Surface and Interface Characterization of Polymer Films

Size: px
Start display at page:

Download "Surface and Interface Characterization of Polymer Films"

Transcription

1 Surface and Interface Characterization of Polymer Films Jeff Shallenberger, Evans Analytical Group 104 Windsor Center Dr., East Windsor NJ Copyright 2013 Evans Analytical Group

2 Outline Introduction to surface chemical techniques X-ray photoelectron spectroscopy (XPS/ESCA) Time-of-flight secondary ion mass spectrometry (TOF-SIMS) Selected examples from polymer surfaces Identification of Defects on Metallized Polymer-PSA Laminate Failed Heat Seal from medical packaging Examining the sub-surface New technology available Copyright 2013 Evans Analytical Group 2

3 Surface chemistry related phenomena Wetting (hydrophobic vs. hydrophillic) Corrosion/oxidation Coatings Appearance (stains, hazes, residues, etc.) Adhesion Blooming, additive migration 3 Copyright 2010 Evans Analytical

4 What tools are available to probe the surface? 1. Microscopy SEM, AFM, TEM, optical microscopy Copyright 2010 Evans Analytical Group LLC 4

5 What tools are available to probe the surface? 2. Physical properties hardness, wear resistance, scratch resistance, contact angle, etc Images courtesy of 5 Copyright 2010 Evans Analytical

6 C*F2 COO What tools are available to probe the surface? CF 2 Intensity (CPS) 1/75/10, 90 -CF 3 C-C C*COO C-O and C*H-CF 2 Relative concentration 3. Surface chemistry XPS, Auger, TOF-SIMS Binding energy (ev) 100 Sample 114, run #2 first derivative 10 O Ti Nb Yb Pb Pt Si not acquired in SiO 2 layer 1 E N(E) Kinetic Energy (ev) EMS/MatSci/Trolier-McKinstry/114b.opj Depth (nm) Copyright 2010 Evans Analytical Group LLC 6

7 Other techniques Indirect surface techniques Extraction approaches followed by GC/MS, ICP, ICP-MS, etc. Bulk techniques XRF, SEM-EDS, XRD, ICP-MS, FTIR, Raman. 7 Copyright 2010 Evans Analytical

8 EAG Bubble Chart 8 Copyright 2010 Evans Analytical

9 Comparing Analytical Techniques Depth of Analysis ~ ~ ~ ~ 9 Copyright 2010 Evans Analytical

10 XPS XPS can detect and quantify all elements except for H and He, and provide chemical state information; making it a powerful survey analysis technique ~ 10 Copyright 2010 Evans Analytical

11 XPS Process (Photoelectric Effect) X-ray * * 11 Copyright 2010 Evans Analytical

12 Typical Data- Plasma treated polystyrene Copyright 2013 Evans Analytical Group 12

13 Typical Data- Plasma treated polystyrene Sample Carbon Nitrogen Oxygen Treated polystyrene Untreated polystyrene Copyright 2013 Evans Analytical Group 13

14 XPS Summary Strengths Elemental identification of all elements except H and He Chemical state identification (oxidation state) Quantitative analysis Can analyze insulating samples Limitations Detection limits typically ~500 ppm Smallest analytical area ~10 µm Limited organic information UHV technique Copyright 2012 Evans Analytical Group 14

15 TOF-SIMS TOF-SIMS is a very surface sensitive technique providing full elemental and molecular analysis with excellent detection limits. 15 Copyright 2013 Evans Analytical

16 Ion Induced Desorption Ejected Species: Atoms, Molecules, Clusters, Ions/Neutrals (+/-) Source for this image? 16 Copyright 2010 Evans Analytical

17 Typical Data O O C O C 149 O C H 2 C H m/z O O O C C O C H 2 C H Negative Spectrum of PET m/z 17 Copyright 2010 Evans Analytical

18 Typical Data TOF-SIMS Imaging of Alumina-Zirconia-Silica Materials Region 1 Spectrum Primary Ion Beam Chemical Map 1 m/z Total Ion Image Total Area Spectrum Chemical Map 2 m/z Region 2 Spectrum Sample m/z 18 Copyright 2010 Evans Analytical

19 Strengths TOF-SIMS Summary elemental and molecular information on thin (submonolayer) organic films/contaminants survey analysis ppm detection limits small spot size (0.2 µm) and mapping analyzes insulators and conductors Limitations organic information can be limited vacuum compatibility required at times, too surface sensitive Copyright 2012 Evans Analytical Group 19

20 Selected examples from polymer surfaces Identification of Defects on Metallized Polymer-PSA Laminate A laminate consisting of an acrylic-based pressure sensitive adhesive (PSA) on a polyester film bonded to a metallized PET with a silicone release layer experienced isolated defects that were µm in size. PET Copyright 2013 Evans Analytical Group 20

21 Identification of Defects on Metallized Polymer-PSA Laminate c/s Was there something on the surface of the PET prior to metallization that Y0BCY spe: hindered V6C adhesion? Apr 20 Al mono 12.5 W 50.0 µ ev e+003 max min Su1s/Point1: Metal side larger feature/ Y0BCY spe O C C O Si Binding Energy (ev) Copyright 2013 Evans Analytical Group 21

22 c/s Identification of Defects on Metallized Polymer-PSA Laminate Finding of silicone on PET surface under metallization seems suspicious. However, silicone release layer surrounded defect and silicones are notoriously mobile. Y0BCY spe: Underside V6C of PSA failure confirms locus of failure is at Al-PET interface 2011 Apr 20 Al mono 12.5 W 50.0 µ ev e+002 max min Al2p/Point3: Pigment side of failure/1 (Shft) Y0BCY spe Aluminum 2p Al Area C O Al Si Metal side of defect PSA side of defect Release layer Al 2 O What is this carbon due to? Binding Energy (ev) Copyright 2013 Evans Analytical Group 22

23 Identification of Defects on Metallized Polymer-PSA Laminate High resolution C 1s spectrum from underside of defect equal intensity C-O and O-C=O indicative of ester functional groups Could this be transfer of PET? Carbon 1s C-C O=C-O C-O Binding Energy (ev) Copyright 2013 Evans Analytical Group 23

24 Identification of Defects on Metallized Polymer-PSA Laminate 3.98 ev 1.54 ev 1.79 ev 4.27 ev Copyright 2013 Evans Analytical Group 24

