KARAKTERIZACIJA STRUKTURA NANO- METARSKIH DIMENZIJA PRIMENOM SPEKTROSKOPSKE ELIPSOMETRIJE*

Save this PDF as:
 WORD  PNG  TXT  JPG

Size: px
Start display at page:

Download "KARAKTERIZACIJA STRUKTURA NANO- METARSKIH DIMENZIJA PRIMENOM SPEKTROSKOPSKE ELIPSOMETRIJE*"

Transcription

1 MILKA M. MIRIĆ MARKO B. RADOVIĆ RADOŠ B. GAJIĆ ZORANA D. DOHČEVIĆ-MITROVIĆ ZORAN V. POPOVIĆ Centar za fiziku čvrstog stana i nove materiale, Institut za fiziku, Beograd, Srbia NAUČNI RAD KARAKTERIZACIJA STRUKTURA NANO- METARSKIH DIMENZIJA PRIMENOM SPEKTROSKOPSKE ELIPSOMETRIJE* U ovom radu smo metodom spektroskopske elipsometrie analizirali optičke osobine tankih filmova, nanoprahova i ugleničnih nanotuba u UV-VIS-NIR oblasti. U zavisnosti od broa tankih filmova Si 3 N 4 i SiO, koristili smo dvofazni, trofazni i višefazni modeli, a za opisivane neravnina Bruggeman-ovu aproksimaciu efektivne sredine. Elektronski prelazi kod nanoprahova CeO opisali smo pomoću Tauc-Lorentz modela i utvrdili smo energetski procep materiala. Analizirali smo spektar ugleničnih nanotuba na supstratu od siliciuma. UDK 543.4:539.3:535.3:661.8'065 DOI: 10.98/HEMIND09037M Oslanaući se na posebne osobine materiala nanometarskih dimenzia, razvio se čitav niz nihovih novih primena u elektronici i optici, nanobiloškim sistemima i u medicini. Jedan od kritičnih izazova sa koima se susreću istraživači na polu nanotehnologie e kako posmatrati, meriti i manipulisati materialima nanometarskih dimenzia [1]. Veličina koa karakteriše optičke osobine materiala e nihova dielektrična funkcia. Na dielektričnu funkciu nanostrukturnih materiala poseban utica imau veličina i orientacia čestica, udeo čestica različitog materiala, neravnine na površini uzorka kao i bro i deblina filmova u višeslonim strukturama []. Dielektrična funkcia poluprovodničkih materiala povezana e sa strukturom energetskih zona 3. Prelazi koi se odviau unutar ovih zona, uklučuući i ekscitonske efekte, utiču na oblik dielektrične funkcie. Ova oblik se mena pri promeni mikrostrukture materiala, er one unose promenu u nihovu zonsku strukturu. Upravo ovi faktori otežavau interpretaciu podataka celokupnog, složenog sistema koe nosi dielektrična funkcia = r i i, gde su r i i nen realni, odnosno imaginarni deo, pa e potreban opšti parametarski opis. Spektroskopska elipsometria (SE) e optička tehnika koa meri količnik kompleksnih koeficienata s- i p- komponenti polarizacie svetlosti pri refleksii od uzorka. Prednosti SE u odnosu na druge metode su višestruke. Ova tehnika e beskontaktna i nedestruktivna. Izuzetno e precizna pri određivanu debline filmova tako da se pomoću ne može postići rezolucia mana od desetog dela 1 nm. Ona e takođe apsolutna, što znači da ne zahteva referentno merene, a realni i imaginarni deo dielektrične funkcie se mogu odrediti bez korišćena kompleksne Kramers-Kroning analize. *Rad saopšten na skupu Sedmi seminar mladih istraživača, Beograd, 4. decembar 008. Autor za prepisku: M. Mirić, Institut za fiziku, Pregrevica 118, Beograd, Srbia. E-pošta: Rad primlen:. decembar 008. Rad prihvaćen: 15. februar 009. Cil ovog rada e proučavane optičkih svostva kao i debline filmova različitih materiala nanometarskih dimenzia u UV-VIS-NIR oblasti. EKSPERIMENTALNI DEO Elipsometriski spektri analizirani u ovom radu dobieni su pomoću SOPRA GES-5 elipsometra sa mogućnošću promene upadnog ugla. On radi u osnovno konfiguracii sa rotiraućim polarizatorom. Izvor svetlosti e ksenonska lampa, a za detekciu se u UV-VIS oblasti koristi fotomultiplikator, dok se za NIR oblast koristi poluprovodnički InGaAs detektor. Za uzorke sa transparentnim supstratom korišćena e «mikrospot» opcia, da bi se izbegla neželena refleksia sa negove zadne strane. U slučau tankog filma SiO na supstratu od Si, sniman e spektar na opsegu 1,5 5,1 ev, sa korakom od 0,05 ev i upadnim uglom 75, dok su spektri uzoraka sa više filmova snimani na opsegu 1,5 4,3 ev, sa korakom 0,05 ev i upadnim uglom 70. Spektri nanopraha CeO i ugleničnih nanotuba snimani su na opsegu 1,5 6,1 ev, sa korakom takođe od 0,05 ev i upadnim uglom 70. Fitovane modela na eksperimentalnu krivu vršeno e pomoću Levenberg-Marquardt algoritma, pri čemu se analitički parametri koi se istovremeno određuu iterativnim postupkom menau sve dok funkcia greške (1) ne bude namana moguća [4,5]: N m 1 i1 N 1 eksp ( ) izr ( ) (1) ( ) U prethodnom izrazu, N predstavla ukupan bro snimlenih tačaka, m bro analitičkih parametara, ρ eksp (λ ) eksperimentalne vrednosti, ρ eksp (λ ) vrednosti izračunate na osnovu modela, λ talasna dužina svetlosti, a pomoću parametra σ se uračunava greška eksperimenta. Svi proračuni su obavleni pomoću programskog paketa Winelli_II Version

2 M.M. MIRIĆ i sar.: KARAKTERIZACIJA STRUKTURA NANOMETARSKIH DIMENZIJA... Hem. ind. 63 (3) 7 31 (009) REZULTATI I DISKUSIJA Na slici 1a prikazani su izmereni spektri elipsometriskih parametara tg(ψ) i cos(), za uzorak koi čini slo SiO na supstratu od Si. Eksperimentalni rezultati prikazani su kvadratima dok puna linia predstavla numerički modelovanu krivu. Fitovane eksperimentalnih podataka izvršeno e pomoću trofaznog modela 6, supstrat-film-ambient (slika 1b) i određena e deblina oksida. Model za uzorak koi se sastoi od stakla kao supstrata i tankog filma Si 3 N 4 prikazan e na slici b. Izmereni (kvadrati) i numerički modelovani spektri elipsometriskih parametara (puna linia), tg(ψ) i cos(), dati su na slici a. Kod ovog uzorka se pomoću SE može utvrditi postoane međusloa koi e mešavina stakla i Si 3 N 4. On e posledica činenice da površina stakla nie idealno ravna. Optičke osobine ovog međusloa određene su pomoću Bruggeman-ove aproksimacie 7. Debline sloeva su prikazane su na slici b. Naznačen e i međuslo i određen udeo svakog od dva materiala koi ulaze u negov sastav. Druga interesantna poava, otkrivena pomoću SE e da postoi tanak slo SiO koi nie unapred predviđen i koi se spontano stvorio na filmu Si 3 N 4. Slika 1. Tanki film SiO na supstratu od Si; a) rezultati merena i naboli fit; b) izgled strukture. Figure 1. Thin film of SiO on a Si substrate; a) experimental and calculated spectra; b) sketched structure. Slika. Niz sloeva na supstratu od stakla; a) rezultati merena i naboli fit; b) izgled strukture. Figure Multilayer system on glass substrate; a) experimental and calculated spectra ;b) sketched structure. Na slici 3 prikazan e model za uzorak kod koga se na supstratu od stakla nalazi čak 1 filmova, naizmenično poređanih Si 3 N 4 /SiO. Numerički modelovana kriva (puna linia), što se može videti sa slike 3a, sasvim dobro prati eksperimentalnu krivu (kvadrati). Podaci o deblinama poedinih sloeva dati su na slici 3b. 8

