Combined AFM and Raman Enables: Comprehensive Data Using Optical, AFM, and Spectroscopic Methods
|
|
- Charles Powers
- 5 years ago
- Views:
Transcription
1 Combined AFM and Raman Enables: Comprehensive Data Using Optical, AFM, and Spectroscopic Methods Dark field: sees cracks, and contamination: - Pick appropriate area for AFM scan AFM: real 3D morphology - Quantify roughness - Analyze grain size - Hole formation DIC: enhanced surface contrast: - distinguish between smooth and rough Raman: - identifies and localizes crystalline phase transition. The monoclinic => tetragonal phase transformation of Y-TZP results in surface roughening and occurs nonuniformly over the surface. Combined and colocalized AFM, RAMAN and DIC microscopy enables to study the process on the sub-micrometer lateral scale. 11/1/2011 Bruker NanoSurfaces Division 18
2 TERS Applications Overview: True Nanoscale Spectroscopy Targeted to Your Application Crystallography and optical properties of nanostructures (e.g., oxides and compound semiconductors) Chemical analysis of composite polymers (e.g., polymer blends) Single molecule dynamics Primary structure investigation (sequencing) in biopolymers In situ interrogation of biological molecules as an entry into more complex biological structures. Illustration reproduced from Chem Phys Letters 472 (2009) /1/2011 Bruker NanoSurfaces Division 19
3 TERS: Tip Enhanced Raman Scattering Enables Raman Spectroscopy Beyond the Diffraction Limit 3 setup possibilites Schematic from: 11/1/2011 Bruker NanoSurfaces Division 20
4 Geometry for Illumination k i kr Schematic diagram of the metal tip and substrate geometry: the tip is modeled as a conical taper terminated by a hemisphere of radius r, held at a distance d from the substrate surface. For discussion of SERS geometries see, e.g. : R. W. Rendell, D. J. Scalapino, Physical Review B 1981, 24, Z. Yang, J. Aizpurua, H. Xu, J. Raman Spectrosc. 2009, 40, A. Downes,D. Salter, A. Elfick, J. Phys. Chem. B 2006, 110, 11/1/2011 Bruker NanoSurfaces Division 21
5 Definitions of TERS Enhancement Contrast I with tip I without tip (a) EF = Contrast A focus A tip Contrast d 2 focus 2 d tip (c) Schmid et al. in Tip Enhancement (2007), Kawata & Shalaev (Eds). Contrast: 40, Enhancement Factor: ~ /1/2011 Bruker NanoSurfaces Division 22
6 Bruker s TERS enabled AFM-Raman: TERS-Ready AFM-Raman Integration Bruker Innova SPM Efficient direct optical coupling Raman sampling arm for side illumination and collection Renishaw invia Raman microscope 11/1/2011 Bruker NanoSurfaces Division 23
7 Bruker IRIS Integration Package: Highest Performance, Most Complete AFM Capabilities Hardware integration enables: Co-localised Raman SPM measurements TERS ready Operation of both instruments individually without any compromise in performance Easy alignment of Raman laser spot onto SPM tip Simple upgrade path from either an invia Raman microscope or Innova SPM Software integration allows: Automated Raman/SPM mapping using IRIS software module incl. simplified approach curve. Full use of Renishaw s WiRE software for Raman data analysis Full use of Nanoscope software for SPM data analysis 11/1/2011 Bruker NanoSurfaces Division 24
8 Optical Views of IRIS-Innova: Easy-to-Use Spectroscopy in Materials & Life Sciences Multiple cameras and trackball controlled objective positioning allow easy and precise alignment of Raman laser excitation source onto SPM tip Optical image of tip illuminated with Raman excitation laser. Taken with Innova optics Optical Image of tip with Raman excitation laser and IR AFM laser (IR filter removed). Taken along optical axis. 11/1/2011 Bruker NanoSurfaces Division 25
9 Malachite Green TERS: Proof of Performance on Innova IRIS Tip in feedback Tip retracted 50 nm Tip retracted 100 nm TERS tips courtesy of Sam Berweger and Markus Raschke, Univ.of Colorado 11/1/2011 Bruker NanoSurfaces Division 26
10 Customer Paper on TERS/SERS/Far-Field Advanced NanoScale Research on Bruker s Bioscope AFMs Collagen is the most abundant protein in the human body C. Gullekson, L. Lucas, K. Hewitt, L. Kreplak.Biophysical Journal 100(7), (2011) First step into understanding more complex biological objects Lateral resolution of TERS data <100nm TERS reveals peaks not identified in far-field Identifies individual secondary structures at the surface of collagen fibrils and proposes a specific orientation of exposed phenylalanine residues. 11/1/2011 Bruker NanoSurfaces Division 27
