DISCRETE SEMICONDUCTORS DATA SHEET M3D065. BLF242 HF-VHF power MOS transistor. Product specification Supersedes data of 1997 Dec 17.

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1 DISCRETE SEMICONDUCTORS DATA SHEET M3D65 Supersedes data of 1997 Dec Oct 13

2 FEATURES PIN CONFIGURATION High power gain Low noise Easy power control Good thermal stability 1 4 Withstands full load mismatch Gold metallization ensures excellent reliability. g MBB72 d s DESCRIPTION Silicon N-channel enhancement mode vertical D-MOS transistor designed for professional transmitter applications in the HF/VHF frequency range. The transistor is encapsulated in a 4-lead, SOT123A flange package, with a ceramic cap. All leads are isolated from the flange. PINNING - SOT123A PIN DESCRIPTION 1 drain 2 source 3 gate 4 source 2 3 MSB57 Fig.1 Simplified outline and symbol. CAUTION This product is supplied in anti-static packing to prevent damage caused by electrostatic discharge during transport and handling. For further information, refer to Philips specs.: SNW-EQ-68, SNW-FQ-32A, and SNW-FQ-32B. WARNING Product and environmental safety - toxic materials This product contains beryllium oxide. The product is entirely safe provided that the BeO disc is not damaged. All persons who handle, use or dispose of this product should be aware of its nature and of the necessary safety precautions. After use, dispose of as chemical or special waste according to the regulations applying at the location of the user. It must never be thrown out with the general or domestic waste. QUICK REFERENCE DATA RF performance at T h = 25 C in a common source test circuit. MODE OF OPERATION f (MHz) V DS (V) P L (W) G p (db) CW, class-b >13 typ. 16 η D (%) >5 typ Oct 13 2

3 LIMITING VALUES In accordance with the Absolute Maximum Rating System (IEC 6134). SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT V DS drain-source voltage 65 V V GS gate-source voltage ±2 V I D drain current (DC) 1 A P tot total power dissipation T mb 25 C 16 W T stg storage temperature C T j junction temperature 2 C THERMAL CHARACTERISTICS SYMBOL PARAMETER CONDITIONS VALUE UNIT thermal resistance from junction to T mb =25 C; P tot = 16 W 11 K/W mounting base thermal resistance from mounting base to T mb =25 C; P tot = 16 W.3 K/W heatsink R th j-mb R th mb-h 1 MRA918 2 MPG141 I D (A) 1 P tot (W) (2) (1) (2) 1 (1) V DS (V) T h ( C) (1) Current is this area may be limited by R DSon. (2) T mb =25 C. Fig.2 DC SOAR. (1) Continuous operation. (2) Short-time operation during mismatch. Fig.3 Power derating curves. 23 Oct 13 3

4 CHARACTERISTICS T j = 25 C unless otherwise specified. SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT V (BR)DSS drain-source breakdown voltage V GS = ; I D =.1 ma 65 V I DSS drain-source leakage current V GS = ; V DS = 28 V 1 µa I GSS gate-source leakage current V GS = ±2 V; V DS = 1 µa V GSth gate-source threshold voltage I D = 3 ma; V DS = 1 V V g fs forward transconductance I D =.3 A; V DS = 1 V S R DSon drain-source on-state resistance I D =.3 A; V GS = 1 V Ω I DSX on-state drain current V GS = 1 V; V GS = 1 V 1.2 A C is input capacitance V GS = ; V DS = 28 V; f = 1 MHz 13 pf C os output capacitance V GS = ; V DS = 28 V; f = 1 MHz 9.4 pf C rs feedback capacitance V GS = ; V DS = 28 V; f = 1 MHz 1.7 pf V GS group indicator GROUP LIMITS (V) GROUP LIMITS (V) MIN. MAX. MIN. MAX. A O B P C Q D R E S F T G U H V J W K X L Y M Z N Oct 13 4