3 M.M. MIRIĆ i sar.: KARAKTERIZACIJA STRUKTURA NANOMETARSKIH DIMENZIJA... Hem. ind. 63 (3) 7 31 (009) Slika 3. Niz naizmeničnih sloeva Si 3 N 4 /SiO na supstratu od stakla; a) rezultati merena i naboli fit; b) izgled structure. Figure 3. Multilayer structure consisting of alternating Si 3 N 4 /SiO on a glass substrate; a) experimental and calculated spectra; b) sketched structure. Nanoprah CeO Spektri imaginarnog i realnog dela dielektrične funkcie nanopraha CeO dati su na slici 4. Eksperimentalni rezultati su fitovani pomoću Tauc-Lorentz modela 8,9 sa dva Lorentz-ova oscilatora. Opšti oblik za imaginarni deo dielektrične funkcie u ovom modelu u slučau ednog oscilatora opisan e relaciom: AE C( E Eg ) 0 1, E E g itl( E) ( E E ) C E E () 0 0, E Eg gde e E g energetski procep, E 0 energia prelaza, A intenzitet, a C širina pika. Realni deo dielektrične funkcie se izračunava pomoću Kramers-Kronig analize kao: Slika 3. Niz naizmeničnih sloeva Si 3 N 4 /SiO na supstratu od stakla; a) rezultati merena i naboli fit; b) izgled structure. Figure 3. Multilayer structure consisting of alternating Si 3 N 4 /SiO on a glass substrate; a) experimental and calculated spectra; b) sketched structure. 9

4 M.M. MIRIĆ i sar.: KARAKTERIZACIJA STRUKTURA NANOMETARSKIH DIMENZIJA... Hem. ind. 63 (3) 7 31 (009) rtl i ( ) ( E) P d (3) E E g gde e dielektrična funkcia na višim učestanostima. Prvi oscilator opisue prelaz sa nominalne Op trake na Ce4f stana [10]. Položa negovog pika dobien e na osnovu fitovana eksperimentalnih rezultata i iznosi 3,8 ev. Drugi oscilator e korišćen da bi opisao niskoenergetske repove prelaza višeg reda (Op Ce5d) i on varira u opsegu 6,9 10 ev. Imaginarni deo dielektrične funkcie odgovara gustini elektronskih stana materiala. U slučau kada važi parabolična aproksimacia, položa direktnog procepa se može odrediti na osnovu formalizma Tauc, Grigrovici i Vancu [11]. Naime, vrednost direktnog procepa se može izračunati na osnovu relacie (slika 5): Uglenične nanotube Na slici 6 prikazani su realni i imaginarni deo pseudodielektrične funkcie ugleničnih nanotuba na supstratu od siliciuma. Poam «pseudodielektrična» znači da se uzorak posmatra kao masivan iako ga čine supstrat od siliciuma i slo koi čine nanotube. Dok se ne odredi deblina sloa, ne može se mnogo znati o nanotubama, er u spektru učestvuu i optičke osobine supstrata. Kako oš uvek ne postoi odgovaraući model koi bi opisao dielektričnu funkciu ugleničnih nanotuba, ne mogu se preciznie odrediti parametri koi bi e interpretirali. Ono što se ipak može primetiti e da u delu spektra na nižim energiama, kristal siliciuma e gotovo transparentan, što znači da se apsorpcia u tom delu spektra može pripisati samo nanotubama. Uočen e pik absorpcie na energii 1,9 ev i označen e na slici 7. E) C ( E ) (4) ( 1 E g gde e koeficient apsorpcie materiala, a C 1 nagib linearne oblasti. Korišćenem izraza (4) dobiena e vrednost E g = 3,3 ev. Slika 6. Realni i imaginarni deo pseudodielektrične funkcie ugleničnih nanotuba na supstratu od siliciuma. Figure 6. Real and imaginary part of pseudodielectric function of carbon nanotubes on Si substrate. Slika 5. Određivane direktnog energetskog procepa na osnovu Tauc-ovog formalizma. Figure 5. Direct band gap calculation using Tauc formalism. Slika 7. Koeficient apsorpcie za ceo uzorak ugleničnih nanotuba na supstratu od sliciuma i za supstrat. Figure 7. Absorption coefficient for the entire sample of carbon nanotubes on Si substrate and for substrate only. ZAKLJUČAK U ovom radu e pokazano da se pomoću spektroskopske elipsometrie mogu proučavati optičke osobine materiala nanometarskih dimenzia. Činenica da e ova tehnika osetliva na postoane vrlo tankih filmova omogućila e ne samo da se izmere nihove debline, već i da 30

5 M.M. MIRIĆ i sar.: KARAKTERIZACIJA STRUKTURA NANOMETARSKIH DIMENZIJA... Hem. ind. 63 (3) 7 31 (009) se uoče neravnine u strukturi kao i tanak slo oksida koi se spontano stvorio na površini uzorka. Za karakterizaciu nanoprahova CeO bilo e neophodno parametrizovati nihovu optičku funkciu pomoću Tauc-Lorentz modela. Spektri realnog i imaginarnog dela pseudodielektrične funkcie ugleničnih nanotuba na supstratu od siliciuma takođe nose bitne informacie o energetskim prelazima unutar strukture, ali za nihovu interpretaciu potrebna e složenia analiza. Mogućnost korišćena spektroskopske elipsometrie u izučavanu optičkih osobina nanomateriala otvara put novim otkrićima u ovo oblasti. Zahvalnost Ova rad e finansiran od strane Ministarstva za nauku i tehnološki razvo Republike Srbie, proekat br : Fizika niskodimenzionih i nanometarskih struktura i materiala i evropskog FP7 proekta: Nanocharm. LITERATURA [1] G. Cao, Nanostructures and Nanomaterials, Imperial College Press, London, [] M. Losurdo, Thin Solid Films (004) [3] H.G. Tompkins, E.A. Irene, Handbook of Ellipsometry, William Andrew, New York, USA, 1996, p [4] G.E. Jellison, Jr., Appl. Opt. 30 (1991) [5] G.E. Jellison, Jr., Thin Solid Films 34 (1993) [6] R.M.A. Azzam, N.M. Bashara, Ellipsometry and Polarized Light, North-Holland Physics Publishing, Amsterdam, 1987, p. 83. [7] D.E. Aspnes, Thin Solid Films 89 (198) [8] G.E. Jellison, Jr., F.A. Modine, Appl. Phys. Lett. 69 (1996) 371. [9] G.E. Jellison, Jr., F.A. Modine, Appl. Phys. Lett. 69 (1996) 137. [10] P. Patsalas, S. Logothetidis, L. Sygellou, S. Kennou, Phys. Rev. B 68 (003) [11] J. Tauc, R. Grigorovici, A. Vancu, Phys. Stat. Sol. 15 (1966) SUMMARY CHARACTERISATION OF NANODIMENSIONAL STRUCTURES USING SPECTROSCOPIC ELLIPSOMETRY Milka M. Mirić, Marko B. Radović, Radoš B. Gaić, Zorana D. Dohčević-Mitrović, Zoran V. Popović Center for Solid State Physics and New Materials, Institute of Physics, Pregrevica 118, Belgrade, Serbia (Scientific paper) In this paper, using spectroscopic ellipsometry we studied the optical properties of thin films, nanocrystals and carbon nanotubes in UV-VIS-NIR range. With a three-phase model, we calculated the thickness of the SiO film on a silicon substrate. Using the model for multilayer structure together with the Bruggeman effective medium approximation we determined the existence of roughness on a glass substrate and we calculated the thickness of that layer. We also determined the thicknesses of 1 layers, Si 3 N 4 i SiO deposited alternately on a glass substrate. The dielectric function of CeO nanocrystal was modeled using the Tauc-Lorentz model and we calculated the value of the energy gap for this material. By analyzing the ellipsometry spectra for the carbon nanotube layer on the silicon substrate, we measured the real and imaginary part of its dielectric function. Klučne reči: Nanomateriali Optičke osobine Spektroskopska elipsometria Key words: Nanomaterials Optical properties Spectroscopic ellipsometry 31

Red veze za benzen. Slika 1.