25 Identification of Defects on Metallized Polymer-PSA Laminate C 1s peak positions are consistent with aliphatic ester, not PET PET surface was contaminated with some aliphatic ester prior to metallization Silicones contaminated the PET after the adhesion failure Copyright 2013 Evans Analytical Group 25

26 Failed Heat Seal from medical packaging Background: A medical device sterile package experienced adhesion failure at a polyethylene-ethylene acrylic acid (co-polymer) heat seal to polyethylene interface. EAA was added at 3% to improve adhesion and lower % of crystallinity. Adhesion problems can lead to loss of sterility. Analytical Approach: Examine good and bad surfaces prior to heat sealing to look for evidence of impurities with XPS and TOF-SIMS Copyright 2013 Evans Analytical Group 26

27 Failed Heat Seal from medical packaging Sample Carbon Oxygen Good PE-EAA surface Failed PE-EAA surface %EAA-PE, theory CH 2 Good Bad O-C=O Binding energy (ev) CH 2 O-C=O Binding Energy (ev) Copyright 2013 Evans Analytical Group 27

28 Failed Heat Seal from medical packaging XPS only finds only C-C and O-C=O Measurable difference in amount of total O suggests either: (a) difference in the amount of EAA at the surface or, (b) presence of some other O-C=O containing compound on the surface of the bad heat seal XPS unable to distinguish between these two scenarios Copyright 2013 Evans Analytical Group 28

29 Failed Heat Seal from medical packaging We use the better molecular specificity inherent to TOF-SIMS to look for foreign species. Copyright 2013 Evans Analytical Group 29

30 Failed Heat Seal from medical packaging Series of more intense peaks observed on Bad seal surface Peaks are characteristic of hydroxyhydrocinnamate compounds such as Irganox 1010 or amu = C 15 H 23 O amu = C 16 H 25 O amu = C 17 H 23 O 2 + Copyright 2013 Evans Analytical Group 30

31 Failed Heat Seal from medical packaging XPS flagged the higher O levels, but could not determine the root cause of the problem TOF-SIMS found clear evidence of hydroxyhydrocinnamate compounds on Bad surface Low levels of hydroxyhydrocinnamate found on Good surface Copyright 2013 Evans Analytical Group 31

32 Examining the sub-surface Copyright 2013 Evans Analytical Group 32

33 Examining the sub-surface What do we do when these techniques are too surface sensitive? - buried interfaces, extraneous surface contamination, etc. Copyright 2013 Evans Analytical Group 33

34 Basics of sputtering process 3 kv Ar + impinging Ni{001} Simulation courtesy of Barbara Garrison, PSU Chemistry Sputtered green and red atoms Bond breakage, atomic rearrangement in sub-surface Copyright 2013 Evans Analytical Group 34

35 Typical Depth Profile: Metallized PP Copyright 2013 Evans Analytical Group 35

36 c/s aimcal105.pro: AIMCAL research Aluminum Spectra 2013 Sep 10 Al mono 50.1 W µ ev e+003 max min Al2p/Point3: Al coated polymer/1 (Shft) Al2p Al Al 2 O Al 2 O Binding Energy (ev) Copyright 2013 Evans Analytical Group 36

37 What about profiling organics? PET After ~10 nm of sputtering Copyright 2013 Evans Analytical Group 37

38 What about profiling organics? Copyright 2013 Evans Analytical Group 38

39 Producing higher mass projectiles to increase sputter yield and decrease damage depth SF 5+, m = 127 Au 3+, m = 591 C 60+, m = 720 Cluster Ion Beams Most recent creation Ar 10,000+, m = 40,000!

40 Counts Erucamide Chemical Mapping-Surface 300 µm X 300 µm field of view 200 C 22 H 44 NO M/Z 40X Mass-to-charge Copyright 2013 Evans Analytical Group 40

41 Erucamide Chemical Mapping-Sub-Surface 300 µm X 300 µm field of view C 22 H 44 NO M/Z Mass-to-charge Copyright 2013 Evans Analytical Group 41

42 Erucamide Chemical Mapping-Different Depths Copyright 2013 Evans Analytical Group 42

43 Summary Surface Technique XPS/ESCA TOF-SIMS Typical applications Corona/plasma treatments Adhesion failures Additive blooming studies Reverse engineering of nm coatings Surface contaminants Defect analysis Adhesion failures Additive blooming Surface contaminants Signal detected photoelectrons sputtered ions Elements detected Li-U Molecular identification on surfaces H-U (including isotopes) and molecular species Organic info Yes, nearest neighbor bonding Yes, molecular info Quantitative Yes Qualitative Detection limits atom% ppm Sampling depth 1-10nm 1-2 monolayers Depth profiling Yes, limited info on organics Yes, for most organics Imaging/mapping Yes-limited Yes, elemental and molecular imaging Spatial resolution 10,000 nm (10 µm) 200 nm Copyright 2013 Evans Analytical Group 43

44 Questions Welcome Copyright 2013 Evans Analytical Group 44

Application of Surface Analysis for Root Cause Failure Analysis

Application of Surface Analysis for Root Cause Failure Analysis Application of Surface Analysis for Root Cause Failure Analysis David A. Cole Evans Analytical Group East Windsor, NJ Specialists in Materials Characterization Outline Introduction X-Ray Photoelectron

More information

raw materials C V Mn Mg S Al Ca Ti Cr Si G H Nb Na Zn Ni K Co A B C D E F

raw materials C V Mn Mg S Al Ca Ti Cr Si G H Nb Na Zn Ni K Co A B C D E F Today s advanced batteries require a range of specialized analytical tools to better understand the electrochemical processes that occur during battery cycling. Evans Analytical Group (EAG) offers a wide-range

More information

Applications of XPS, AES, and TOF-SIMS

Applications of XPS, AES, and TOF-SIMS Applications of XPS, AES, and TOF-SIMS Scott R. Bryan Physical Electronics 1 Materials Characterization Techniques Microscopy Optical Microscope SEM TEM STM SPM AFM Spectroscopy Energy Dispersive X-ray

More information

MS482 Materials Characterization ( 재료분석 ) Lecture Note 12: Summary. Byungha Shin Dept. of MSE, KAIST

