Test Report TAIYO INK(SUZHOU)CO.,LTD. NO.26 TAISHAN ROAD,SUZHOU NEW DISTRICT, SUZHOU CITY,JIANGSU PROVINCE,P.R.CHINA
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1 Applicant Address ECL01H Page 1 of 7 TAIYO INK(SUZHOU)CO.,LTD. NO.26 TAISHAN ROAD,SUZHOU NEW DISTRT, SUZHOU CITY,JIANGSU PROVINCE,P.R.CHINA The following sample(s) and sample information was/were submitted and identified by/on the behalf of the client Sample Name PSR-4000 LEW7S/CA-40 LEW7S Part No. Solder Mask Item/Lot No / Color Material White Resin/fillers/Pigment/else Sample Received Date Nov. 26, 2015 Testing Period Nov. 26, 2015 to Nov. 30, 2015 Test Requested Test Method Test Result(s) As specified by client, to test Lead (Pb), Cadmium (Cd), Mercury (Hg), Hexavalent Chromium(Cr(VI)), Polybrominated Biphenyl(PBBs), Polybrominated Diphenyl Ethers(PBDEs), Fluorine(F), Chlorine(Cl), Bromine(Br), Iodine(I), Hexabromocyclododecane (HBCDD), Phthalates in the submitted sample(s). Please refer to the following page(s). Please refer to the following page(s). Nov. 30, 2015 No. R
2 ECL01H Page 2 of 7 Test Method Test Item(s) Lead (Pb) Cadmium (Cd) Mercury (Hg) Hexavalent Chromium(Cr(VI)) Polybrominated Biphenyl(PBBs) Polybrominated Diphenyl Ethers(PBDEs) Fluorine(F) Chlorine(Cl) Bromine(Br) Iodine(I) Hexabromocyclododecane (HBCDD) Phthalates Test Result(s) Test Method IEC :2013 Ed.1.0 IEC :2013 Ed.1.0 IEC :2013 Ed.1.0 IEC 62321:2008 Ed.1 Annex C IEC 62321:2008 Ed.1 Annex A IEC 62321:2008 Ed.1 Annex A Refer to US EPA 3550C:2007 & US EPA 8270D:2007 Refer to EN 14372:2004(E) Measured Equipment(s) P-OES P-OES P-OES UV-Vis Lead (Pb) Cadmium (Cd) Mercury (Hg) Hexavalent Chromium (Cr(VI)) Polybrominated Biphenyl(PBBs) Monobromobiphenyl Dibromobiphenyl Tribromobiphenyl Tetrabromobiphenyl Pentabromobiphenyl Hexabromobiphenyl Heptabromobiphenyl Octabromobiphenyl Nonabromobiphenyl Decabromobiphenyl
3 ECL01H Page 3 of 7 Polybrominated Diphenyl Ethers(PBDEs) Monobromodiphenyl ether Dibromodiphenyl ether Tribromodiphenyl ether Tetrabromodiphenyl ether Pentabromodiphenyl ether Hexabromodiphenyl ether Heptabromodiphenyl ether Octabromodiphenyl ether Nonabromodiphenyl ether Decabromodiphenyl ether Halogen(s) Fluorine(F) Chlorine(Cl) 173 mg/kg Bromine(Br) Iodine(I) Hexabromocyclododecane (HBCDD)
4 ECL01H Page 4 of 7 Phthalates Dimethyl phthalate(dmp) CAS#: Diethyl phthalate(dep) CAS#: Dipropyl phthalate(dprp) CAS#: Diisobutyl phthalate(dibp) CAS#: Dibutyl phthalate(dbp) CAS#: Di-n-Pentyl Phthalate (DPP) CAS#: Diheptyl phthalate(dhp) CAS#: Butylbenzyl phthalate(bbp) CAS#: Dicyclohexyl phthalate(dchp) CAS#: Di-2-ethylhexyl phthalate(dehp) CAS#: Diisooctyl phthalate(diop) CAS#: Di-n-octyl phthalate(dnop) CAS#: Diisononyl phthalate(dinp) CAS#: , Diisodecyl phthalate(didp) CAS#: , Dinonyl phthalate(dnp) CAS#: Diisononyl adipate(dina) CAS#: Tested Sample/Part Description White ink Remark: The sample was dissolved/decomposed totally by acid pre-conditioning method for Lead, Cadmium, Mercury according to below flow chart. -MDL = Method Detection Limit - = Not Detected (<MDL ) -mg/kg = ppm = parts per million
5 ECL01H Page 5 of 7 Test Process 1. Lead (Pb), Cadmium (Cd) 2. Mercury (Hg) 3. Hexavalent Chromium(Cr(VI)) 4. Hexabromocyclododecane (HBCDD)
6 ECL01H Page 6 of 7 5. Phthalates 6. Bromine(Br), Chlorine(Cl), Fluorine(F), Iodine(I) 7. Polybrominated Biphenyl(PBBs), Polybrominated Diphenyl Ethers(PBDEs)
7 ECL01H Page 7 of 7 Photo(s) of the sample(s) *** End of report *** The test report is effective only with both signature and specialized stamp. The result(s) shown in this report refer only to the sample(s) tested. Without written approval of CTI, this report can t be reproduced except in full.