Red veze za benzen. Slika 1. Red veze za benzen Benzen C 6 H 6 je aromatično ciklično jedinjenje. Njegove dve rezonantne forme (ili Kekuléove structure), prema teoriji valentne veze (VB) prikazuju se uobičajeno kao na slici 1 a),

More information

OPTICAL ANALYSIS OF ZnO THIN FILMS USING SPECTROSCOPIC ELLIPSOMETRY AND REFLECTOMETRY.

OPTICAL ANALYSIS OF ZnO THIN FILMS USING SPECTROSCOPIC ELLIPSOMETRY AND REFLECTOMETRY. OPTICAL ANALYSIS OF ZnO THIN FILMS USING SPECTROSCOPIC ELLIPSOMETRY AND REFLECTOMETRY Katarína Bombarová 1, Juraj Chlpík 1,2, Soňa Flickyngerová 3, Ivan Novotný 3, Július Cirák 1 1 Institute of Nuclear

More information

Projektovanje paralelnih algoritama II

Projektovanje paralelnih algoritama II Projektovanje paralelnih algoritama II Primeri paralelnih algoritama, I deo Paralelni algoritmi za množenje matrica 1 Algoritmi za množenje matrica Ovde su data tri paralelna algoritma: Direktan algoritam

More information

Ellipsometry Tutorial

Ellipsometry Tutorial Introduction Ellipsometry Tutorial [http://www.jawoollam.com/tutorial_1.html] This tutorial provided by the J. A. Woollam Co. is an introduction to ellipsometry for anyone interested in learning more about

More information

Supporting Information

Supporting Information Supporting Information Devlin et al. 10.1073/pnas.1611740113 Optical Characterization We deposit blanket TiO films via ALD onto silicon substrates to prepare samples for spectroscopic ellipsometry (SE)

More information

Algoritam za množenje ulančanih matrica. Alen Kosanović Prirodoslovno-matematički fakultet Matematički odsjek

Algoritam za množenje ulančanih matrica. Alen Kosanović Prirodoslovno-matematički fakultet Matematički odsjek Algoritam za množenje ulančanih matrica Alen Kosanović Prirodoslovno-matematički fakultet Matematički odsjek O problemu (1) Neka je A 1, A 2,, A n niz ulančanih matrica duljine n N, gdje su dimenzije matrice

More information

DUV ( nm ) Characterization of Materials: A new instrument, the Purged UV Spectroscopic Ellipsometer,

DUV ( nm ) Characterization of Materials: A new instrument, the Purged UV Spectroscopic Ellipsometer, WISE 2000, International Workshop on Spectroscopic Ellipsometry, 8 9 May 2000 DUV (150 350nm ) Characterization of Materials: A new instrument, the Purged UV Spectroscopic Ellipsometer, Pierre BOHER,,

More information

THERMAL DIFFUSIVITY COEFFICIENTS BY AIR FLUIDIZED BED UDC Jelena N. Janevski, Branislav Stojanović, Mladen Stojiljković

THERMAL DIFFUSIVITY COEFFICIENTS BY AIR FLUIDIZED BED UDC Jelena N. Janevski, Branislav Stojanović, Mladen Stojiljković FACTA UNIVERSITATIS Series: Mechanical Engineering Vol. 2, N o 1, 2004, pp. 125-134 THERMAL DIFFUSIVITY COEFFICIENTS BY AIR FLUIDIZED BED UDC 66.045 Jelena N. Janevski, Branislav Stojanović, Mladen Stojiljković

More information

ADAPTIVE NEURO-FUZZY MODELING OF THERMAL VOLTAGE PARAMETERS FOR TOOL LIFE ASSESSMENT IN FACE MILLING

ADAPTIVE NEURO-FUZZY MODELING OF THERMAL VOLTAGE PARAMETERS FOR TOOL LIFE ASSESSMENT IN FACE MILLING http://doi.org/10.24867/jpe-2017-01-016 JPE (2017) Vol.20 (1) Original Scientific Paper Kovač, P., Rodić, D., Gostimirović, M., Savković, B., Ješić. D. ADAPTIVE NEURO-FUZZY MODELING OF THERMAL VOLTAGE

More information

Thin Film Characterization Using Rotating Polarizer Analyzer Ellipsometer with a Speed Ratio 1:3

Thin Film Characterization Using Rotating Polarizer Analyzer Ellipsometer with a Speed Ratio 1:3 Journal of Electromagnetic Analysis and Applications,, 3, 35-358 doi:.436/jemaa..3956 Published Online September (http://www.scirp.org/journal/jemaa) 35 Thin Film Characterization Using Rotating Polarizer

More information

PRECIPITATION FORECAST USING STATISTICAL APPROACHES UDC 55:311.3

PRECIPITATION FORECAST USING STATISTICAL APPROACHES UDC 55:311.3 FACTA UNIVERSITATIS Series: Working and Living Environmental Protection Vol. 10, N o 1, 2013, pp. 79-91 PRECIPITATION FORECAST USING STATISTICAL APPROACHES UDC 55:311.3 Mladjen Ćurić 1, Stanimir Ţivanović

More information

Spectroscopic Ellipsometry (SE) in Photovoltaic Applications

Spectroscopic Ellipsometry (SE) in Photovoltaic Applications Spectroscopic Ellipsometry (SE) in Photovoltaic Applications Jianing Sun, James Hilfiker, Greg Pribil, and John Woollam c-si PVMC Metrology Workshop July 2012, San Francisco PV key issues Material selection

More information

VOLUME CORRECTION FACTOR IN ELECTRON-INDIUM ATOM SCATTERING EXPERIMENTS UDC

VOLUME CORRECTION FACTOR IN ELECTRON-INDIUM ATOM SCATTERING EXPERIMENTS UDC FACTA UNIVERSITATIS Series: Physics, Chemistry and Technology Vol. 6, N o 1, 28, pp. 119-125 DOI: 1.2298/FUPCT81119R VOLUME CORRECTION FACTOR IN ELECTRON-INDIUM ATOM SCATTERING EXPERIMENTS UDC 539.171

More information

PROGRAM FOR CALCULATION OF A DEFLECTION OF A UNIFORM LOADED SQUARE PLATE USING GAUSS-SEIDEL METHOD FOR SOLUTION OF POISSON DIFFERENTIAL EQUATION

PROGRAM FOR CALCULATION OF A DEFLECTION OF A UNIFORM LOADED SQUARE PLATE USING GAUSS-SEIDEL METHOD FOR SOLUTION OF POISSON DIFFERENTIAL EQUATION FACTA NIVERSITATIS Series: Architecture and Civil Engineering Vol. 6, N o, 008, pp. 199-05 OI:10.98/FACE080199L PROGRAM FOR CALCLATION OF A EFLECTION OF A NIFORM LOAE SQARE PLATE SING GASS-SEIEL METHO

More information

EFFECTS OF THE USE OF ACETIC ACID AS THE CONSERVANT IN LUCERNE ENSILING

EFFECTS OF THE USE OF ACETIC ACID AS THE CONSERVANT IN LUCERNE ENSILING Journal of Agricultural Sciences Vol. 49, No 1, 2004 Pages 59-64 UDC: 633.31:636.085.52:664.8.035 Original scientific paper EFFECTS OF THE USE OF ACETIC ACID AS THE CONSERVANT IN LUCERNE ENSILING N. Djordjević,