MS482 Materials Characterization ( 재료분석 ) Lecture Note 12: Summary. Byungha Shin Dept. of MSE, KAIST 2015 Fall Semester MS482 Materials Characterization ( 재료분석 ) Lecture Note 12: Summary Byungha Shin Dept. of MSE, KAIST 1 Course Information Syllabus 1. Overview of various characterization techniques (1

More information

X-Ray Photoelectron Spectroscopy (XPS) Prof. Paul K. Chu

X-Ray Photoelectron Spectroscopy (XPS) Prof. Paul K. Chu X-Ray Photoelectron Spectroscopy (XPS) Prof. Paul K. Chu X-ray Photoelectron Spectroscopy Introduction Qualitative analysis Quantitative analysis Charging compensation Small area analysis and XPS imaging

More information

ToF-SIMS or XPS? Xinqi Chen Keck-II

ToF-SIMS or XPS? Xinqi Chen Keck-II ToF-SIMS or XPS? Xinqi Chen Keck-II 1 Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Not ToF MS (laser, solution) X-ray Photoelectron Spectroscopy (XPS) 2 3 Modes of SIMS 4 Secondary Ion Sputtering

More information

Application of surface analysis for root cause failure analysis

Application of surface analysis for root cause failure analysis Application of surface analysis for root cause failure analysis DAVID A. COLE * Evans Analytical Group, 104 Windsor Center, Suite 101, East Windsor, NJ 08520 1. INTRODUCTION Elucidating the root cause

More information

Interfacial Chemistry and Adhesion Phenomena: How to Analyse and How to Optimise

Interfacial Chemistry and Adhesion Phenomena: How to Analyse and How to Optimise Interfacial Chemistry and Adhesion Phenomena: How to Analyse and How to Optimise John F Watts Department of Mechanical Engineering Sciences The Role of Surface Analysis in Adhesion Studies Assessing surface

More information

MS482 Materials Characterization ( 재료분석 ) Lecture Note 5: RBS

MS482 Materials Characterization ( 재료분석 ) Lecture Note 5: RBS 2016 Fall Semester MS482 Materials Characterization ( 재료분석 ) Lecture Note 5: RBS Byungha Shin Dept. of MSE, KAIST 1 Course Information Syllabus 1. Overview of various characterization techniques (1 lecture)

More information

PHI 5000 Versaprobe-II Focus X-ray Photo-electron Spectroscopy

PHI 5000 Versaprobe-II Focus X-ray Photo-electron Spectroscopy PHI 5000 Versaprobe-II Focus X-ray Photo-electron Spectroscopy The very basic theory of XPS XPS theroy Surface Analysis Ultra High Vacuum (UHV) XPS Theory XPS = X-ray Photo-electron Spectroscopy X-ray

More information

Surface Analytical Techniques for Analysis of Coatings Mary Jane Walzak, Mark Biesinger and Brad Kobe The University of Western Ontario, Surface

Surface Analytical Techniques for Analysis of Coatings Mary Jane Walzak, Mark Biesinger and Brad Kobe The University of Western Ontario, Surface Surface Analytical Techniques for Analysis of Coatings Mary Jane Walzak, Mark Biesinger and Brad Kobe The University of Western Ontario, Surface Science Western 999 Collip Circle, Room LL31, London, ON

More information

Tailored surface modification of substrates by atmospheric plasma for improved compatibility with specific adhesive Nicolas Vandencasteele

Tailored surface modification of substrates by atmospheric plasma for improved compatibility with specific adhesive Nicolas Vandencasteele 1 oating Plasma Innovation Tailored surface modification of substrates by atmospheric plasma for improved compatibility with specific adhesive Nicolas Vandencasteele 2 Plasma Applications Adhesion improvement

More information

Case Study of Electronic Materials Packaging with Poor Metal Adhesion and the Process for Performing Root Cause Failure Analysis

Case Study of Electronic Materials Packaging with Poor Metal Adhesion and the Process for Performing Root Cause Failure Analysis Case Study of Electronic Materials Packaging with Poor Metal Adhesion and the Process for Performing Root Cause Failure Analysis Dr. E. A. Leone BACKGRUND ne trend in the electronic packaging industry

More information

Review. Surfaces of Biomaterials. Characterization. Surface sensitivity

Review. Surfaces of Biomaterials. Characterization. Surface sensitivity Surfaces of Biomaterials Three lectures: 1.23.05 Surface Properties of Biomaterials 1.25.05 Surface Characterization 1.27.05 Surface and Protein Interactions Review Bulk Materials are described by: Chemical

More information

Secondary Ion Mass Spectrometry (SIMS)

Secondary Ion Mass Spectrometry (SIMS) CHEM53200: Lecture 10 Secondary Ion Mass Spectrometry (SIMS) Major reference: Surface Analysis Edited by J. C. Vickerman (1997). 1 Primary particles may be: Secondary particles can be e s, neutral species

More information

MS482 Materials Characterization ( 재료분석 ) Lecture Note 4: XRF

MS482 Materials Characterization ( 재료분석 ) Lecture Note 4: XRF 2016 Fall Semester MS482 Materials Characterization ( 재료분석 ) Lecture Note 4: XRF Byungha Shin Dept. of MSE, KAIST 1 Course Information Syllabus 1. Overview of various characterization techniques (1 lecture)

More information

The design of an integrated XPS/Raman spectroscopy instrument for co-incident analysis

The design of an integrated XPS/Raman spectroscopy instrument for co-incident analysis The design of an integrated XPS/Raman spectroscopy instrument for co-incident analysis Tim Nunney The world leader in serving science 2 XPS Surface Analysis XPS +... UV Photoelectron Spectroscopy UPS He(I)

More information

Auger Electron Spectroscopy

Auger Electron Spectroscopy Auger Electron Spectroscopy Auger Electron Spectroscopy is an analytical technique that provides compositional information on the top few monolayers of material. Detect all elements above He Detection

More information

MS482 Materials Characterization ( 재료분석 ) Lecture Note 5: RBS. Byungha Shin Dept. of MSE, KAIST