11 Single molecule sensitivity using side-on illumination and collection Ultimate Performance Malachite Green (AFM) BCB (STM) Neacsu, Dreyer, Behr, Raschke. Phys Rev B 73, (2006) Zhang, Yeo, Schmid, Zenobi. J. Phys. Chem. C, 111, (2007) 11/1/2011 Bruker NanoSurfaces Division 28
12 Conclusions: Integrated Systems Guarantee Optimum Performance Co-Localized Products for Seamless Integration of AFM and Optical Spectroscopy Highest Performance, Most Complete AFM Capabilities Nanoscale Material Mapping Co-located with Spectroscopy For Large or Small Transparent and Opaque Samples Integrated TERS-Enabled Systems for Material Sciences Best TERS-enabled AFM-Raman system integration available Easiest to use AFM for Spectroscopy in NanoStructured Materials Flexibility of analysis with every detail considered Innova Bioscope Catalyst Dimension Icon TERS, PF-QNM 11/1/2011 Bruker NanoSurfaces Division 29
13 apply innovation Renishaw / Bruker Raman AFM package Video camera for viewing sample and laser spot Renishaw AFM interface assembly
14 apply innovation AFM sample viewing objective AFM analytical module Objective for laser illumination and Raman signal capture
15 apply innovation Laser spot focused on sample
Application Note #136 Advances in Combined Atomic Force and Raman Microscopy
TERS approach curve QNM data on PEO-SPP Application Note #136 Advances in Combined Atomic Force and Raman Microscopy Raman laser on solid gold tip Atomic force microscopy and Raman spectroscopy are both
More informationBringing optics into the nanoscale a double-scanner AFM brings advanced optical experiments within reach
Bringing optics into the nanoscale a double-scanner AFM brings advanced optical experiments within reach Beyond the diffraction limit The resolution of optical microscopy is generally limited by the diffraction
More informationUniversità degli Studi di Bari "Aldo Moro"
Università degli Studi di Bari "Aldo Moro" Table of contents 1. Introduction to Atomic Force Microscopy; 2. Introduction to Raman Spectroscopy; 3. The need for a hybrid technique Raman AFM microscopy;
More informationChapter 12. Nanometrology. Oxford University Press All rights reserved.
Chapter 12 Nanometrology Introduction Nanometrology is the science of measurement at the nanoscale level. Figure illustrates where nanoscale stands in relation to a meter and sub divisions of meter. Nanometrology
More informationOptics and Spectroscopy
Introduction to Optics and Spectroscopy beyond the diffraction limit Chi Chen 陳祺 Research Center for Applied Science, Academia Sinica 2015Apr09 1 Light and Optics 2 Light as Wave Application 3 Electromagnetic
More informationShell-isolated nanoparticle-enhanced Raman spectroscopy
Shell-isolated nanoparticle-enhanced Raman spectroscopy Jian Feng Li, Yi Fan Huang, Yong Ding, Zhi Lin Yang, Song Bo Li, Xiao Shun Zhou, Feng Ru Fan, Wei Zhang, Zhi You Zhou, De Yin Wu, Bin Ren, Zhong
More informationSupporting Information
Supporting Information Spatially-resolved imaging on photocarrier generations and band alignments at perovskite/pbi2 hetero-interfaces of perovskite solar cells by light-modulated scanning tunneling microscopy
More informationCorrelative Raman Imaging of Polymeric Materials
APPLICATION NOTE Correlative Raman Imaging of Polymeric Materials WITec GmbH, Lise-Meitner-Str. 6, 89081 Ulm, Germany phone+49 (0) 731 140 700, fax +49 (0) 731 140 70 200 info@witec.de, www.witec.de Characterization
More informationRaman studies at metal interfaces
Chapter 2 Raman studies at metal interfaces Because of the very low Raman cross sections 1 (10 29 to 10 30 cm 2 ) of small, nonresonant 2 molecules, highly sensitive detection devices, strong laser power
More informationScanning Probe Microscopy. Amanda MacMillan, Emmy Gebremichael, & John Shamblin Chem 243: Instrumental Analysis Dr. Robert Corn March 10, 2010
Scanning Probe Microscopy Amanda MacMillan, Emmy Gebremichael, & John Shamblin Chem 243: Instrumental Analysis Dr. Robert Corn March 10, 2010 Scanning Probe Microscopy High-Resolution Surface Analysis
More informationSupporting Information