More information

SOLAR SELECTIVE ABSORBER FUNCTIONALITY OF CARBON NANOPARTICLES EMBEDDED IN SiO 2, ZnO and NiO MATRICES

SOLAR SELECTIVE ABSORBER FUNCTIONALITY OF CARBON NANOPARTICLES EMBEDDED IN SiO 2, ZnO and NiO MATRICES SOLAR SELECTIVE ABSORBER FUNCTIONALITY OF CARBON NANOPARTICLES EMBEDDED IN SiO 2, ZnO and NiO MATRICES G. KATUMBA 1, G. MAKIWA 1, L OLUMEKOR 1 & A FORBES 2 1 Physics Department, University of Zimbabwe,

More information

Optical Properties of Copper Phthalocyanine(CuPc)Thin Films

Optical Properties of Copper Phthalocyanine(CuPc)Thin Films Egypt. J. Sol., Vol. (24), No. (1), (2001) 11 Optical Properties of Copper Phthalocyanine(CuPc)Thin Films M. M. El-Nahass, F.S. Bahabri* ands.r.al-harbi* Faculty of Education, Ain Shams University, Cairo,

More information

Near-perfect modulator for polarization state of light

Near-perfect modulator for polarization state of light Journal of Nanophotonics, Vol. 2, 029504 (11 November 2008) Near-perfect modulator for polarization state of light Yi-Jun Jen, Yung-Hsun Chen, Ching-Wei Yu, and Yen-Pu Li Department of Electro-Optical

More information

KARAKTERIZACIJA KOMERCIJALNIH HIPERRAZGRANATIH POLIESTARA

KARAKTERIZACIJA KOMERCIJALNIH HIPERRAZGRANATIH POLIESTARA JASNA DŽUNUZOVIĆ 1 SLOBODAN JOVANOVIĆ 2 MANFRED D. LECHNER 3 1 IHTM Centar za hemiju, Univerzitet u Beogradu, Beograd, Srbija 2 Tehnološko-metalurški fakultet, Univerzitet u Beogradu, Beograd, Srbija 3

More information

InP optical constants between 0.75 and 5.0 ev determined by variable-angle spectroscopic ellipsometry

InP optical constants between 0.75 and 5.0 ev determined by variable-angle spectroscopic ellipsometry University of Nebraska - Lincoln DigitalCommons@University of Nebraska - Lincoln Faculty Publications from the Department of Electrical and Computer Engineering Electrical & Computer Engineering, Department

More information

ROAD NETWORK ASSESSMENT IN TRANS-AMADI, PORT HARCOURT IN NIGERIA USING GIS

ROAD NETWORK ASSESSMENT IN TRANS-AMADI, PORT HARCOURT IN NIGERIA USING GIS UDC: 625.7/.8(669) ; 007:528.9]:004(669) Obafemi A. A. et al. Road Network Assessment in Trans-Amadi, Port Harcourt in Nigeria Using Gis ROAD NETWORK ASSESSMENT IN TRANS-AMADI, PORT HARCOURT IN NIGERIA

More information

Supporting information for: Semitransparent Polymer-Based Solar Cells with. Aluminum-Doped Zinc Oxide Electrodes

Supporting information for: Semitransparent Polymer-Based Solar Cells with. Aluminum-Doped Zinc Oxide Electrodes Supporting information for: Semitransparent Polymer-Based Solar Cells with Aluminum-Doped Zinc Oxide Electrodes Sebastian Wilken,, Verena Wilkens, Dorothea Scheunemann, Regina-Elisabeth Nowak, Karsten

More information

FOCAL LENGTH DETERMINATION FOR THE 60 cm TELESCOPE AT ASTRONOMICAL STATION VIDOJEVICA

FOCAL LENGTH DETERMINATION FOR THE 60 cm TELESCOPE AT ASTRONOMICAL STATION VIDOJEVICA Serb. Astron. J. 184 (2012), 97-104 UDC 520.2 13 DOI: 10.2298/SAJ1284097C Professional paper FOCAL LENGTH DETERMINATION FOR THE 60 cm TELESCOPE AT ASTRONOMICAL STATION VIDOJEVICA Z. Cvetković, G. Damljanović,

More information

EFFECT OF LAYER THICKNESS, DEPOSITION ANGLE, AND INFILL ON MAXIMUM FLEXURAL FORCE IN FDM-BUILT SPECIMENS

EFFECT OF LAYER THICKNESS, DEPOSITION ANGLE, AND INFILL ON MAXIMUM FLEXURAL FORCE IN FDM-BUILT SPECIMENS EFFECT OF LAYER THICKNESS, DEPOSITION ANGLE, AND INFILL ON MAXIMUM FLEXURAL FORCE IN FDM-BUILT SPECIMENS Ognjan Lužanin *, Dejan Movrin, Miroslav Plančak University of Novi Sad, Faculty of Technical Science,

More information

Ellipsometry and Its Applications in Stoichiometry

Ellipsometry and Its Applications in Stoichiometry 3 Ellipsometry and Its Applications in Stoichiometry Yu-Xiang Zheng, Rong-Jun Zhang and Liang-Yao Chen Department of Optical Science and Engineering, School of Information Science and Engineering, Fudan

More information

Optical constants of Cu, Ag, and Au revisited

Optical constants of Cu, Ag, and Au revisited Optical constants of Cu, Ag, and Au revisited Shaista Babar and J. H. Weaver Department of Materials Science and Engineering University of Illinois at Urbana-Champaign, Urbana, Illinois 6181 Corresponding

More information

Comparison of Ge, InGaAs p-n junction solar cell

Comparison of Ge, InGaAs p-n junction solar cell ournal of Physics: Conference Series PAPER OPEN ACCESS Comparison of Ge, InGaAs p-n junction solar cell To cite this article: M. Korun and T. S. Navruz 16. Phys.: Conf. Ser. 77 135 View the article online

More information

CONSTRUCTION OF GENERATOR CAPABILITY CURVES USING THE NEW METHOD FOR DETERMINATION OF POTIER REACTANCE

CONSTRUCTION OF GENERATOR CAPABILITY CURVES USING THE NEW METHOD FOR DETERMINATION OF POTIER REACTANCE CONSTRUCTION OF GENERATOR CAPABILITY CURVES USING THE NEW METHOD FOR DETERMINATION OF POTIER REACTANCE M.M. Kostić *, M. Ivanović *, B. Kostić *, S. Ilić** and D. Ćirić** Electrical Engineering Institute

More information

Kontrola temperature uljnih transformatora promenom brzine obrtanja ventilatora

Kontrola temperature uljnih transformatora promenom brzine obrtanja ventilatora Kontrola temperature uljnih transformatora promenom brzine obrtanja ventilatora NIKOLA Z. ĐORĐEVIĆ, Univerzitet u Beogradu, Originalni naučni rad Elektrotehnički fakultet, Beograd UDC: 621.314.212 DANE

More information

FUNDAMENTALS AND APPLICATIONS OF SPECTROSCOPIC ELLIPSOMETRY

FUNDAMENTALS AND APPLICATIONS OF SPECTROSCOPIC ELLIPSOMETRY FUNDAMENTALS AND APPLICATIONS OF SPECTROSCOPIC ELLIPSOMETRY Quim. Nova, Vol. 25, No. 5, 794-800, 2002 Revisão Débora Gonçalves* and Eugene A. Irene University of North Carolina at Chapel Hill, Department

More information

Rayleigh-Bénard convection with magnetic field

Rayleigh-Bénard convection with magnetic field Theoret. Appl. Mech., Vol. 30, No. 1, pp. 29-40, Belgrade 2003 Rayleigh-Bénard convection with magnetic field Jürgen Zierep Abstract We discuss the solution of the small perturbation equations for a horizontal