Test Report TAIYO INK(SUZHOU)CO.,LTD. NO.26 TAISHAN ROAD,SUZHOU NEW DISTRICT, SUZHOU CITY,JIANGSU PROVINCE,P.R.CHINA
Page 1 of 9 Applicant Address TAIYO INK(SUZHOU)CO.,LTD. NO.26 TAISHAN ROAD,SUZHOU NEW DISTRICT, SUZHOU CITY,JIANGSU PROVINCE,P.R.CHINA The following sample(s) and sample information was/were submitted
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Applicant Address ECL01H067792001 Page 1 of 9 LITE-ON MICROELECTRONICS (WUXI) CO., LTD. LITE-ON SEMICONDUCTOR CORP. LAND LOT J7 J8WEPZ, NEW DISTRICT, WUXI CITY, JIANGSU, CHINA 9F,NO.233-2 PAO-CHIAO ROAD,
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Report No. SCL03I000410001 Page 1 of 7 Applicant Address JIANGMEN ABQ ELEECTRONIC MATERIAL CO.,LTD NO.136 GAOXINWESTRD JIANGMEN HI-TECH INDUSTRIAL DEVELOPMENTZONE CITY GUANGDONG The following sample(s)
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Report No. ECL01H067809001 Page 1 of 9 Applicant Address LITE-ON MICROELECTRONICS (WUXI) CO., LTD. LITE-ON SEMICONDUCTOR CORP. LAND LOT J7 J8WEPZ, NEW DISTRICT, WUXI CITY, JIANGSU, CHINA 9F,NO.233-2 PAO-CHIAO
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Report No. ECL01H067702001 Page 1 of 9 Applicant SHANGHAI SEEFULL ELECTRONIC CO., LTD LITE-ON SEMICONDUCTOR CORP. Address 6 ZHENYE RD. DONGJING INDUSTRIAL AREA SONGJIANG DISTRICT, SHANGHAI, CHINA 9F,NO.233-2
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Report No. ECL01H067806001 Page 1 of 7 Applicant LITE-ON MICROELECTRONICS (WUXI) CO., LTD. LITE-ON SEMICONDUCTOR CORP. Address LAND LOT J7 J8WEPZ, NEW DISTRICT, WUXI CITY, JIANGSU, CHINA 9F,NO.233-2 PAO-CHIAO
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Report No. Page 1 of 7 Applicant LIGHT COUNTRY (CHANG SHU)CO.,LTD Address NO.88,NING BO ROAD,NEW HI-TECH INDUSTRY,CHANGSHU,JIANGSU,CHINA The following sample(s)and sample information was/were submitted
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No. CE/2012/C1503 Date 2012/12/18 Page 1 of 6 The following sample(s) was/were submitted and identified by/on behalf of the client as Sample Description Buyer/Order No. Other Info. Sample Receiving Date
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Report No. RLSHD000756910001 Page 1 of 6 Applicant Address WUJIANG MIGHTYTEK SEMICONDUCTOR CO.,LTD NO.2100 NORTH OF ZHONGSHAN ROAD,SONGLING TOWN,WUJIANG CITY Report on the submitted sample said to be Sample
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Test Report No. : CE/2007/C7382B Date : 2008/06/18 Page : 1 of 5 The following sample(s) was/were submitted and identified by/on behalf of the client as : Sample Description : Style/Item No. : Manufacturer
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Test Report No. CANEC1103340401 Date: 01 Sep 2011 Page 1 of 8 GEJIU ZILI MINING&SMEL TING CO.,LTD HUOGUDU,JIJIE TOWN,GEJIU CITY,HONGHE ZHOU,YUNNAN PROVINCE CHINA The following sample(s) was/were submitted
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Test Report No. KD/2013/50027A-01 Date 2013/07/01 Page 1 of 6 The following sample(s) was/were submitted and identified by/on behalf of the client as Sample Description Style/Item No. Sample Receiving
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Page 1 of 8 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Sample Receiving Date Testing Period DIE BONDING
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Page 1 of SHINWONTECH 36BL 12LTNamdong-Industrial Area 610-11,Namchon-dong Namdong-gu,Incheon Korea The following sample(s) was/were submitted and identified by/on behalf of the client as:- SGS File No.