Supporting Information Highly Sensitive, Reproducible, and Stable SERS Sensors Based on Well-Controlled Silver Nanoparticles Decorated Silicon Nanowire Building Blocks Xue Mei Han, Hui Wang, Xue Mei Ou,
More informationOther SPM Techniques. Scanning Probe Microscopy HT10
Other SPM Techniques Scanning Near-Field Optical Microscopy (SNOM) Scanning Capacitance Microscopy (SCM) Scanning Spreading Resistance Microscopy (SSRM) Multiprobe techniques Electrostatic Force Microscopy,
More informationClark Atlanta University Center for Surface Chemistry and Catalysis Instrument Capabilities
Center for Surface Chemistry and Catalysis Instrument Capabilities For information contact: Dr. Eric Mintz Research Center for Science and Technology Clark Atlanta University Atlanta, Georgia 30314 Phone:
More informationOPTICAL PROPERTIES AND SPECTROSCOPY OF NANOAAATERIALS. Jin Zhong Zhang. World Scientific TECHNISCHE INFORMATIONSBIBLIOTHEK
OPTICAL PROPERTIES AND SPECTROSCOPY OF NANOAAATERIALS Jin Zhong Zhang University of California, Santa Cruz, USA TECHNISCHE INFORMATIONSBIBLIOTHEK Y World Scientific NEW JERSEY. t'on.don SINGAPORE «'BEIJING
More informationTip-Enhanced Raman Spectroscopy: Technique and Recent Advances Prabhat Verma*
pubs.acs.org/cr Tip-Enhanced Raman Spectroscopy: Technique and Recent Advances Prabhat Verma* Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan ABSTRACT: This
More informationSupplementary Figure 1 Experimental setup for crystal growth. Schematic drawing of the experimental setup for C 8 -BTBT crystal growth.
Supplementary Figure 1 Experimental setup for crystal growth. Schematic drawing of the experimental setup for C 8 -BTBT crystal growth. Supplementary Figure 2 AFM study of the C 8 -BTBT crystal growth
More informationCHARACTERIZATION of NANOMATERIALS KHP
CHARACTERIZATION of NANOMATERIALS Overview of the most common nanocharacterization techniques MAIN CHARACTERIZATION TECHNIQUES: 1.Transmission Electron Microscope (TEM) 2. Scanning Electron Microscope
More informationInstrumentation and Operation
Instrumentation and Operation 1 STM Instrumentation COMPONENTS sharp metal tip scanning system and control electronics feedback electronics (keeps tunneling current constant) image processing system data
More informationChapter 10. Nanometrology. Oxford University Press All rights reserved.
Chapter 10 Nanometrology Oxford University Press 2013. All rights reserved. 1 Introduction Nanometrology is the science of measurement at the nanoscale level. Figure illustrates where nanoscale stands
More informationGeneral concept and defining characteristics of AFM. Dina Kudasheva Advisor: Prof. Mary K. Cowman
General concept and defining characteristics of AFM Dina Kudasheva Advisor: Prof. Mary K. Cowman Overview Introduction History of the SPM invention Technical Capabilities Principles of operation Examples
More informationScanning Tunneling Microscopy and its Application
Chunli Bai Scanning Tunneling Microscopy and its Application With 181 Figures SHANGHAI SCIENTIFIC & TECHNICAL PUBLISHERS Jpl Springer Contents 1. Introduction 1 1.1 Advantages of STM Compared with Other
More informationImaging Methods: Scanning Force Microscopy (SFM / AFM)
Imaging Methods: Scanning Force Microscopy (SFM / AFM) The atomic force microscope (AFM) probes the surface of a sample with a sharp tip, a couple of microns long and often less than 100 Å in diameter.
More informationFlexible, Transparent and Highly Sensitive SERS. Substrates with Cross-nanoporous Structures for
Electronic Supplementary Material (ESI) for Nanoscale. This journal is The Royal Society of Chemistry 2018 supplementary information Flexible, Transparent and Highly Sensitive SERS Substrates with Cross-nanoporous
More informationNanostructure. Materials Growth Characterization Fabrication. More see Waser, chapter 2
Nanostructure Materials Growth Characterization Fabrication More see Waser, chapter 2 Materials growth - deposition deposition gas solid Physical Vapor Deposition Chemical Vapor Deposition Physical Vapor
More informationNanoscale confinement of photon and electron
Nanoscale confinement of photon and electron Photons can be confined via: Planar waveguides or microcavities (2 d) Optical fibers (1 d) Micro/nano spheres (0 d) Electrons can be confined via: Quantum well
More informationLabRAM HR Evolution. Research Raman Made Easy!