More information

SPATIAL INTERPOLATION OF MEAN MONTHLY FLOW SERIES BY NONLINEAR CORRELATION MODEL APPLIED IN THE IBAR RIVER BASIN UDC :

SPATIAL INTERPOLATION OF MEAN MONTHLY FLOW SERIES BY NONLINEAR CORRELATION MODEL APPLIED IN THE IBAR RIVER BASIN UDC : FACTA UIVERSITATIS Series: Architecture and Civil Engineering Vol. 7, o 1, 9, pp. 83-94 DOI: 1.98/FUACE9183B SPATIAL ITERPOLATIO OF MEA MOTHLY FLOW SERIES BY OLIEAR CORRELATIO MODEL APPLIED I THE IBAR

More information

HENDERSON'S APPROACH TO VARIANCE COMPONENTS ESTIMATION FOR UNBALANCED DATA UDC Vera Djordjević, Vinko Lepojević

HENDERSON'S APPROACH TO VARIANCE COMPONENTS ESTIMATION FOR UNBALANCED DATA UDC Vera Djordjević, Vinko Lepojević FACTA UNIVERSITATIS Series: Economics and Organization Vol. 2, N o 1, 2003, pp. 59-64 HENDERSON'S APPROACH TO VARIANCE COMPONENTS ESTIMATION FOR UNBALANCED DATA UDC 519.233.4 Vera Djordjević, Vinko Lepojević

More information

Introduction to X-ray Photoelectron Spectroscopy (XPS) XPS which makes use of the photoelectric effect, was developed in the mid-1960

Introduction to X-ray Photoelectron Spectroscopy (XPS) XPS which makes use of the photoelectric effect, was developed in the mid-1960 Introduction to X-ray Photoelectron Spectroscopy (XPS) X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA) is a widely used technique to investigate

More information

solidi physica status reprints

solidi physica status reprints physica pss www.interscience.wiley.com reprints www.pss-rrl.com www.pss-b.com www.pss-a.com T N I R P E R Phys. Status Solidi C 7, No., 96 99 (010) / DOI 10.100/pssc.0098414 pss Optical characterisation

More information

Regulisani elektromotorni pogoni sa asinhronim mašinama vektorsko upravljanje

Regulisani elektromotorni pogoni sa asinhronim mašinama vektorsko upravljanje Regulisani elektromotorni pogoni sa asinhronim mašinama vektorsko upravljanje Istorijski pregled Načini realizacije Određivanje parametara regulatora Pregled karakteristika Prevazilaženje nedostataka Prva

More information

THERMODYNAMIC BEHAVIOR OF A SOLAR BLOCK OF FLATS WITH A GREENHOUSE AND THERMO-ACCUMULATIVE BRICKWALL UDC

THERMODYNAMIC BEHAVIOR OF A SOLAR BLOCK OF FLATS WITH A GREENHOUSE AND THERMO-ACCUMULATIVE BRICKWALL UDC FACTA UNIVERSITATIS Series: Mechanical Engineering Vol. 3, N o 1, 2005, pp. 127-134 THERMODYNAMIC BEHAVIOR OF A SOLAR BLOCK OF FLATS WITH A GREENHOUSE AND THERMO-ACCUMULATIVE BRICKWALL UDC 697.329 Mihailo

More information

Discover the Difference

Discover the Difference M-2000 Discover the Difference Focused M-2000 The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral

More information

KINETIKA UMREŽAVANJA SMEŠA ALKID/MELAMINSKA SMOLA

KINETIKA UMREŽAVANJA SMEŠA ALKID/MELAMINSKA SMOLA MIRJANA C. JOVIČIĆ RADMILA Ž. RADIČEVIĆ Tehnološki fakultet, Univerzitet u Novom Sadu, Novi Sad, Srbija NAUČNI RAD UDK 667.633.26:665.944:66.09 DOI: 10.2298/HEMIND0906629J KINETIKA UMREŽAVANJA SMEŠA ALKID/MELAMINSKA

More information

Determination of AlAs optical constants by variable angle spectroscopic ellipsometry and a multisample analysis

Determination of AlAs optical constants by variable angle spectroscopic ellipsometry and a multisample analysis University of Nebraska - Lincoln DigitalCommons@University of Nebraska - Lincoln Faculty Publications from the Department of Electrical and Computer Engineering Electrical & Computer Engineering, Department

More information

Optical properties of bulk and thin-film SrTiO 3 on Si and Pt

Optical properties of bulk and thin-film SrTiO 3 on Si and Pt University of Nebraska - Lincoln DigitalCommons@University of Nebraska - Lincoln Faculty Publications from the Department of Electrical and Computer Engineering Electrical & Computer Engineering, Department

More information

Klasifikacija mamograma primenom nove metode za selekciju najznačajnijih osobina slike

Klasifikacija mamograma primenom nove metode za selekciju najznačajnijih osobina slike Klasifikacia mamorama primenom nove metode za selekciu naznačaniih osobina slike Marina Milošević, Draan Janković, Đorđe Damnanović i Aleksandar Peulić Apstrakt Ova rad predstavla sistem za klasifikaciu

More information

O 3. : Er nanoparticles prospective system for energy convertors

O 3. : Er nanoparticles prospective system for energy convertors IOP Conference Series: Materials Science and Engineering PAPER OPEN ACCESS Interband optical transitions in Gd 2 O 3 : Er nanoparticles prospective system for energy convertors To cite this article: A

More information

Nanokompoziti na bazi polianilina i titan (IV) oksida: sinteza, karakterizacija i primena u fotokatalizi

Nanokompoziti na bazi polianilina i titan (IV) oksida: sinteza, karakterizacija i primena u fotokatalizi FAKULTET ZA FIZIČKU HEMIJU UNIVERZITET U BEOGRADU Marija B. Radoičić Nanokompoziti na bazi polianilina i titan (IV) oksida: sinteza, karakterizacija i primena u fotokatalizi Doktorska disertacija Beograd,

More information

Grafo analiti~ka metoda odre ivawa rastvorqivosti, temperature kqu~awa i temperature kondenzacije u sistemu HCl H 2 O

Grafo analiti~ka metoda odre ivawa rastvorqivosti, temperature kqu~awa i temperature kondenzacije u sistemu HCl H 2 O TERMOTEHNIKA, 01, XXXVIII,, 37 335 37 Slavko N. \uri} Fakultet tehni~kih nauka, Univerzitet u Novom Sadu, Novi Sad, Srbija Grafo analiti~ka metoda odre ivawa rastvorqivosti, temperature kqu~awa i temperature

More information

LASER PHYSICS LETTERS REPRINT. EDITORIAL BOARD

LASER PHYSICS LETTERS REPRINT.  EDITORIAL BOARD LASER PHYSICS LETTERS EDITORIAL BOARD W. Becker, Berlin D. Chorvat, Bratislava S. DeSilvestri, Milan M. V. Fedorov, Moscow A. Gaeta, Ithaca S. A. Gonchukov, Moscow M. Jelinek, Prague U. Keller, Zürich

More information

Ellipsometric spectroscopy studies of compaction and decompaction of Si-SiO 2 systems

Ellipsometric spectroscopy studies of compaction and decompaction of Si-SiO 2 systems Ellipsometric spectroscopy studies of compaction and decompaction of Si-SiO 2 systems Paper Witold Rzodkiewicz and Andrzej Panas Abstract The influence of the strain on the optical properties of Si-SiO

More information

Optical Properties of Semiconductors. Prof.P. Ravindran, Department of Physics, Central University of Tamil Nadu, India

Optical Properties of Semiconductors. Prof.P. Ravindran, Department of Physics, Central University of Tamil Nadu, India Optical Properties of Semiconductors 1 Prof.P. Ravindran, Department of Physics, Central University of Tamil Nadu, India http://folk.uio.no/ravi/semi2013 Light Matter Interaction Response to external electric