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Report No. Page 1 of 11 Applicant Address HER MEI ELECTRONIC CO.,LTD NO.61,FONG TIEN RD.,FONG TIEN INDUSTRY PARK,DAH-PYI SHANE,YUNLIN COUNTY,TAIWAN,R.O.C The following sample(s) and sample information
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No. CE/2012/A3090 Date 2012/10/23 Page 1 of 5 The following sample(s) was/were submitted and identified by/on behalf of the client as Sample Description Buyer/Order No. Other Info. Sample Receiving Date
More informationTest Report No _rev01 Date: 06/DEC/2017 Page 1 of 5
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Page 1 of 7 The following sample(s) was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Sample Receiving Date Testing Period FLUX SR-34SUPER
More informationPage 2 of 12 Test Result(s) PART NAME No.1 YELLOW LUMP Test Item(s) Cadmium (Cd) Lead (Pb) Mercury (Hg) Hexavalent Chromium Cr(VI) Sum of PBBs Monobro
Page 1 of 12 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Sample Receiving Date Testing Period ELEKTRISOLA
More informationPage 2 of 9 Test Result(s) PART NAME No.1 DARK BROWN PASTE Test Item(s) Cadmium (Cd) Lead (Pb) Unit Method With reference to IEC (2013) and pe
Page 1 of 9 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Sample Receiving Date Testing Period TSF-6522
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Test Report No. CTSPN/01143-1/15 Date : 26/05/2015 Page: 1 o 5 CTS Re. CTSPN/15/0221/Toray TORAY PLASTICS (MALAYSIA) SDN BHD 2628, MK. 1, SPT., LORONG PERUSAHAAN 4 PRAI FREE INDUSTRIAL ZONE 13600 PRAI,
More informationPage 2 of 10 Test Result(s) PART NAME No.1 LT.GRAY SHEET Test Item(s) Cadmium (Cd) Lead (Pb) Unit Method With reference to IEC (2013) and perf
Page 1 of 10 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Buyer/Order No. Other Info. Sample Receiving Date Testing Period
More informationTest Report No. : KA/2012/40043 Date : 2012/04/10 Page : 2 of 8 Test Result(s) PART NAME NO.1 : BLACK EPOXY MOLDING COMPOUNDS Test Item (s): MDL Resul
Test Report No. : KA/2012/40043 Date : 2012/04/10 Page : 1 of 8 The following sample(s) was/were submitted and identified by/on behalf of the client as : Sample Description : Style/Item No. : JP Reference
More informationPage 2 of 12 Test Result(s) PART NAME No.1 INTEGRATED CIRCUITS Test Item(s) Cadmium (Cd) Lead (Pb) Mercury (Hg) Hexavalent Chromium Cr(VI) Sum of PBBs
Page 1 of 12 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Buyer/Order No. Other Info. Sample Receiving
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Test Report No. : KA/2012/21431 Date : 2012/02/24 Page : 1 of 12 The following sample(s) was/were submitted and identified by/on behalf of the client as : Sample Description : Style/Item No. : Sample Receiving
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Test Report No. CTSSA/27080(AD)/13 Date : 03/01/2014 Page: 1 o 6 CTS Re. CTSSA/13/3987/Toray TORAY PLASTICS (MALAYSIA) SDN BHD 2628, MK. 1, SPT., LORONG PERUSAHAAN 4, PRAI FREE INDUSTRIAL ZONE, 13600 PRAI,
More informationPage 2 of 11 Test Result(s) PART NAME No.1 COPPER/SILVER COLORED METAL SHEET (INCLUDING THE PLATING LAYER) Cadmium (Cd) Test Item(s) Unit Method With
Page 1 of 11 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Sample Receiving Date Testing Period AL (5052) X HPL X COPPER
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Test Report No. CE/2017/62572 Date 2017/06/19 Page 1 of 7 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Buyer/Order No.