LabRAM HR Evolution Research Raman Made Easy! Cutting-Edge Applications with the La LabRAM HR Life sciences Deeply involved in Raman spectroscopy for decades, HORIBA Scientific has been providing an extensive
More informationThe Powerful Diversity of the AFM Probe
The Powerful Diversity of the AFM Probe Stefan B. Kaemmer, Bruker Nano Surfaces Division, Santa Barbara, CA 93117 stefan.kaemmer@bruker-nano.com March 21, 2011 Introduction The tip allows us to measure
More informationGold nanothorns macroporous silicon hybrid structure: a simple and ultrasensitive platform for SERS
Supporting Information Gold nanothorns macroporous silicon hybrid structure: a simple and ultrasensitive platform for SERS Kamran Khajehpour,* a Tim Williams, b,c Laure Bourgeois b,d and Sam Adeloju a
More informationImproving Micro-Raman/AFM Systems Imaging Using Negative-Stiffness Vibration Isolation
Photonics.com - February 2011 Improving Micro-Raman/AFM Systems Imaging Using Negative-Stiffness Vibration Isolation Negative-stiffness vibration isolators can easily support the heavy weight of a combined
More informationSelected Characterization Techniques
Selected Characterization Techniques Tip-enhanced Raman spectroscopy Scanning helium ion microscope Magnetic resonance sub-nanometer imaging Terence Kuzma Outline Tip-enhanced Raman spectroscopy (Lecture
More information新技術説明会 ラマン分光 必見! AFM- ラマンによるナノイメージの世界 株式会社堀場製作所
新技術説明会 ラマン分光 必見! AFM- ラマンによるナノイメージの世界 株式会社堀場製作所 2013 HORIBA Scientific. All rights reserved. Ultra fast simultaneous AFM and hyper-spectral imaging: chemical and physical investigation of nano-materials
More informationThe effects of probe boundary conditions and propagation on nano- Raman spectroscopy
The effects of probe boundary conditions and propagation on nano- Raman spectroscopy H. D. Hallen,* E. J. Ayars** and C. L. Jahncke*** * Physics Department, North Carolina State University, Raleigh, NC
More informationModule 26: Atomic Force Microscopy. Lecture 40: Atomic Force Microscopy 3: Additional Modes of AFM
Module 26: Atomic Force Microscopy Lecture 40: Atomic Force Microscopy 3: Additional Modes of AFM 1 The AFM apart from generating the information about the topography of the sample features can be used
More informationIntroducing the Morphologi G3 ID The future of particle characterization
Introducing the Morphologi G3 ID The future of particle characterization Dr Anne Virden, Product technical specialist diffraction and analytical imaging What is the Morphologi G3-ID? Advanced R&D particle
More informationDirectional Enhanced Probe for Side-Illumination Tip Enhanced
Directional Enhanced Probe for Side-Illumination Tip Enhanced Spectroscopy Hongming Shen, 1 Guowei Lu, 1,2, * Zhengmin Cao, 1 Yingbo He, 1 Yuqing Cheng, 1 Jiafang Li, 3 Zhi-Yuan Li, 3 and Qihuang Gong,
More informationNanoscale work function measurements by Scanning Tunneling Spectroscopy
Related Topics Tunneling effect, Defects, Scanning Tunneling Microscopy (STM), (STS), Local Density of States (LDOS), Work function, Surface activation, Catalysis Principle Scanning tunneling microscopy
More informationPolarization control with plasmonic antenna-tips: A universal approach for optical nano-crystallography and vector-field imaging
Supporting Information: Polarization control with plasmonic antenna-tips: A universal approach for optical nano-crystallography and vector-field imaging Kyoung-Duck Park 1,2 and Markus B. Raschke *1,2
More informationCase Study of Electronic Materials Packaging with Poor Metal Adhesion and the Process for Performing Root Cause Failure Analysis
Case Study of Electronic Materials Packaging with Poor Metal Adhesion and the Process for Performing Root Cause Failure Analysis Dr. E. A. Leone BACKGRUND ne trend in the electronic packaging industry
More informationSOLID STATE PHYSICS PHY F341. Dr. Manjuladevi.V Associate Professor Department of Physics BITS Pilani