More information

New Perspectives on van der Waals London Dispersion Interactions of Materials: Wetting, Graded Interfaces and Carbon Nanotubes

New Perspectives on van der Waals London Dispersion Interactions of Materials: Wetting, Graded Interfaces and Carbon Nanotubes New Perspectives on van der Waals London Dispersion Interactions of Materials: Wetting, Graded Interfaces and Carbon Nanotubes R. H. French 1,2, R. Rajter 3 1. DuPont Company, Central Research & Development,

More information

Simulacioni model direktne kontrole momenta sa diskretizovanim naponskim intenzitetima 1

Simulacioni model direktne kontrole momenta sa diskretizovanim naponskim intenzitetima 1 TECHNICS AND INFORMATICS IN EDUCATION 6 th International Conference, Faculty of Technical Sciences, Čačak, Serbia, 28 29th May 216 TEHNIKA I INFORMATIKA U OBRAZOVANJU 6. međunarodna konferencija, Fakultet

More information

Nanomaterials and nanotechnology for sustainable energy

Nanomaterials and nanotechnology for sustainable energy IGOR HUT 1*, SVETLANA S. PELEMIŠ 2, DRAGOLJUB LJ. MIRJANIĆ 3 1 Innovation Centre of Faculty of Mechanical Engineering, University of Belgrade,Belgrade, Serbia, 2 Faculty of Technology, University of East

More information

Heritability of Plant Height and Head Diameter in Sunflower (Helianthus annuus L.)

Heritability of Plant Height and Head Diameter in Sunflower (Helianthus annuus L.) www.nsseme.com/journal.html 62 preliminary report / prethodno Jocković saopštenje M et al. Heritability of Plant Height and Head Diameter in Sunflower (Helianthus annuus L.) Ratar.Povrt. 50:2 (2013) 62-66

More information

Karakterizacija nanočestica elektrokatalizatora korišćenjem apsorpcione spektroskopije sa X-zracima

Karakterizacija nanočestica elektrokatalizatora korišćenjem apsorpcione spektroskopije sa X-zracima NEBOJŠA MARINKOVIĆ *, KOTARO SASAKI, MENG LI, RADOSLAV R. ADŽIĆ Synchrotron Catalysis Consortium and Columbia University, New York, NY, Brookhaven National Laboratory, Upton, NY, USA Naučni rad ISSN 35-9465,

More information

Linköping University Post Print. Optical properties and switching of a Rose Bengal derivative: A spectroscopic ellipsometry study

Linköping University Post Print. Optical properties and switching of a Rose Bengal derivative: A spectroscopic ellipsometry study Linköping University Post Print Optical properties and switching of a Rose Bengal derivative: A spectroscopic ellipsometry study C Akerlind, Hans Arwin, Fredrik Jakobsson, H Kariis and Kenneth Järrendahl

More information

Preparation and characterization of a reference aluminum mirror

Preparation and characterization of a reference aluminum mirror Preparation and characterization of a reference aluminum mirror Tzwetanka Babeva, Snejana Kitova, Borislav Mednikarov, and Ivan Konstantinov The preparation and characterization of a reference mirror of

More information

GIS AND REMOTE SENSING APPLICATION IN GEOLOGICAL MAPPING AND 3D TERRAIN MODELING: A CASE STUDY IN EGHEI UPLIFT, LIBYA

GIS AND REMOTE SENSING APPLICATION IN GEOLOGICAL MAPPING AND 3D TERRAIN MODELING: A CASE STUDY IN EGHEI UPLIFT, LIBYA Geographic information systems SYNTHESIS 2015 International Scientific Conference of IT and Business-Related Research GIS AND REMOTE SENSING APPLICATION IN GEOLOGICAL MAPPING AND 3D TERRAIN MODELING: A

More information

Određivanje koncentracija dve reaktivne boje u bojenom pamučnom materijalu

Određivanje koncentracija dve reaktivne boje u bojenom pamučnom materijalu Određivanje koncentracija dve reaktivne boje u bojenom pamučnom materijalu Milena Miljković 1, Milovan Purenović 1, Miodrag Stamenković, Milica Petrović 1 1 Univerzitet u Nišu, Prirodno matematički fakultet,

More information

Light trapping in thin-film solar cells: the role of guided modes

Light trapping in thin-film solar cells: the role of guided modes Light trapping in thin-film solar cells: the role of guided modes T. Søndergaard *, Y.-C. Tsao, T. G. Pedersen, and K. Pedersen Department of Physics and Nanotechnology, Aalborg University, Skjernvej 4A,

More information

Temperature-dependent refractive index measurements of wafer-shaped InAs and InSb

Temperature-dependent refractive index measurements of wafer-shaped InAs and InSb Temperature-dependent refractive index measurements of wafer-shaped InAs and InSb Glen D. Gillen, 1, * Chris DiRocco, Peter Powers, and Shekhar Guha 3 1 Department of Physics, California Polytechnic State

More information

DAMAGE DETECTIN OF STEEL STRUCTURES WITH PIEZOELECTRIC TRANSDUCERS AND LAMB WAVES

DAMAGE DETECTIN OF STEEL STRUCTURES WITH PIEZOELECTRIC TRANSDUCERS AND LAMB WAVES IV INTERNATIONAL SYMPOSIUM FOR STUDENTS OF DOCTORAL STUDIES IN THE FIELDS OF CIVIL ENGINEERING, ARCHITECTURE AND ENVIRONMENTAL PROTECTION Nemanja Marković 1 Dragoslav Stojić 2 Tamara Nestorović 3 DAMAGE

More information

A Plasmonic Photocatalyst Consisting of Silver Nanoparticles Embedded in Titanium Dioxide. Ryan Huschka LANP Seminar February 19, 2008

A Plasmonic Photocatalyst Consisting of Silver Nanoparticles Embedded in Titanium Dioxide. Ryan Huschka LANP Seminar February 19, 2008 A Plasmonic Photocatalyst Consisting of Silver Nanoparticles Embedded in Titanium Dioxide Ryan Huschka LANP Seminar February 19, 2008 TiO 2 Applications White Pigment Photocatalyst Previous methods to

More information

PRIMENA MULTIVARIJACIONE ANALIZE U SPEKTROSKOPSKIM PODACIMA

PRIMENA MULTIVARIJACIONE ANALIZE U SPEKTROSKOPSKIM PODACIMA UNIVERZITET U BEOGRADU VEĆE ZA STUDIJE PRI UNUVERZITETU Dragosav R. Mutavdžić PRIMENA MULTIVARIJACIONE ANALIZE U SPEKTROSKOPSKIM PODACIMA doktorska disertacija Beograd, 2016 UNIVERSITY OF BELGRADE COUNCIL

More information

Surface termination during GaN growth by metal-organic vapor phase epitaxy determined by ellipsometry. Abstract

Surface termination during GaN growth by metal-organic vapor phase epitaxy determined by ellipsometry. Abstract HEP/123-qed Surface termination during GaN growth by metal-organic vapor phase epitaxy determined by ellipsometry C. Cobet, T. Schmidtling, M. Drago, N. Wollschläger, N. Esser, and W. Richter Institut

More information

single-layer transition metal dichalcogenides MC2

single-layer transition metal dichalcogenides MC2 single-layer transition metal dichalcogenides MC2 Period 1 1 H 18 He 2 Group 1 2 Li Be Group 13 14 15 16 17 18 B C N O F Ne 3 4 Na K Mg Ca Group 3 4 5 6 7 8 9 10 11 12 Sc Ti V Cr Mn Fe Co Ni Cu Zn Al Ga