MS482 Materials Characterization ( 재료분석 ) Lecture Note 5: RBS. Byungha Shin Dept. of MSE, KAIST 2015 Fall Semester MS482 Materials Characterization ( 재료분석 ) Lecture Note 5: RBS Byungha Shin Dept. of MSE, KAIST 1 Course Information Syllabus 1. Overview of various characterization techniques (1 lecture)

More information

Secondary Ion Mass Spectrometry (SIMS) Thomas Sky

Secondary Ion Mass Spectrometry (SIMS) Thomas Sky 1 Secondary Ion Mass Spectrometry (SIMS) Thomas Sky Depth (µm) 2 Characterization of solar cells 0,0 1E16 1E17 1E18 1E19 1E20 0,2 0,4 0,6 0,8 1,0 1,2 P Concentration (cm -3 ) Characterization Optimization

More information

MSE 321 Structural Characterization

MSE 321 Structural Characterization Auger Spectroscopy Auger Electron Spectroscopy (AES) Scanning Auger Microscopy (SAM) Incident Electron Ejected Electron Auger Electron Initial State Intermediate State Final State Physical Electronics

More information

IV. Surface analysis for chemical state, chemical composition

IV. Surface analysis for chemical state, chemical composition IV. Surface analysis for chemical state, chemical composition Probe beam Detect XPS Photon (X-ray) Photoelectron(core level electron) UPS Photon (UV) Photoelectron(valence level electron) AES electron

More information

Auger Electron Spectroscopy (AES)

Auger Electron Spectroscopy (AES) 1. Introduction Auger Electron Spectroscopy (AES) Silvia Natividad, Gabriel Gonzalez and Arena Holguin Auger Electron Spectroscopy (Auger spectroscopy or AES) was developed in the late 1960's, deriving

More information

Secondary Ion Mass Spectroscopy (SIMS)

Secondary Ion Mass Spectroscopy (SIMS) Secondary Ion Mass Spectroscopy (SIMS) Analyzing Inorganic Solids * = under special conditions ** = semiconductors only + = limited number of elements or groups Analyzing Organic Solids * = under special

More information

Secondary-Ion Mass Spectrometry

Secondary-Ion Mass Spectrometry Principle of SIMS composition depth profiling with surface analysis techniques? Secondary-Ion Mass Spectrometry erosion of specimen surface by energetic particle bombardment sputtering two possibilities

More information

Auger Electron Spectroscopy (AES) Prof. Paul K. Chu

Auger Electron Spectroscopy (AES) Prof. Paul K. Chu Auger Electron Spectroscopy (AES) Prof. Paul K. Chu Auger Electron Spectroscopy Introduction Principles Instrumentation Qualitative analysis Quantitative analysis Depth profiling Mapping Examples The Auger

More information

Surface modification of polyethylene terephthalate (PET) and oxide coated PET for adhesion improvement

Surface modification of polyethylene terephthalate (PET) and oxide coated PET for adhesion improvement Surface modification of polyethylene terephthalate (PET) and oxide coated PET for adhesion improvement AIMCAL 2016 Dresden Juliane Fichtner Tobias Beck Frank Simon (IPF, Dresden) page 1 Motivation oxygen

More information

Introduction to X-ray Photoelectron Spectroscopy (XPS) XPS which makes use of the photoelectric effect, was developed in the mid-1960

Introduction to X-ray Photoelectron Spectroscopy (XPS) XPS which makes use of the photoelectric effect, was developed in the mid-1960 Introduction to X-ray Photoelectron Spectroscopy (XPS) X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA) is a widely used technique to investigate

More information

Introduction to SIMS Basic principles Components Techniques Drawbacks Figures of Merit Variations Resources

Introduction to SIMS Basic principles Components Techniques Drawbacks Figures of Merit Variations Resources Introduction to SIMS Basic principles Components Techniques Drawbacks Figures of Merit Variations Resources New technique for surface chemical analysis. SIMS examines the mass of ions, instead of energy

More information

XPS & Scanning Auger Principles & Examples

XPS & Scanning Auger Principles & Examples XPS & Scanning Auger Principles & Examples Shared Research Facilities Lunch Talk Contact info: dhu Pujari & Han Zuilhof Lab of rganic Chemistry Wageningen University E-mail: dharam.pujari@wur.nl Han.Zuilhof@wur.nl

More information

Lecture 11 Surface Characterization of Biomaterials in Vacuum

Lecture 11 Surface Characterization of Biomaterials in Vacuum 1 Lecture 11 Surface Characterization of Biomaterials in Vacuum The structure and chemistry of a biomaterial surface greatly dictates the degree of biocompatibility of an implant. Surface characterization

More information

Reduced preferential sputtering of TiO 2 (and Ta 2 O 5 ) thin films through argon cluster ion bombardment.

Reduced preferential sputtering of TiO 2 (and Ta 2 O 5 ) thin films through argon cluster ion bombardment. NATIOMEM Reduced preferential sputtering of TiO 2 (and Ta 2 O 5 ) thin films through argon cluster ion bombardment. R. Grilli *, P. Mack, M.A. Baker * * University of Surrey, UK ThermoFisher Scientific

More information

An Introduction to Auger Electron Spectroscopy

An Introduction to Auger Electron Spectroscopy An Introduction to Auger Electron Spectroscopy Spyros Diplas MENA3100 SINTEF Materials & Chemistry, Department of Materials Physics & Centre of Materials Science and Nanotechnology, Department of Chemistry,

More information

Secondaryionmassspectrometry

Secondaryionmassspectrometry Secondaryionmassspectrometry (SIMS) 1 Incident Ion Techniques for Surface Composition Analysis Mass spectrometric technique 1. Ionization -Electron ionization (EI) -Chemical ionization (CI) -Field ionization

More information

EE 527 MICROFABRICATION. Lecture 5 Tai-Chang Chen University of Washington

EE 527 MICROFABRICATION. Lecture 5 Tai-Chang Chen University of Washington EE 527 MICROFABRICATION Lecture 5 Tai-Chang Chen University of Washington MICROSCOPY AND VISUALIZATION Electron microscope, transmission electron microscope Resolution: atomic imaging Use: lattice spacing.