SOLID STATE PHYSICS PHY F341 Dr. Manjuladevi.V Associate Professor Department of Physics BITS Pilani 333031 manjula@bits-pilani.ac.in Characterization techniques SEM AFM STM BAM Outline What can we use
More informationSupporting information
Supporting information Polymer-Single-Crystal@Nanoparticle Nanosandwich for Surface Enhanced Raman Spectroscopy Bin Dong, Wenda Wang, David L. Miller, Christopher Y. Li* Department of Material Science
More informationSupporting Information s for
Supporting Information s for # Self-assembling of DNA-templated Au Nanoparticles into Nanowires and their enhanced SERS and Catalytic Applications Subrata Kundu* and M. Jayachandran Electrochemical Materials
More informationNanoscale Chemical Imaging with Photo-induced Force Microscopy
OG2 BCP39nm_0062 PiFM (LIA1R)Fwd 500 279.1 µv 375 250 nm 500 375 250 125 0 nm 125 219.0 µv Nanoscale Chemical Imaging with Photo-induced Force Microscopy 0 Thomas R. Albrecht, Derek Nowak, Will Morrison,
More informationWire%4%Training%Modules%Compilation%! The!following!modules!are!in!this!compilation:!! TM001!! Introduction!to!Raman!Spectroscopy! TM002!!
Wire%4%Training%Modules%Compilation% Thefollowingmodulesareinthiscompilation: TM001 IntroductiontoRamanSpectroscopy TM002 IntroductiontoWiReandSystemstart?up TM003 Sampleviewingandconfigurationchange TM004
More informationElectromagnetic field enhancement in TERS configurations
Research Article Received: 3 February 2009 Accepted: 8 July 2009 Published online in Wiley Interscience: (www.interscience.wiley.com) DOI 10.1002/jrs.2429 Electromagnetic field enhancement in TERS configurations
More informationFundamentals of nanoscience
Fundamentals of nanoscience Spectroscopy of nano-objects Mika Pettersson 1. Non-spatially resolved spectroscopy Traditionally, in spectroscopy, one is interested in obtaining information on the energy
More informationImproving nano-scale imaging of of intergrated micro-raman/afm systems using negativestiffness
See vibration isolation technology @ www.minusk.com?pdf) Electronic Products and Technology - May 2014 Improving nano-scale imaging of of intergrated micro-raman/afm systems using negativestiffness vibration
More informationnano-ta: Nano Thermal Analysis
nano-ta: Nano Thermal Analysis Application Note #1 Failure Analysis - Identification of Particles in a Polymer Film Author: David Grandy Ph.D. Introduction Nano-TA is a local thermal analysis technique
More informationRemote Access to Hi-tech Equipment
Remote Access to Hi-tech Equipment From Your Classroom to Ours Sebastien Maeder Outline What is Remote Access? The Method vs. the Goal The role within NACK Why should we try? Confines of Classroom Characterization
More informationNanostructure Fabrication Using Selective Growth on Nanosize Patterns Drawn by a Scanning Probe Microscope
Nanostructure Fabrication Using Selective Growth on Nanosize Patterns Drawn by a Scanning Probe Microscope Kentaro Sasaki, Keiji Ueno and Atsushi Koma Department of Chemistry, The University of Tokyo,
More informationThe most versatile AFM platform for your nanoscale microscopy needs
The most versatile AFM platform for your nanoscale microscopy needs Atomic Force Microscopy (AFM) for nanometer resolution imaging with electrical, magnetic, thermal, and mechanical property measurement
More informationHighly Surface-roughened Flower-like Silver Nanoparticles for Extremely Sensitive Substrates of Surface-enhanced Raman Scattering
Highly Surface-roughened Flower-like Silver Nanoparticles for Extremely Sensitive Substrates of Surface-enhanced Raman Scattering By Hongyan Liang, Zhipeng Li, Wenzhong Wang, Youshi Wu, and Hongxing Xu*
More informationIntroduction to Scanning Probe Microscopy Zhe Fei
Introduction to Scanning Probe Microscopy Zhe Fei Phys 590B, Apr. 2019 1 Outline Part 1 SPM Overview Part 2 Scanning tunneling microscopy Part 3 Atomic force microscopy Part 4 Electric & Magnetic force
More informationSupporting information
Electronic Supplementary Material (ESI) for Nanoscale. This journal is The Royal Society of Chemistry 2014 Supporting information Self-assembled nanopatch with peptide-organic multilayers and mechanical