More information

BALLISTIC PROPERTIES OF POLYETHYLENE COMPOSITES BASED ON BIDIRECTIONAL AND UNIDIRECTIONAL FIBERS *

BALLISTIC PROPERTIES OF POLYETHYLENE COMPOSITES BASED ON BIDIRECTIONAL AND UNIDIRECTIONAL FIBERS * Zbornik radova Tehnološkog fakulteta u Leskovcu ISSN 0352-6542 UDK 004/.007+3+5+6(05) 20 (2011), 184 191 UDK 677.494.7:623.5:620.1 Originalni naučni rad BALLISTIC PROPERTIES OF POLYETHYLENE COMPOSITES

More information

Dielectric Properties of Composite Films Made from Tin(IV) Oxide and Magnesium Oxide

Dielectric Properties of Composite Films Made from Tin(IV) Oxide and Magnesium Oxide OUSL Journal (2014) Vol 7, (pp67-75) Dielectric Properties of Composite Films Made from Tin(IV) Oxide and Magnesium Oxide C. N. Nupearachchi* and V. P. S. Perera Department of Physics, The Open University

More information

Fundamentals of Nanoelectronics: Basic Concepts

Fundamentals of Nanoelectronics: Basic Concepts Fundamentals of Nanoelectronics: Basic Concepts Sławomir Prucnal FWIM Page 1 Introduction Outline Electronics in nanoscale Transport Ohms law Optoelectronic properties of semiconductors Optics in nanoscale

More information

DYNAMICS OF THE DUFFING OSCILLATOR WITH IMPACTS UDC: Slavka Mitić

DYNAMICS OF THE DUFFING OSCILLATOR WITH IMPACTS UDC: Slavka Mitić UNIVERSITY OF NIŠ The scientific journal FACTA UNIVERSITATIS Series: Working and Living Environmental Protection Vol. 1, No 2, 1997, pp. 65-72 Editor of series: Ljiljana Rašković, e-mail: ral@kalca.junis.ni.ac.yu

More information

In-situ Monitoring of Thin-Film Formation Processes by Spectroscopic Ellipsometry

In-situ Monitoring of Thin-Film Formation Processes by Spectroscopic Ellipsometry In-situ Monitoring of Thin-Film Formation Processes by Spectroscopic Ellipsometry Alexey Kovalgin Chair of Semiconductor Components MESA+ Institute for Nanotechnology Motivation Advantages of in-situ over

More information

Theoretical Study on Graphene Silicon Heterojunction Solar Cell

Theoretical Study on Graphene Silicon Heterojunction Solar Cell Copyright 2015 American Scientific Publishers All rights reserved Printed in the United States of America Journal of Nanoelectronics and Optoelectronics Vol. 10, 1 5, 2015 Theoretical Study on Graphene

More information

Depth Distribution Functions of Secondary Electron Production and Emission

Depth Distribution Functions of Secondary Electron Production and Emission Depth Distribution Functions of Secondary Electron Production and Emission Z.J. Ding*, Y.G. Li, R.G. Zeng, S.F. Mao, P. Zhang and Z.M. Zhang Hefei National Laboratory for Physical Sciences at Microscale

More information

EXPERIMENTAL INVESTIGATION OF EXTRUSION SPEED AND TEMPERATURE EFFECTS ON ARITHMETIC MEAN SURFACE ROUGHNESS IN FDM- BUILT SPECIMENS

EXPERIMENTAL INVESTIGATION OF EXTRUSION SPEED AND TEMPERATURE EFFECTS ON ARITHMETIC MEAN SURFACE ROUGHNESS IN FDM- BUILT SPECIMENS EXPERIMENTAL INVESTIGATION OF EXTRUSION SPEED AND TEMPERATURE EFFECTS ON ARITHMETIC MEAN SURFACE ROUGHNESS IN FDM- BUILT SPECIMENS Ognjan Lužanin *, Dejan Movrin, Miroslav Plančak University of Novi Sad,

More information

Modified Zagreb M 2 Index Comparison with the Randi} Connectivity Index for Benzenoid Systems

Modified Zagreb M 2 Index Comparison with the Randi} Connectivity Index for Benzenoid Systems CROATICA CHEMICA ACTA CCACAA 7 (2) 83 87 (2003) ISSN-00-3 CCA-2870 Note Modified Zagreb M 2 Index Comparison with the Randi} Connectivity Index for Benzenoid Systems Damir Vuki~evi} a, * and Nenad Trinajsti}

More information

NIST Database for the Simulation of Electron Spectra For Surface Analysis (SESSA)*

NIST Database for the Simulation of Electron Spectra For Surface Analysis (SESSA)* NIST Database for the Simulation of Electron Spectra For Surface Analysis (SESSA)* 1. What is it? 2. What can it do? 3. Summary Cedric Powell National Institute of Standards and Technology, Gaithersburg

More information

FILMS BY HIGH POWER PULSED MAGNETRON SPUTTERING FROM A COMPOUND TiO 1.8 TARGET

FILMS BY HIGH POWER PULSED MAGNETRON SPUTTERING FROM A COMPOUND TiO 1.8 TARGET 44 Rev.Adv.Mater.Sci. 15(2007) 44-48 K. Sarakinos, J. Alami, C. Klever and M. Wuttig GROWTH OF TiO X FILMS BY HIGH POWER PULSED MAGNETRON SPUTTERING FROM A COMPOUND TiO 1.8 TARGET K. Sarakinos, J. Alami,

More information

Manipulating Graphene at the Atomic-scale

Manipulating Graphene at the Atomic-scale Manipulating Graphene at the Atomic-scale Mike Crommie Dept. of Physics, UC Berkeley Materials Science Division, LBNL (I) Atomic-scale Gating -- Tunable charge centers (II) Nanoribbon Edge States -- Controllable

More information

Optical absorption in ZrO 2-x -C nanocomposite films on polymer substrates : application of an effective medium theory

Optical absorption in ZrO 2-x -C nanocomposite films on polymer substrates : application of an effective medium theory Author manuscript, published in "Physica Status Solidi C 5, 10 (2008) 3376-3382" DOI : 10.1002/pssc.200778899 Optical absorption in ZrO 2-x -C nanocomposite films on polymer substrates : application of

More information

THIN-FILM MEASUREMENT

THIN-FILM MEASUREMENT ADVANCED THIN-FILM MEASUREMENT SYSTEMS TAKING THE MYSTERY OUT OF THIN-FILM MEASUREMENT ABOUT THIN-FILM MEASUREMENTS THIN-FILM MEASUREMENT Introduction Thin film Thin films are very thin layers of material

More information

status solidi Department of Physics, University of California at Berkeley, Berkeley, CA, USA 2

status solidi Department of Physics, University of California at Berkeley, Berkeley, CA, USA 2 physica pss status solidi basic solid state physics b Extreme thermal stability of carbon nanotubes G. E. Begtrup,, K. G. Ray, 3, B. M. Kessler, T. D. Yuzvinsky,, 3, H. Garcia,,, 3 and A. Zettl Department

More information

Uvod u relacione baze podataka

Uvod u relacione baze podataka Uvod u relacione baze podataka Ana Spasić 2. čas 1 Mala studentska baza dosije (indeks, ime, prezime, datum rodjenja, mesto rodjenja, datum upisa) predmet (id predmeta, sifra, naziv, bodovi) ispitni rok

More information

MUSICAL COMPOSITION AND ELEMENTARY EXCITATIONS OF THE ENVIRONMENT

MUSICAL COMPOSITION AND ELEMENTARY EXCITATIONS OF THE ENVIRONMENT Interdisciplinary Description of Complex Systems (-2), 22-28, 2003 MUSICAL COMPOSITION AND ELEMENTARY EXCITATIONS OF THE ENVIRONMENT Mirna Grgec-Pajić, Josip Stepanić 2 and Damir Pajić 3, * c/o Institute

More information

Learn how reflection at interfaces with different indices of refraction works and how interfaces can change the polarization states of light.