More information

XPS/UPS and EFM. Brent Gila. XPS/UPS Ryan Davies EFM Andy Gerger

XPS/UPS and EFM. Brent Gila. XPS/UPS Ryan Davies EFM Andy Gerger XPS/UPS and EFM Brent Gila XPS/UPS Ryan Davies EFM Andy Gerger XPS/ESCA X-ray photoelectron spectroscopy (XPS) also called Electron Spectroscopy for Chemical Analysis (ESCA) is a chemical surface analysis

More information

Plasma polymers can be used to modify the surface chemistries of materials in a controlled fashion (without effecting bulk chemistry).

Plasma polymers can be used to modify the surface chemistries of materials in a controlled fashion (without effecting bulk chemistry). Plasma polymers can be used to modify the surface chemistries of materials in a controlled fashion (without effecting bulk chemistry). An example used here is the modification of the alumina surface of

More information

Secondary ion mass spectrometry (SIMS)

Secondary ion mass spectrometry (SIMS) Secondary ion mass spectrometry (SIMS) Lasse Vines 1 Secondary ion mass spectrometry O Zn 10000 O 2 Counts/sec 1000 100 Li Na K Cr ZnO 10 ZnO 2 1 0 20 40 60 80 100 Mass (AMU) 10 21 10 20 Si 07 Ge 0.3 Atomic

More information

Atmospheric Plasma treatment, effect on the plasma chemistry on adhesion Nicolas Vandencasteele

Atmospheric Plasma treatment, effect on the plasma chemistry on adhesion Nicolas Vandencasteele 1 oating Plasma Innovation Atmospheric Plasma treatment, effect on the plasma chemistry on adhesion Nicolas Vandencasteele 2 Plasma Applications Adhesion improvement onclusion 3 Plasma 4 th state of matter:

More information

The Rôle of the Adhesion Promoter in a Model Water-Borne Primer

The Rôle of the Adhesion Promoter in a Model Water-Borne Primer The Rôle of the Adhesion Promoter in a Model Water-Borne Primer Siavash Adhami, Marie-Laure Abel, Chris Lowe, John F. Watts Department of Mechanical Engineering Sciences October 13-18, 213 Cagliari, Sardinia

More information

Methods of surface analysis

Methods of surface analysis Methods of surface analysis Nanomaterials characterisation I RNDr. Věra Vodičková, PhD. Surface of solid matter: last monoatomic layer + absorbed monolayer physical properties are effected (crystal lattice

More information

MSE 321 Structural Characterization

MSE 321 Structural Characterization Auger Spectroscopy Auger Electron Spectroscopy (AES) Scanning Auger Microscopy (SAM) Incident Electron Ejected Electron Auger Electron Initial State Intermediate State Final State Physical Electronics

More information

Energy Spectroscopy. Ex.: Fe/MgO

Energy Spectroscopy. Ex.: Fe/MgO Energy Spectroscopy Spectroscopy gives access to the electronic properties (and thus chemistry, magnetism,..) of the investigated system with thickness dependence Ex.: Fe/MgO Fe O Mg Control of the oxidation

More information

Special Properties of Au Nanoparticles

Special Properties of Au Nanoparticles Special Properties of Au Nanoparticles Maryam Ebrahimi Chem 7500/750 March 28 th, 2007 1 Outline Introduction The importance of unexpected electronic, geometric, and chemical properties of nanoparticles

More information

Analysis of Poly(dimethylsiloxane) on Solid Surfaces Using Silver Deposition/TOF-SIMS

Analysis of Poly(dimethylsiloxane) on Solid Surfaces Using Silver Deposition/TOF-SIMS Special Issue Surface and Micro-Analysis of Organic Materials 21 Research Report Analysis of Poly(dimethylsiloxane) on Solid Surfaces Using Silver Deposition/TOF-SIMS Masae Inoue, Atsushi Murase Abstract

More information

4. How can fragmentation be useful in identifying compounds? Permits identification of branching not observed in soft ionization.

4. How can fragmentation be useful in identifying compounds? Permits identification of branching not observed in soft ionization. Homework 9: Chapters 20-21 Assigned 12 April; Due 17 April 2006; Quiz on 19 April 2006 Chap. 20 (Molecular Mass Spectroscopy) Chap. 21 (Surface Analysis) 1. What are the types of ion sources in molecular

More information

Surface analysis techniques

Surface analysis techniques Experimental methods in physics Surface analysis techniques 3. Ion probes Elemental and molecular analysis Jean-Marc Bonard Academic year 10-11 3. Elemental and molecular analysis 3.1.!Secondary ion mass

More information

PHI Model 06-C60 Sputter Ion Gun

PHI Model 06-C60 Sputter Ion Gun PHI Model 6-C6 Sputter Ion Gun Introduction: Physical Electronics introduced the model 6-C6 C 6 sputter ion gun and its unique capabilities for surface cleaning and depth profiling of soft materials (figure

More information

Sciences and Analyses of Materials Department Surface Treatment Unit Centre de Recherche Public Gabriel Lippmann Belvaux - Luxembourg

Sciences and Analyses of Materials Department Surface Treatment Unit Centre de Recherche Public Gabriel Lippmann Belvaux - Luxembourg Sciences and Analyses of Materials Department Surface Treatment Unit Centre de Recherche Public Gabriel Lippmann Belvaux - Luxembourg Surface Treatment Unit, UTS BRIEF history : 2006 2009 : launched of

More information

Applications of Micro-Area Analysis Used by JPS-9200 X-ray Photoelectron Spectrometer

Applications of Micro-Area Analysis Used by JPS-9200 X-ray Photoelectron Spectrometer Applications of Micro-Area Analysis Used by JPS-9200 X-ray Photoelectron Spectrometer Yoshitoki Iijima Application & Research Center, JEOL Ltd. Introduction Recently, with advances in the development of

More information

A DIVISION OF ULVAC-PHI

A DIVISION OF ULVAC-PHI A DIVISION OF ULVAC-PHI X-ray photoelectron spectroscopy (XPS/ESCA) is the most widely used surface analysis technique and has many well established industrial and research applications. XPS provides

More information

Oxygen Incorporation in Rubrene Single Crystals

Oxygen Incorporation in Rubrene Single Crystals Oxygen Incorporation in Rubrene Single Crystals Daniel D. T. Mastrogiovanni 1, Jeff Mayer 2, Alan S. Wan 2, Aleksey Vishnyakov 3, Alexander V. Neimark 3, Vitaly Podzorov 4,5, Leonard C. Feldman 4,5, and