More informationTip-Enhanced Raman Imaging and Nanospectroscopy: Sensitivity, Symmetry, and Selection Rules
Nanobiotechnol (2007) 3:172 196 DOI 10.1007/s12030-008-9015-z Tip-Enhanced Raman Imaging and Nanospectroscopy: Sensitivity, Symmetry, and Selection Rules Catalin C. Neacsu Samuel Berweger Markus B. Raschke
More informationSurface Studies by Scanning Tunneling Microscopy
Surface Studies by Scanning Tunneling Microscopy G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel IBM Zurich Research Laboratory, 8803 Ruschlikon-ZH, Switzerland (Received by Phys. Rev. Lett. on 30th April,
More informationCONFOCHECK. Innovation with Integrity. Infrared Protein Analysis FT-IR
CONFOCHECK Infrared Protein Analysis Innovation with Integrity FT-IR CONFOCHECK: FT-IR System for Protein Analytics FT-IR Protein Analysis Infrared spectroscopy measures molecular vibrations due to the
More informationEmpowering today s nanoscale research with Peak Force Tapping
Empowering today s nanoscale research with Peak Force Tapping Bede Pittenger, Andrea Slade and Chunzeng Li Bruker NanoSurfaces, Santa Barbara, CA, USA A brief review of AFM imaging technology Mapping topography
More informationHYPER-RAYLEIGH SCATTERING AND SURFACE-ENHANCED RAMAN SCATTERING STUDIES OF PLATINUM NANOPARTICLE SUSPENSIONS
www.arpapress.com/volumes/vol19issue1/ijrras_19_1_06.pdf HYPER-RAYLEIGH SCATTERING AND SURFACE-ENHANCED RAMAN SCATTERING STUDIES OF PLATINUM NANOPARTICLE SUSPENSIONS M. Eslamifar Physics Department, BehbahanKhatamAl-Anbia
More informationNanomaterials and their Optical Applications
Nanomaterials and their Optical Applications Winter Semester 2013 Lecture 02 rachel.grange@uni-jena.de http://www.iap.uni-jena.de/multiphoton Lecture 2: outline 2 Introduction to Nanophotonics Theoretical
More informationKavli Workshop for Journalists. June 13th, CNF Cleanroom Activities
Kavli Workshop for Journalists June 13th, 2007 CNF Cleanroom Activities Seeing nm-sized Objects with an SEM Lab experience: Scanning Electron Microscopy Equipment: Zeiss Supra 55VP Scanning electron microscopes
More informationShedding New Light on Materials Science with Raman Imaging
Shedding New Light on Materials Science with Raman Imaging Robert Heintz, Ph.D. Senior Applications Specialist 1 The world leader in serving science Raman Imaging Provides More Information Microscope problems
More informationContents. What is AFM? History Basic principles and devices Operating modes Application areas Advantages and disadvantages
Contents What is AFM? History Basic principles and devices Operating modes Application areas Advantages and disadvantages Figure1: 2004 Seth Copen Goldstein What is AFM? A type of Scanning Probe Microscopy
More informationLow Voltage Field Emission SEM (LV FE-SEM): A Promising Imaging Approach for Graphene Samples
Low Voltage Field Emission SEM (LV FE-SEM): A Promising Imaging Approach for Graphene Samples Jining Xie Agilent Technologies May 23 rd, 2012 www.agilent.com/find/nano Outline 1. Introduction 2. Agilent
More informationMercury(II) detection by SERS based on a single gold microshell
Mercury(II) detection by SERS based on a single gold microshell D. Han, S. Y. Lim, B. J. Kim, L. Piao and T. D. Chung* Department of Chemistry, Seoul National University, Seoul, Korea. 2010, 46, 5587-558
More informationOptical imaging of metallic and semiconductor nanostructures at sub wavelength regime
Optical imaging of metallic and semiconductor nanostructures at sub wavelength regime A. K. Sivadasan 1, Kishore K. Madapu 1 and Prajit Dhara 2 1 Nanomaterials Characterization and Sensors Section, Surface
More informationBasic Laboratory. Materials Science and Engineering. Atomic Force Microscopy (AFM)
Basic Laboratory Materials Science and Engineering Atomic Force Microscopy (AFM) M108 Stand: 20.10.2015 Aim: Presentation of an application of the AFM for studying surface morphology. Inhalt 1.Introduction...