Learn how reflection at interfaces with different indices of refraction works and how interfaces can change the polarization states of light. Slide 1 Goals of the Lab: Learn how reflection at interfaces with different indices of refraction works and how interfaces can change the polarization states of light. Learn how to measure the influence

More information

Preparation of Silver Nanoparticles and Their Characterization

Preparation of Silver Nanoparticles and Their Characterization Preparation of Silver Nanoparticles and Their Characterization Abstract The preparation of stable, uniform silver nanoparticles by reduction of silver ions by ethanol is reported in the present paper.

More information

Dielectric Body with Arbitrary Shaped and Positioned Cavity in Homogeneous Transversal Electric Field

Dielectric Body with Arbitrary Shaped and Positioned Cavity in Homogeneous Transversal Electric Field SERBIAN JOURNAL OF ELECTRICAL ENGINEERING Vol., No., June, 75-86 Dielectric Body with Arbitrary Shaped and Positioned Cavity in Homogeneous Transversal Electric Field Mirana T. Perić Abstract: This paper

More information

The effect of annealing temperature variation on the optical properties test of LiTaO 3. thin films based on Tauc Plot method for satellite technology

The effect of annealing temperature variation on the optical properties test of LiTaO 3. thin films based on Tauc Plot method for satellite technology IOP Conference Series: Earth and Environmental Science PAPER OPEN ACCESS The effect of annealing temperature variation on the optical properties test of LiTaO 3 thin films based on Tauc Plot method for

More information

AKUSTIKA ZBIRKA REŠENIH ZADATAKA

AKUSTIKA ZBIRKA REŠENIH ZADATAKA Visoka škola elektrotehnke i računarstva - Beograd Dragan Drinčić Petar Pravica AKUSTIKA ZBIRKA REŠENIH ZADATAKA Beograd 2011. AUTORI: Mr Dragan Drinčić, dipl. el. inž. Prof. dr Petar Pravica, dipl. el.

More information

Jaroslav Hamrle. October 21, 2014

Jaroslav Hamrle. October 21, 2014 Magneto-optical Kerr effect (MOKE) Jaroslav Hamrle (jaroslav.hamrle@vsb.cz) October 21, 2014 Photon-photon spectroscopies (absorption) I: Type of investigations (polarized light x non-polarized light,

More information

Observation of an Electric-Field Induced Band Gap in Bilayer Graphene by Infrared Spectroscopy. Cleveland, OH 44106, USA

Observation of an Electric-Field Induced Band Gap in Bilayer Graphene by Infrared Spectroscopy. Cleveland, OH 44106, USA Observation of an Electric-Field Induced Band Gap in Bilayer Graphene by Infrared Spectroscopy Kin Fai Mak 1, Chun Hung Lui 1, Jie Shan 2, and Tony F. Heinz 1* 1 Departments of Physics and Electrical Engineering,

More information

OPTICAL PROPERTIES OF THERMALLY DEPOSITED BISMUTH TELLURIDE IN THE WAVELENGTH RANGE OF pm

OPTICAL PROPERTIES OF THERMALLY DEPOSITED BISMUTH TELLURIDE IN THE WAVELENGTH RANGE OF pm Vol. 80 (1991) ACTA PHYSICA POLONICA A No 6 OPTICAL PROPERTIES OF THERMALLY DEPOSITED BISMUTH TELLURIDE IN THE WAVELENGTH RANGE OF 2.5-10 pm A.Y. MORSY α, S.S. FOUAD α, E. HASHEM b AND A.A. EL-SHAZŁY α

More information

Mueller matrices for anisotropic metamaterials generated using 4 4 matrix formalism

Mueller matrices for anisotropic metamaterials generated using 4 4 matrix formalism Revised Manuscript Click here to view linked References Mueller matrices for anisotropic metamaterials generated using 4 4 matrix formalism P. D. Rogers 1, T. D. Kang 1, T. Zhou 1, M. Kotelyanskii 1,,

More information

Provera verodostojnosti modela hidropostrojenja za potrebe simulacije rada hidroagregata u primarnoj regulaciji učestanosti i snage razmene

Provera verodostojnosti modela hidropostrojenja za potrebe simulacije rada hidroagregata u primarnoj regulaciji učestanosti i snage razmene Stručni rad UDK: 621.311.21:621.316.726 BIBLID: 0350-8528(2015),25.p.145-153 doi:10.5937/zeint25-9401 Provera verodostojnosti modela hidropostrojenja za potrebe simulacije rada hidroagregata u primarnoj

More information

Cathodoluminescence spectroscopy of nitrided SiO 2 Si interfaces

Cathodoluminescence spectroscopy of nitrided SiO 2 Si interfaces Cathodoluminescence spectroscopy of nitrided SiO 2 Si interfaces A. P. Young a) Department of Electrical Engineering, The Ohio State University, Columbus, Ohio 43210-1272 R. Bandhu Department of Physics,

More information

DESIGN AND CALCULATION OF RING SPRINGS AS SPRING ELEMENTS OF THE WAGON BUFFER UDC : Jovan Nešović

DESIGN AND CALCULATION OF RING SPRINGS AS SPRING ELEMENTS OF THE WAGON BUFFER UDC : Jovan Nešović FACTA UNIVERSITATIS Series: Mechanical Engineering Vol.1, N o 9, 2002, pp. 1127-1133 DESIGN AND CALCULATION OF RING SPRINGS AS SPRING ELEMENTS OF THE WAGON BUFFER UDC 62-272.43:623.435 Jovan Nešović Faculty

More information

Summary Modeling of nonlinear reactive electronic circuits using artificial neural networks

Summary Modeling of nonlinear reactive electronic circuits using artificial neural networks Summary Modeling of nonlinear reactive electronic circuits using artificial neural networks The problem of modeling of electronic components and circuits has been interesting since the first component

More information

2. RAZVOJ KVANTNE MEHANIKE (QM)

2. RAZVOJ KVANTNE MEHANIKE (QM) FRAKTALNA MEHANIKA Prof.dr Đuro Koruga LEKCIJA ODNOS KLASIČNE I KVANTNE MEHANIKE Da bi se razumeo odnos klasične (KM) i kvantne mehanike (QM) neophodno e poznavati nihov nastanak i razvo. Kratak pregled

More information

REACTIONS OF CALCITE IN WATER IN THE PRESENCE OF STEARIC ACID ***

REACTIONS OF CALCITE IN WATER IN THE PRESENCE OF STEARIC ACID *** MINING AND METALLURGY INSTITUTE BOR UDK: 6 ISSN: 334-8836 (Štampano izdanje) ISSN: 406-1395 (Online) UDK: 6.356:665.1(045)=111 doi:10.5937/mmeb150319m Abstract Slavica R. Mihajlović *, Živko T. Sekulić

More information

Metrički prostori i Riman-Stiltjesov integral

Metrički prostori i Riman-Stiltjesov integral Metrički prostori i Riman-Stiltjesov integral Sadržaj 1 Metrički prostori 3 1.1 Primeri metričkih prostora................. 3 1.2 Konvergencija nizova i osobine skupova...................... 12 1.3 Kantorov

More information

CASTOR A PROPULSION SHAFTLINE TORSIONAL VIBRATION ASSESSMENT TOOL

CASTOR A PROPULSION SHAFTLINE TORSIONAL VIBRATION ASSESSMENT TOOL Gojko MAGAZINOVIĆ, University of Split, FESB, R. Boškovića 32, 21000 Split, Croatia E-mail: gmag@fesb.hr CASTOR A PROPULSION SHAFTLINE TORSIONAL VIBRATION ASSESSMENT TOOL Summary Castor (Computer Assessment

More information

Nove fizickohemijske metode. Ivana Radosavljevic Evans Durham University, UK

Nove fizickohemijske metode. Ivana Radosavljevic Evans Durham University, UK Nove fizickohemijske metode Ivana Radosavljevic Evans Durham University, UK Nove fizickohemijske metode: Metode zasnovane na sinhrotronskom zracenju Plan predavanja: Difrakcione metode strukturne karakterizacije

More information