More information

X- ray Photoelectron Spectroscopy and its application in phase- switching device study

X- ray Photoelectron Spectroscopy and its application in phase- switching device study X- ray Photoelectron Spectroscopy and its application in phase- switching device study Xinyuan Wang A53073806 I. Background X- ray photoelectron spectroscopy is of great importance in modern chemical and

More information

Biomaterial Scaffolds

Biomaterial Scaffolds Biomaterial Scaffolds Biomaterial Properties Surface properties Bulk properties Biological properties Types of Biomaterials Biological materials Synthetic materials Surface Properties The body reads the

More information

Polymer/drug films as a model system for a drug eluting coronary stent coating layer

Polymer/drug films as a model system for a drug eluting coronary stent coating layer Polymer/drug films as a model system for a drug eluting coronary stent coating layer Valeria Ciarnelli Prof. Clive Roberts Prof. Morgan Alexander, Prof. Martyn Davies School of Pharmacy The University

More information

1 Introduction COPYRIGHTED MATERIAL. 1.1 HowdoweDefinetheSurface?

1 Introduction COPYRIGHTED MATERIAL. 1.1 HowdoweDefinetheSurface? 1 Introduction JOHN C. VICKERMAN Manchester Interdisciplinary Biocentre, School of Chemical Engineering and Analytical Science, The University of Manchester, Manchester, UK The surface behaviour of materials

More information

Surface Chemistry and Reaction Dynamics of Electron Beam Induced Deposition Processes

Surface Chemistry and Reaction Dynamics of Electron Beam Induced Deposition Processes Surface Chemistry and Reaction Dynamics of Electron Beam Induced Deposition Processes e -? 2 nd FEBIP Workshop Thun, Switzerland 2008 Howard Fairbrother Johns Hopkins University Baltimore, MD, USA Outline

More information

Auger Electron Spectroscopy Overview

Auger Electron Spectroscopy Overview Auger Electron Spectroscopy Overview Also known as: AES, Auger, SAM 1 Auger Electron Spectroscopy E KLL = E K - E L - E L AES Spectra of Cu EdN(E)/dE Auger Electron E N(E) x 5 E KLL Cu MNN Cu LMM E f E

More information

Nanoscale Chemical Characterization: Moving to 3 Dimensions

Nanoscale Chemical Characterization: Moving to 3 Dimensions Nanoscale Chemical Characterization: Moving to 3 Dimensions Eric B. Steel Chemical Science & Technology Laboratory National Institute of Standards & Technology Outline What is and why do we need chemical

More information

Materials Characterization. Foothill College Nanotechnology Program

Materials Characterization. Foothill College Nanotechnology Program Materials Characterization Foothill College Nanotechnology Program Overview The case for materials characterization Approaches to characterization Categories of instrumental techniques Who uses these tools?

More information

Characterization of Secondary Emission Materials for Micro-Channel Plates. S. Jokela, I. Veryovkin, A. Zinovev

Characterization of Secondary Emission Materials for Micro-Channel Plates. S. Jokela, I. Veryovkin, A. Zinovev Characterization of Secondary Emission Materials for Micro-Channel Plates S. Jokela, I. Veryovkin, A. Zinovev Secondary Electron Yield Testing Technique We have incorporated XPS, UPS, Ar-ion sputtering,

More information

The Benefit of Wide Energy Range Spectrum Acquisition During Sputter Depth Profile Measurements

The Benefit of Wide Energy Range Spectrum Acquisition During Sputter Depth Profile Measurements The Benefit of Wide Energy Range Spectrum Acquisition During Sputter Depth Profile Measurements Uwe Scheithauer, 82008 Unterhaching, Germany E-Mail: scht.uhg@googlemail.com Internet: orcid.org/0000-0002-4776-0678;

More information

Surface Analysis - The Principal Techniques

Surface Analysis - The Principal Techniques Surface Analysis - The Principal Techniques 2nd Edition Editors johnc.vickerman Manchester Interdisciplinary Biocentre, University of Manchester, UK IAN S. GILMORE National Physical Laboratory, Teddington,

More information

CIM PACA Characterisation Lab

CIM PACA Characterisation Lab CIM PACA Characterisation Lab Your partner of choice for the chemical characterisation of your materials Partners: Who are we? The CIM PACA Characterisation Lab was registered in 2005 as a not-for-profit

More information

QUESTIONS AND ANSWERS

QUESTIONS AND ANSWERS QUESTIONS AND ANSWERS (1) For a ground - state neutral atom with 13 protons, describe (a) Which element this is (b) The quantum numbers, n, and l of the inner two core electrons (c) The stationary state

More information

Theta Probe: A tool for characterizing ultra thin films and self assembled monolayers using parallel angle resolved XPS (ARXPS)

Theta Probe: A tool for characterizing ultra thin films and self assembled monolayers using parallel angle resolved XPS (ARXPS) Theta Probe: A tool for characterizing ultra thin films and self assembled monolayers using parallel angle resolved XPS (ARXPS) C. E. Riley, P. Mack, T. S. Nunney and R. G. White Thermo Fisher Scientific

More information

Multi-Layer Coating of Ultrathin Polymer Films on Nanoparticles of Alumina by a Plasma Treatment

Multi-Layer Coating of Ultrathin Polymer Films on Nanoparticles of Alumina by a Plasma Treatment Mat. Res. Soc. Symp. Vol. 635 2001 Materials Research Society Multi-Layer Coating of Ultrathin Polymer Films on Nanoparticles of Alumina by a Plasma Treatment Donglu Shi, Zhou Yu, S. X. Wang 1, Wim J.