More informationNanoscale IR spectroscopy of organic contaminants
The nanoscale spectroscopy company The world leader in nanoscale IR spectroscopy Nanoscale IR spectroscopy of organic contaminants Application note nanoir uniquely and unambiguously identifies organic
More informationAgilent Technologies. Scanning Microwave Microscopy (SMM)
Agilent Technologies Scanning Microwave Microscopy (SMM) Expanding Impedance Measurements to the Nanoscale: Coupling the Power of Scanning Probe Microscopy with the PNA Presented by: Craig Wall PhD Product
More informationHigh Quality Thin Graphene Films from Fast. Research Center for Applied Sciences, Academia Sinica, Taipei, 11529, Taiwan
Supporting Materials High Quality Thin Graphene Films from Fast Electrochemical Exfoliation Ching-Yuan Su, Ang-Yu Lu #, Yanping Xu, Fu-Rong Chen #, Andrei N. Khlobystov $ and Lain-Jong Li * Research Center
More informationPorphyrin and Fullerene Covalently Functionalized. Graphene Hybrid Materials with Large Nonlinear. Optical Properties
Supporting Information for Porphyrin and Fullerene Covalently Functionalized Graphene Hybrid Materials with Large Nonlinear Optical Properties Zhi-Bo Liu, Yan-Fei Xu, Xiao-Yan Zhang, Xiao-Liang Zhang,
More informationLecture 4 Scanning Probe Microscopy (SPM)
Lecture 4 Scanning Probe Microscopy (SPM) General components of SPM; Tip --- the probe; Cantilever --- the indicator of the tip; Tip-sample interaction --- the feedback system; Scanner --- piezoelectric
More informationLocal Anodic Oxidation of GaAs: A Nanometer-Scale Spectroscopic Study with PEEM
Local Anodic Oxidation of GaAs: A Nanometer-Scale Spectroscopic Study with PEEM S. Heun, G. Mori, M. Lazzarino, D. Ercolani, G. Biasiol, and L. Sorba Laboratorio TASC-INFM, 34012 Basovizza, Trieste A.
More informationPositioning, Structuring and Controlling with Nanoprecision
Positioning, Structuring and Controlling with Nanoprecision Regine Hedderich 1,2, Tobias Heiler 2,3, Roland Gröger 2,3, Thomas Schimmel 2,3 and Stefan Walheim 2,3 1 Network NanoMat 2 Institute of Nanotechnology,
More informationSupplementary Figure 1: Micromechanical cleavage of graphene on oxygen plasma treated Si/SiO2. Supplementary Figure 2: Comparison of hbn yield.
1 2 3 4 Supplementary Figure 1: Micromechanical cleavage of graphene on oxygen plasma treated Si/SiO 2. Optical microscopy images of three examples of large single layer graphene flakes cleaved on a single
More informationSupporting Information for. 1 Department of Applied and Engineering Physics, Cornell University, Ithaca, New York, 14853, 2
Supporting Information for High-Throughput Graphene Imaging on Arbitrary Substrates with Widefield Raman Spectroscopy Robin W. Havener 1,, Sang-Yong Ju,2,3,, Lola Brown 2, Zenghui Wang 2, Michal Wojcik
More informationVisualizing the bi-directional electron transfer in a Schottky junction consisted of single CdS nanoparticles and a planar gold film
Electronic Supplementary Material (ESI) for Chemical Science. This journal is The Royal Society of Chemistry 2017 Electronic Supplementary Information Visualizing the bi-directional electron transfer in
More informationNanosphere Lithography
Nanosphere Lithography Derec Ciafre 1, Lingyun Miao 2, and Keita Oka 1 1 Institute of Optics / 2 ECE Dept. University of Rochester Abstract Nanosphere Lithography is quickly emerging as an efficient, low
More informationSupplementary Information
Electronic Supplementary Material (ESI) for Physical Chemistry Chemical Physics. This journal is the Owner Societies 2015 Supplementary Information Vertical Heterostructures of MoS2 and Graphene Nanoribbons
More informationSurface-Enhanced Raman Spectroscopy
GENERAL ARTICLE Surface-Enhanced Raman Spectroscopy Recent Advancement of Raman Spectroscopy Ujjal Kumar Sur Ujjal Kumar Sur works in the Netaji Nagar Day College, Kolkata, West Bengal. He is also a visiting
More informationGratings in Electrooptic Polymer Devices
