat-Flow Calorimeter S. Sadat 1, E. Meyhofer 1 and P. Reddy 1, 1 Department of Mechanical Engineering, University of Michigan, Ann Arbor, 48109 Department

More information

7. CONCLUSIONS & SCOPE

7. CONCLUSIONS & SCOPE 7. CONCLUSIONS & SCOPE ENERGY harvesting is a critical technology for the expansion of self-governing, self-powered electronic devices. As the energy requirements of low-power electronics reduction, the

More information

1302. Piezoelectric actuator for micro robot used in nanosatellite

1302. Piezoelectric actuator for micro robot used in nanosatellite 1302. Piezoelectric actuator for micro robot used in nanosatellite R. Bansevičius 1, S. Navickaitė 2, V. Jūrėnas 3, A. Bubulis 4 Kaunas University of Technology, Donelaičio 73, LT-44029 Kaunas, Lithuania

More information

Energy balance in self-powered MR damper-based vibration reduction system

Energy balance in self-powered MR damper-based vibration reduction system BULLETIN OF THE POLISH ACADEMY OF SCIENCES TECHNICAL SCIENCES, Vol. 59, No. 1, 2011 DOI: 10.2478/v10175-011-0011-4 Varia Energy balance in self-powered MR damper-based vibration reduction system J. SNAMINA

More information

An Energy Circulation Driving Surface Acoustic Wave Motor

An Energy Circulation Driving Surface Acoustic Wave Motor An Energy Circulation Driving Surface Acoustic Wave Motor Minoru K. Kurosawa Tokyo Institute of Technology Yokohama, Japan mkur@ae.titech.ac.jp Purevdagva Nayanbuu Tokyo Institute of Technology Yokohama,

More information

Università degli Studi di Bari "Aldo Moro"

Università degli Studi di Bari Aldo Moro Università degli Studi di Bari "Aldo Moro" Table of contents 1. Introduction to Atomic Force Microscopy; 2. Introduction to Raman Spectroscopy; 3. The need for a hybrid technique Raman AFM microscopy;

More information

Mathematical Modeling, Experimental Validation and Observer Design for a Capacitively Actuated Microcantilever

Mathematical Modeling, Experimental Validation and Observer Design for a Capacitively Actuated Microcantilever Mathematical Modeling, Experimental Validation and Observer Design for a Capacitively Actuated Microcantilever Mariateresa Napoli Bassam Bamieh Kimberly Turner 3 Department of Mechanical Engineering, University

More information

Electrostatic Force Microscopy (EFM)

Electrostatic Force Microscopy (EFM) 6 Electrostatic Force Microscopy (EFM) Masakazu Nakamura and Hirofumi Yamada 1 Department of Electronics and Mechanical Engineering, Faculty of Engineering, Chiba University, 1-33 Yayoi-cho, Inage-ku,

More information

Rheological measurements using microcantilevers

Rheological measurements using microcantilevers Rheological measurements using microcantilevers S. Boskovic Department of Chemical Engineering and School of Chemistry, The University of Melbourne, Victoria, 3010 Australia J. W. M. Chon and P. Mulvaney

More information

Nano and micro Hall-effect sensors for room-temperature scanning hall probe microscopy

Nano and micro Hall-effect sensors for room-temperature scanning hall probe microscopy Microelectronic Engineering 73 74 (2004) 524 528 www.elsevier.com/locate/mee Nano and micro Hall-effect sensors for room-temperature scanning hall probe microscopy A. Sandhu a, *, A. Okamoto b, I. Shibasaki

More information