More information

Impurities and Electronic Property Variations of Natural MoS 2 Crystal Surfaces

Impurities and Electronic Property Variations of Natural MoS 2 Crystal Surfaces Supporting Information Impurities and Electronic Property Variations of Natural MoS 2 Crystal Surfaces Rafik Addou 1, *, Stephen McDonnell 1, Diego Barrera 1,2, Zaibing Guo 3, Angelica Azcatl 1, Jian Wang

More information

Supplementary Figure S1. AFM image and height profile of GO. (a) AFM image

Supplementary Figure S1. AFM image and height profile of GO. (a) AFM image Supplementary Figure S1. AFM image and height profile of GO. (a) AFM image and (b) height profile of GO obtained by spin-coating on silicon wafer, showing a typical thickness of ~1 nm. 1 Supplementary

More information

EDS User School. Principles of Electron Beam Microanalysis

EDS User School. Principles of Electron Beam Microanalysis EDS User School Principles of Electron Beam Microanalysis Outline 1.) Beam-specimen interactions 2.) EDS spectra: Origin of Bremsstrahlung and characteristic peaks 3.) Moseley s law 4.) Characteristic

More information

Advantages of coincident XPS-Raman in the analysis of mineral oxides species

Advantages of coincident XPS-Raman in the analysis of mineral oxides species APPLICATION NOTE Advantages of coincident XPS-Raman in the analysis of mineral oxides species No. AN52950 Authors: Jon Treacy, Thermo Fisher Scientific, East Grinstead, Great Britain and Robert Heintz,

More information

Atmospheric pressure Plasma Enhanced CVD for large area deposition of TiO 2-x electron transport layers for PV. Heather M. Yates

Atmospheric pressure Plasma Enhanced CVD for large area deposition of TiO 2-x electron transport layers for PV. Heather M. Yates Atmospheric pressure Plasma Enhanced CVD for large area deposition of TiO 2-x electron transport layers for PV Heather M. Yates Why the interest? Perovskite solar cells have shown considerable promise

More information

FIB - SIMS. Focussed Ion Beam Secondary Ion Mass Spectrometry.

FIB - SIMS. Focussed Ion Beam Secondary Ion Mass Spectrometry. FIB - SIMS Focussed Ion Beam Secondary Ion Mass Spectrometry Outline Introduction to Hiden Analytical Introduction to SIMS FIB-SIMS - Introduction and key features FIB-SIMS - Applications data Hiden SIMS

More information

Liquid Analysis of Radioactive Materials Using In Situ ToF-SIMS

Liquid Analysis of Radioactive Materials Using In Situ ToF-SIMS Liquid Analysis of Radioactive Materials Using In Situ ToF-SIMS Xiao-Ying Yu, Juan Yao, May-Lin Thomas, and Zihua Zhu Pacific Northwest National Laboratory, Richland, WA INMM Workshop, May, 2018 1 Motivation

More information

Impact of Contact Evolution on the Shelf Life of Organic Solar Cells

Impact of Contact Evolution on the Shelf Life of Organic Solar Cells Impact of Contact Evolution on the Shelf Life of Organic Solar Cells By Matthew T. Lloyd, Dana C. Olson, Ping Lu, Erica Fang, Diana L. Moore, Matthew S. White, Matthew O. Reese, David S. Ginley, and Julia

More information

Electronic Supplementary Information. Molecular Antenna Tailored Organic Thin-film Transistor for. Sensing Application

Electronic Supplementary Information. Molecular Antenna Tailored Organic Thin-film Transistor for. Sensing Application Electronic Supplementary Material (ESI) for Materials Horizons. This journal is The Royal Society of Chemistry 2017 Electronic Supplementary Information Molecular Antenna Tailored Organic Thin-film Transistor

More information

S. Ichikawa*, R. Kuze, T. Shimizu and H. Shimaoka INTRODUCTION

S. Ichikawa*, R. Kuze, T. Shimizu and H. Shimaoka INTRODUCTION Journal of Surface Analysis,Vol.12 No.2 (2005); S.Ichikawa, et al., Coverage Estimation of Silane. Coverage Estimation of Silane Functionalized Perfluoropolyether Layer by using Time of Flight Secondary

More information

Surface Analysis by XPS & ToF-SIMS Basics, Strengths, and Limitations

Surface Analysis by XPS & ToF-SIMS Basics, Strengths, and Limitations Surface Analysis by XPS & ToF-SIMS Basics, Strengths, and Limitations Michael Bruns michael.bruns@kit.edu KIT University of the State of Baden-Württemberg and National Laboratory of the Helmholtz Association

More information

Molecular depth profiling with reactive ions, or why chemistry matters in sputtering.

Molecular depth profiling with reactive ions, or why chemistry matters in sputtering. Molecular depth profiling with reactive ions, or why chemistry matters in sputtering. L. Houssiau, N. Mine, N. Wehbe Research Centre in Physics of Matter and Radiation (PMR), University of Namur (FUNDP),

More information

Hydrogenation of Single Walled Carbon Nanotubes

Hydrogenation of Single Walled Carbon Nanotubes Hydrogenation of Single Walled Carbon Nanotubes Anders Nilsson Stanford Synchrotron Radiation Laboratory (SSRL) and Stockholm University Coworkers and Ackowledgement A. Nikitin 1), H. Ogasawara 1), D.

More information

A. Optimizing the growth conditions of large-scale graphene films

A. Optimizing the growth conditions of large-scale graphene films 1 A. Optimizing the growth conditions of large-scale graphene films Figure S1. Optical microscope images of graphene films transferred on 300 nm SiO 2 /Si substrates. a, Images of the graphene films grown

More information

X-ray Photoelectron Spectroscopy/ Electron spectroscopy for chemical analysis (ESCA), By Francis Chindeka

X-ray Photoelectron Spectroscopy/ Electron spectroscopy for chemical analysis (ESCA), By Francis Chindeka X-ray Photoelectron Spectroscopy/ Electron spectroscopy for chemical analysis (ESCA), By Francis Chindeka X-ray photoelectron spectroscopy (XPS) or Electron spectroscopy for chemical analysis (ESCA), Surface

More information

Imaging Methods: Scanning Force Microscopy (SFM / AFM)

Imaging Methods: Scanning Force Microscopy (SFM / AFM) Imaging Methods: Scanning Force Microscopy (SFM / AFM) The atomic force microscope (AFM) probes the surface of a sample with a sharp tip, a couple of microns long and often less than 100 Å in diameter.