5 4 T.C. (mv/k) 2 MBB I D (A) MGP I D (ma) V GS (V) V DS =1V. Fig.4 Temperature coefficient of gate-source voltage as a function of drain current, typical values. V DS = 1 V; T j =25 C. Fig.5 Drain current as a function of gate-source voltage, typical values. 6 MBB778 3 MBB776 R DS (on) (Ω) C (pf) 4 2 C is C os T j ( o C) V DS (V) I D =.3 A; V GS =1V. Fig.6 Drain-source on-state resistance as a function of junction temperature, typical values. V GS = ; f = 1 MHz. Fig.7 Input and output capacitance as functions of drain-source voltage, typical values. 23 Oct 13 5

6 6 MBB775 C rs (pf) V DS (V) V GS = ; f = 1 MHz. Fig.8 Feedback capacitance as a function of drain-source voltage, typical values. APPLICATION INFORMATION FOR CLASS-B OPERATION T h =25 C; R th mb-h =.3 K/W; unless otherwise specified. RF performance in CW operation in a common source class-b test circuit. MODE OF OPERATION f (MHz) Ruggedness in class-b operation V DS (V) I DQ (ma) P L (W) G P (db) CW, class-b >13 typ. 16 η D (%) >5 typ. 6 R GS (Ω) 47 The is capable of withstanding a load mismatch corresponding to VSWR = 5 through all phases under the following conditions: V DS = 28 V; f =175 MHz at rated output power. Noise figure (see Fig.11) V DS = 28 V; I D =.2 A; f = 175 MHz; R GS =47Ω; T h =25 C. Input and output power matched for P L =5W; F = typ. 5.5 db. 23 Oct 13 6

7 2 MGP MGP144 G p (db) G p η d (%) P L (W) η d P L (W).5 1 P IN (W) Class-B operation; V DS = 28 V; I DQ =1mA; R GS =47Ω; f = 175 MHz. Class-B operation; V DS = 28 V; I DQ =1mA; R GS =47Ω; f = 175 MHz. Fig.9 Power gain and efficiency as functions of load power, typical values. Fig.1 Load power as a function of input power, typical values. handbook, full pagewidth input 5 Ω C1 C2 L1 R1 L2 D.U.T. L3 L5 L4 C6 C7 output 5 Ω C3 L6 C3 R2 +V D +V G C5 C8 C9 MGP145 f = 175 MHz. Fig.11 Test circuit for class-b operation. 23 Oct 13 7

8 List of components (see Fig.11) COMPONENT DESCRIPTION VALUE DIMENSIONS CATALOGUE NO. C1, C2, C7 film dielectric trimmer 4 to 4 pf C3 multilayer ceramic chip capacitor; note 1 1 pf C4, C8 ceramic chip capacitor 1 nf C6 film dielectric trimmer 5 to 6 pf C9 electrolytic capacitor 2.2 µf, 4 V L1 5 turns enamelled.7 mm copper wire 53 nh length 5.4 mm int. dia. 3 mm leads 2 5mm L2, L3 stripline; note 2 3 Ω 1 6mm L4 11 turns enamelled 1 mm copper wire 5 nh length 15.5 mm int. dia. 8 mm leads 2 5mm L5 5 turns enamelled 1 mm copper wire 79 nh length 9.1 mm int. dia. 5 mm leads 2 5mm L6 grade 3B Ferroxcube RF choke R1.5 W metal film resistor 47 Ω R2.5 W metal film resistor 1 Ω Notes 1. American Technical Ceramics (ATC) capacitor, type 1B or other capacitor of the same quality. 2. The striplines are on a double copper-clad printed circuit board, with epoxy fibre-glass dielectric (ε r = 4.5), thickness 1 16 inch. 23 Oct 13 8

9 handbook, full pagewidth 15 strap strap 7 rivet L6 C5 +V D C1 C2 +V G L1 R1 L2 C3 C4 L3 R2 L4 L5 C8 C9 C6 C7 MGP146 Dimensions in mm. The circuit and components are situated on one side of the epoxy fibre-glass board, the other side being fully metallized to serve as earth. Earth connections are made by fixing screws, copper straps and hollow rivets at the edges of the board and under the source. Fig.12 Component layout for 175 MHz class-b test circuit. 23 Oct 13 9