More informationPage 2 of 12 Test Result(s) PART NAME No.1 INTEGRATED CIRCUITS Test Item(s) Cadmium (Cd) Lead (Pb) Mercury (Hg) Hexavalent Chromium Cr(VI) Sum of PBBs
Page 1 of 12 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Buyer/Order No. Other Info. Sample Receiving
More informationPage 2 of 11 Test Result(s) PART NAME No.1 YELLOW/WHITE PAD (EXCLUDING THE RELEASE FILM) Cadmium (Cd) Lead (Pb) Test Item(s) Unit Method With referenc
Page 1 of 11 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Buyer/Order No. Other Info. Sample Receiving Date Testing Period
More informationPage 2 of 12 Test Result(s) PART NAME No.1 INTEGRATED CIRCUITS Cadmium (Cd) Lead (Pb) Mercury (Hg) Test Item(s) Hexavalent Chromium Cr(VI) ( ) Sum of
Page 1 of 12 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Buyer/Order No. Other Info. Sample Receiving
More informationPage 2 of 12 Test Result(s) PART NAME No.1 INTEGRATED CIRCUITS Test Item(s) Cadmium (Cd) Unit Method With reference to IEC (2013) and performe
Page 1 of 12 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Buyer/Order No. Other Info. Sample Receiving
More informationManagement number No. KA/2015/80033 Date 2015/08/10 Page 1 of 6 The following sample(s) was/were submitted and identified by/on behalf
Date of issue August 19, 2015 Management number 00000000152298 TO AMKOR TECHNOLOGY Analysis Report Analysis Compounds RoHS(Cd,Pb,Cr.Hg,PBB,PBDE) 1.Parts number ELP NBD-5232K 2.Results of analysis Please
More informationPage 2 of 12 Test Result(s) PART NAME No.1 INTEGRATED CIRCUITS Cadmium (Cd) Lead (Pb) Test Item(s) Unit Method With reference to IEC (2013) an
Page 1 of 12 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Buyer/Order No. Other Info. Sample Receiving
More informationPage 2 of 12 Test Result(s) PART NAME No.1 INTEGRATED CIRCUITS Test Item(s) Cadmium (Cd) Unit Method With reference to IEC (2013) and performe
Page 1 of 12 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Buyer/Order No. Other Info. Sample Receiving
More informationPage 2 of 12 Test Result(s) PART NAME No.1 DK. BROWN LUMP Cadmium (Cd) Lead (Pb) Mercury (Hg) Antimony (Sb) Beryllium (Be) Test Item(s) Hexavalent Chr
Page 1 of 12 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Sample Receiving Date Testing Period ELEKTRISOLA
More informationChemical Laboratory - Kao., Page 2 of 13 Test Result(s) PART NAME No.1 BLACK EPOXY MOLDING COMPOUND Cadmium (Cd) Test Item(s) Unit Method mg/kg With r
Chemical Laboratory - Kao., Page 1 of 13 The following sample(s) was/were submitted and identified by/on behalf of the applicant as Sample Description Style/Item No. Sample Receiving Date Testing Period
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Test Report No. : CE/2014/32788 Date : 2014/03/27 Page : 1 of 14 The following sample(s) was/were submitted and identified by/on behalf of the applicant as : Sample Submitted By Sample Description Style/Item
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TECHNOVA IMAGING SYSTEMS (P) LTD. C-2 M.I.D.C. TALOJA, DIST. RAIGAD RAIGAD-410208 INDIA CONTACT PERSON : MR. VINAY KADAM THE FOLLOWING SAMPLE(S) WAS/WERE SUBMITTED AND IDENTIFIED BY/ON BEHALF OF THE CUSTOMER
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