More information

Birck Nanotechnology Center XPS: X-ray Photoelectron Spectroscopy ESCA: Electron Spectrometer for Chemical Analysis

Birck Nanotechnology Center XPS: X-ray Photoelectron Spectroscopy ESCA: Electron Spectrometer for Chemical Analysis Birck Nanotechnology Center XPS: X-ray Photoelectron Spectroscopy ESCA: Electron Spectrometer for Chemical Analysis Dmitry Zemlyanov Birck Nanotechnology Center, Purdue University Outline Introduction

More information

Fabrication Technology, Part I

Fabrication Technology, Part I EEL5225: Principles of MEMS Transducers (Fall 2004) Fabrication Technology, Part I Agenda: Microfabrication Overview Basic semiconductor devices Materials Key processes Oxidation Thin-film Deposition Reading:

More information

Lecture 7 Chemical/Electronic Structure of Glass

Lecture 7 Chemical/Electronic Structure of Glass Lecture 7 Chemical/Electronic Structure of Glass Syllabus Topic 6. Electronic spectroscopy studies of glass structure Fundamentals and Applications of X-ray Photoelectron Spectroscopy (XPS) a.k.a. Electron

More information

MICRO-TOMOGRAPHY AND X-RAY ANALYSIS OF GEOLOGICAL SAMPLES

MICRO-TOMOGRAPHY AND X-RAY ANALYSIS OF GEOLOGICAL SAMPLES THE PUBLISHING HOUSE PROCEEDINGS OF THE ROMANIAN ACADEMY, Series A, OF THE ROMANIAN ACADEMY Volume 18, Number 1/2017, pp. 42 49 MICRO-TOMOGRAPHY AND X-RAY ANALYSIS OF GEOLOGICAL SAMPLES Ion GRUIA University

More information

Surface Analysis - The Principal Techniques

Surface Analysis - The Principal Techniques Surface Analysis - The Principal Techniques Edited by John C. Vickerman Surface Analysis Research Centre, Department of Chemistry UMIST, Manchester, UK JOHN WILEY & SONS Chichester New York Weinheim Brisbane

More information

MODERN TECHNIQUES OF SURFACE SCIENCE

MODERN TECHNIQUES OF SURFACE SCIENCE MODERN TECHNIQUES OF SURFACE SCIENCE Second edition D. P. WOODRUFF & T. A. DELCHAR Department ofphysics, University of Warwick CAMBRIDGE UNIVERSITY PRESS Contents Preface to first edition Preface to second

More information

ECE Semiconductor Device and Material Characterization

ECE Semiconductor Device and Material Characterization ECE 4813 Semiconductor Device and Material Characterization Dr. Alan Doolittle School of Electrical and Computer Engineering Georgia Institute of Technology As with all of these lecture slides, I am indebted

More information

ABC s of Electrochemistry: X-Ray Photoelectron Spectroscopy (XPS) Madhivanan Muthuvel

ABC s of Electrochemistry: X-Ray Photoelectron Spectroscopy (XPS) Madhivanan Muthuvel ABC s of Electrochemistry: X-Ray Photoelectron Spectroscopy (XPS) Madhivanan Muthuvel Center for Electrochemical Engineering Research (CEER) Chemical and Biomolecular Engineering Ohio University Athens,

More information

Secondary ion mass spectrometry (SIMS)

Secondary ion mass spectrometry (SIMS) Secondary ion mass spectrometry (SIMS) ELEC-L3211 Postgraduate Course in Micro and Nanosciences Department of Micro and Nanosciences Personal motivation and experience on SIMS Offers the possibility to

More information

Nova 600 NanoLab Dual beam Focused Ion Beam IITKanpur

Nova 600 NanoLab Dual beam Focused Ion Beam IITKanpur Nova 600 NanoLab Dual beam Focused Ion Beam system @ IITKanpur Dual Beam Nova 600 Nano Lab From FEI company (Dual Beam = SEM + FIB) SEM: The Electron Beam for SEM Field Emission Electron Gun Energy : 500

More information

Sputtering, Cluster Primary Ions and Static SIMS

Sputtering, Cluster Primary Ions and Static SIMS Invited Paper Sputtering, Cluster Primary Ions and Static SIMS Martin P Seah * Quality of Life Division, National Physical Laboratory, Teddington, Middlesex TW 0LW, UK *martin.seah@npl.co.uk (Received:

More information

Dr. Tim Nunney Thermo Fisher Scientific, East Grinstead, UK Dr. Nick Bulloss Thermo Fisher Scientific, Madison, WI, USA Dr. Harry Meyer III Oak Ridge

Dr. Tim Nunney Thermo Fisher Scientific, East Grinstead, UK Dr. Nick Bulloss Thermo Fisher Scientific, Madison, WI, USA Dr. Harry Meyer III Oak Ridge Dr. Tim Nunney Thermo Fisher Scientific, East Grinstead, UK Dr. Nick Bulloss Thermo Fisher Scientific, Madison, WI, USA Dr. Harry Meyer III Oak Ridge National Laboratory, TN, USA Introduction New materials

More information

Supporting Information

Supporting Information Supporting Information Yao et al. 10.1073/pnas.1416368111 Fig. S1. In situ LEEM imaging of graphene growth via chemical vapor deposition (CVD) on Pt(111). The growth of graphene on Pt(111) via a CVD process

More information

Energy Spectroscopy. Excitation by means of a probe

Energy Spectroscopy. Excitation by means of a probe Energy Spectroscopy Excitation by means of a probe Energy spectral analysis of the in coming particles -> XAS or Energy spectral analysis of the out coming particles Different probes are possible: Auger

More information

Surface and Micro-Analysis of Organic Materials

Surface and Micro-Analysis of Organic Materials Special Issue Surface and Micro-Analysis of Organic Materials 1 Surface and Micro-Analysis of Organic Materials Review Atsushi Murase Abstract This paper is a review of the technical approaches taken at

More information

Lecture 22 Ion Beam Techniques

Lecture 22 Ion Beam Techniques Lecture 22 Ion Beam Techniques Schroder: Chapter 11.3 1/44 Announcements Homework 6/6: Will be online on later today. Due Wednesday June 6th at 10:00am. I will return it at the final exam (14 th June).

More information

Supplementary Information for. Silver Nanoparticles Embedded Anti-microbial Paints Based on Vegetable Oil

Supplementary Information for. Silver Nanoparticles Embedded Anti-microbial Paints Based on Vegetable Oil Supplementary Information for Silver Nanoparticles Embedded Anti-microbial Paints Based on Vegetable Oil Ashavani Kumar #, Praveen Kumar Vemula #, Pulickel M. Ajayan, George John * Department of Chemistry,

More information