AOD466 N-Channel Enhancement Mode Field Effect Transistor

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1 NChannel Enhancement Mode Field Effect Transistor General Description The AOD466 uses advanced trench technology and design to provide excellent R DS(ON) with low gate charge. This device is suitable for use in PWM, load switching and general purpose applications. RoHS Compliant Halogen Free* Features V DS (V) = V I D = 3A (V GS = V) R DS(ON) < 4 mω (V GS = V) R DS(ON) < 24 mω (V GS = 4.V) % UIS Tested! % Rg Tested! Top View D TO2 DPAK Bottom View D S G G S G S Absolute Maximum Ratings T A = C unless otherwise noted Parameter Symbol Maximum DrainSource Voltage GateSource Voltage V DS V GS ± Units V V Continuous Drain T C = C 3 Current G T C = C I D A Pulsed Drain Current C Avalanche Current C Repetitive avalanche energy.mh C I DM I AR E AR 7 A mj T C = C 3 Power Dissipation B P D T C = C W T A = C 2. Power Dissipation A P DSM T A =7 C.6 W Junction and Storage Temperature Range T J, T STG to 7 C Thermal Characteristics Parameter Symbol Typ Max Units Maximum JunctiontoAmbient A t s C/W R θja Maximum JunctiontoAmbient A SteadyState 4 C/W Maximum JunctiontoCase B SteadyState R θjc 3.6 C/W

2 Electrical Characteristics (T J = C unless otherwise noted) Symbol Parameter Conditions Min Typ Max Units STATIC PARAMETERS BV DSS DrainSource Breakdown Voltage I D =ua, V GS =V V I DSS Zero Gate Voltage Drain Current V DS =V, V GS =V T J = C μa I GSS GateBody leakage current V DS =V, V GS =±V na V GS(th) Gate Threshold Voltage V DS =V GS, I D =μa.8 2. V I D(ON) On state drain current V GS =V, V DS =V 7 A V GS =V, I D =3A. 4 R DS(ON) Static DrainSource OnResistance T J = C. mω V GS =4.V, I D =A 9 24 mω g FS Forward Transconductance V DS =V, I D =3A 3 S V SD Diode Forward Voltage I S =A, V GS =V.74 V I S Maximum BodyDiode Continuous Current A DYNAMIC PARAMETERS C iss Input Capacitance 83 pf C oss Output Capacitance V GS =V, V DS =2.V, f=mhz 224 pf C rss Reverse Transfer Capacitance 27 pf R g Gate resistance V GS =V, V DS =V, f=mhz.93. Ω SWITCHING PARAMETERS Q g (V) Total Gate Charge.3 9 nc Q g (4.V) Total Gate Charge nc V GS =V, V DS =2.V, I D =3A Q gs Gate Source Charge 2.7 nc Q gd Gate Drain Charge 4.3 nc t D(on) TurnOn DelayTime 8 ns t r TurnOn Rise Time V GS =V, V DS =2.V,.7 ns t D(off) TurnOff DelayTime R L =.42Ω, R GEN =3Ω 3 ns t f TurnOff Fall Time ns t rr Body Diode Reverse Recovery Time I F =3A, di/dt=a/μs ns Q rr Body Diode Reverse Recovery Charge I F =3A, di/dt=a/μs 2.8 nc A: The value of R θja is measured with the device mounted on in 2 FR4 board with 2oz. Copper, in a still air environment with T A = C. The Power dissipation P DSM is based on R θja and the maximum allowed junction temperature of C. The value in any given application depends on the user's specific board design, and the maximum temperature of 7 C may be used if the PCB allows it. B. The power dissipation P D is based on T J(MAX) =7 C, using junctiontocase thermal resistance, and is more useful in setting the upper dissipation limit for cases where additional heatsinking is used. C: Repetitive rating, pulse width limited by junction temperature T J(MAX) =7 C. D. The R θja is the sum of the thermal impedence from junction to case R θjc and case to ambient. E. The static characteristics in Figures to 6 are obtained using <3 μs pulses, duty cycle.% max. F. These curves are based on the junctiontocase thermal impedence which is measured with the device mounted to a large heatsink, assuming a maximum junction temperature of T J(MAX) =7 C. G. The maximum current rating is limited by bondwires. H. These tests are performed with the device mounted on in 2 FR4 board with 2oz. Copper, in a still air environment with T A = C. The SOA curve provides a single pulse rating. *This device is guaranteed green after data code 8X (Sep ST 8). Rev: Sep. 8 THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN, FUNCTIONS AND RELIABILITY WITHOUT NOTICE.

3 TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS 8 4 V V DS =V 6 6V 3 I D (A) 4 4.V I D (A) C C V GS =3V V DS (Volts) Fig : OnRegion Characteristics V GS (Volts) Figure 2: Transfer Characteristics.6 R DS(ON) (mω) V GS =4.V V GS =V Normalized OnResistance.4.2 V GS =V I D =3A V GS =4.V I D =A 3 4 I D (A) Figure 3: OnResistance vs. Drain Current and Gate Voltage.8 7 Temperature ( C) Figure 4: OnResistance vs. Junction Temperature 4.E2 R DS(ON) (mω) 3 I D =3A C I S (A).E.E.E.E2.E3 C C C V GS (Volts) Figure : OnResistance vs. GateSource Voltage.E4.E V SD (Volts) Figure 6: BodyDiode Characteristics

4 TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS V GS (Volts) V DS =2.V I D =3A Q g (nc) Figure 7: GateCharge Characteristics Capacitance (pf) C rss C iss C oss V DS (Volts) Figure 8: Capacitance Characteristics I D (Amps) R DS(ON) limited DC μs μs ms Power (W) 6 8 T J(Max) =7 C T C = C T J(Max) =7 C, T A = C.. V DS (Volts) Figure 9: Maximum Forward Biased Safe Operating Area (Note F) Figure : Single Pulse Power Rating Junctionto Case (Note F) Z θjc Normalized Transient Thermal Resistance. D=T on /T T J,PK =T C P DM.Z θjc.r θjc R θjc = C/W In descending order D=.,.3,.,.,.2,., single pulse Single Pulse P D. T..... Figure : Normalized Maximum Transient Thermal Impedance (Note F) T on

5 TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS I D (A), Peak Avalanche Current 3 T A = C t A = L I D BV V DD Power Dissipation (W) 3... Time in avalanche, t A (s) Figure 2: Single Pulse Avalanche capability 7 7 T CASE ( C) Figure 3: Power Derating (Note B) Current rating I D (A) 3 Power (W) 4 3 T A = C 7 7 T CASE ( C) Figure 4: Current Derating (Note B).... Figure : Single Pulse Power Rating Junctionto Ambient (Note H) Z θja Normalized Transient Thermal Resistance.. Single Pulse In descending order D=.,.3,.,.,.2,., single pulse D=T on /T T J,PK =T A P DM.Z θja.r θja R θja = C/W T Figure 6: Normalized Maximum Transient Thermal Impedance (Note H) P D T on

6 Gate Charge Test Circuit & Waveform Qg V Qgs Qgd Ig Charge Resistive Switching Test Circuit & Waveforms RL Rg 9% % td(on) t r t d(off) t f t on t off Unclamped Inductive Switching (UIS) Test Circuit & Waveforms L 2 E = /2 LI AR AR BV DSS Id Rg Id I AR Diode Recovery Test Circuit & Waveforms Q = Idt rr Ig Isd L Isd I F di/dt I RM t rr

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