10 5 MGP15 1 MGP149 Z i (Ω) 3 r i Z L (Ω) R L 1 5 X L 1 x i 3 1 f (MHz) f (MHz) Class-B operation; V DS = 28 V; P L =3W; R GS =47Ω;T h =25 C. Class-B operation; V DS = 28 V; P L =3W; R GS =47Ω;T h =25 C. Fig.13 Input impedance as a function of frequency (series components), typical values. Fig.14 Load impedance as a function of frequency (series components), typical values. 2 MGP148 G p (db) f (MHz) Class-B operation; V DS = 28 V; P L =3W; R GS =47Ω;T h =25 C. Fig.15 Power gain as a function of frequency, typical values. 23 Oct 13 1

11 scattering parameters V DS = 28 V; I D = 1 ma; note 1 f (MHz) s 11 s 21 s 12 s 22 s 11 Φ s 21 Φ s 12 Φ s 22 Φ Note 1. For more extensive s-parameters see internet: 23 Oct 13 11

12 PACKAGE OUTLINE Flanged ceramic package; 2 mounting holes; 4 leads SOT123A D A F D 1 q C U 1 B w 2 M C M H 4 3 b c α A p U 2 U 3 1 w 1 M A M B M H 2 Q 5 1 mm scale DIMENSIONS (millimetre dimensions are derived from the original inch dimensions) UNIT A b c D D 1 F H p Q q U 1 U 2 U 3 w 1 w 2 α mm inches OUTLINE VERSION REFERENCES IEC JEDEC EIAJ EUROPEAN PROJECTION ISSUE DATE SOT123A Oct 13 12

13 DATA SHEET STATUS LEVEL DATA SHEET STATUS (1) PRODUCT STATUS (2)(3) DEFINITION I Objective data Development This data sheet contains data from the objective specification for product development. Philips Semiconductors reserves the right to change the specification in any manner without notice. II Preliminary data Qualification This data sheet contains data from the preliminary specification. Supplementary data will be published at a later date. Philips Semiconductors reserves the right to change the specification without notice, in order to improve the design and supply the best possible product. III Product data Production This data sheet contains data from the product specification. Philips Semiconductors reserves the right to make changes at any time in order to improve the design, manufacturing and supply. Relevant changes will be communicated via a Customer Product/Process Change Notification (CPCN). Notes 1. Please consult the most recently issued data sheet before initiating or completing a design. 2. The product status of the device(s) described in this data sheet may have changed since this data sheet was published. The latest information is available on the Internet at URL 3. For data sheets describing multiple type numbers, the highest-level product status determines the data sheet status. DEFINITIONS Short-form specification The data in a short-form specification is extracted from a full data sheet with the same type number and title. For detailed information see the relevant data sheet or data handbook. Limiting values definition Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 6134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability. Application information Applications that are described herein for any of these products are for illustrative purposes only. Philips Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or modification. DISCLAIMERS Life support applications These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips Semiconductors customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application. Right to make changes Philips Semiconductors reserves the right to make changes in the products - including circuits, standard cells, and/or software - described or contained herein in order to improve design and/or performance. When the product is in full production (status Production ), relevant changes will be communicated via a Customer Product/Process Change Notification (CPCN). Philips Semiconductors assumes no responsibility or liability for the use of any of these products, conveys no licence or title under any patent, copyright, or mask work right to these products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless otherwise specified. 23 Oct 13 13

14 a worldwide company Contact information For additional information please visit Fax: For sales offices addresses send to: sales.addresses@ Koninklijke Philips Electronics N.V. 23 SCA75 All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner. The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent- or other industrial or intellectual property rights. Printed in The Netherlands /3/pp14 Date of release: 23 Oct 13 Document order number:

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