Gratings in Electrooptic Polymer Devices Venkata N.P.Sivashankar 1, Edward M. McKenna 2 and Alan R.Mickelson 3 Department of Electrical and Computer Engineering, University of Colorado at Boulder, Boulder,
More informationA NEW APPROACH TOWARDS PROPERTY NANOMEASUREMENTS USING IN-SITU TEM
A NEW APPROACH TOWARDS PROPERTY NANOMEASUREMENTS USING IN-SITU TEM Z.L. WANG*, P. PONCHARAL**, W.A. DE HEER** and R.P. GAO* * School of Materials Science and Engineering, ** School of Physics, Georgia
More informationScanning Probe Microscopy: Atomic Force Microscopy And Scanning Tunneling Microscopy (NanoScience And Technology) [Kindle Edition] By Bert Voigtl
Scanning Probe Microscopy: Atomic Force Microscopy And Scanning Tunneling Microscopy (NanoScience And Technology) [Kindle Edition] By Bert Voigtl READ ONLINE If searched for a book Scanning Probe Microscopy:
More informationScanning Probe Microscopy
1 Scanning Probe Microscopy Dr. Benjamin Dwir Laboratory of Physics of Nanostructures (LPN) Benjamin.dwir@epfl.ch PH.D3.344 Outline: Introduction: What is SPM, history STM AFM Image treatment Advanced
More informationCore Level Spectroscopies
Core Level Spectroscopies Spectroscopies involving core levels are element-sensitive, and that makes them very useful for understanding chemical bonding, as well as for the study of complex materials.
More informationPositioning, Structuring and Controlling with Nanoprecision
Positioning, Structuring and Controlling with Nanoprecision Regine Hedderich 1,2, Tobias Heiler 2,3, Roland Gröger 2,3, Thomas Schimmel 2,3, and Stefan Walheim 2,3 1 Network NanoMat 2 Institute of Nanotechnology,
More informationPreamble: Emphasis: Material = Device? MTSE 719 PHYSICAL PRINCIPLES OF CHARACTERIZATION OF SOLIDS
MTSE 719 PHYSICAL PRINCIPLES OF CHARACTERIZATION OF SOLIDS MTSE 719 - PHYSCL PRIN CHARACTIZTN SOLIDS Section # Call # Days / Times 001 96175 -View Book Info - F:100PM - 355PM - TIER114 Preamble: Core course
More informationSupplementary Figure 1 Detailed illustration on the fabrication process of templatestripped
Supplementary Figure 1 Detailed illustration on the fabrication process of templatestripped gold substrate. (a) Spin coating of hydrogen silsesquioxane (HSQ) resist onto the silicon substrate with a thickness
More informationSupplementary Note 1: Dark field measurements and Scattering properties of NPoM geometries
Supplementary Note 1: Dark field measurements and Scattering properties of NPoM geometries Supplementary Figure 1: Dark field scattering properties of individual nanoparticle on mirror geometries separated
More informationINDIAN INSTITUTE OF TECHNOLOGY ROORKEE NPTEL NPTEL ONLINE CERTIFICATION COURSE. Biomedical Nanotechnology. Lec-05 Characterisation of Nanoparticles
INDIAN INSTITUTE OF TECHNOLOGY ROORKEE NPTEL NPTEL ONLINE CERTIFICATION COURSE Biomedical Nanotechnology Lec-05 Characterisation of Nanoparticles Dr. P. Gopinath Department of Biotechnology Indian Institute
More informationResonant-plasmon field enhancement from asymmetrically illuminated conical metallic-probe tips
Resonant-plasmon field enhancement from asymmetrically illuminated conical metallic-probe tips Ryan M. Roth, Nicolae C. Panoiu, Matthew M. Adams, and Richard M. Osgood, Jr. Department of Applied Physics
More informationCharacterization of Materials with a Combined AFM/Raman Microscope
Application Note 089 short Characterization of Materials with a Combined AFM/Raman Microscope Marko Surtchev 1, Sergei Magonov 1 and Mark Wall 2 1 NT-MDT America, Tempe, AZ U.S.A. 2 Thermo Fisher Scientific,
More informationTechniken der Oberflächenphysik (Techniques of Surface Physics)
Techniken der Oberflächenphysik (Techniques of Surface Physics) Prof. Yong Lei & Dr. Yang Xu Fachgebiet 3D-Nanostrukturierung, Institut für Physik Contact: yong.lei@tu-ilmenau.de yang.xu@tu-ilmenau.de
More informationSupporting Information
Supporting Information Analysis Method for Quantifying the Morphology of Nanotube Networks Dusan Vobornik*, Shan Zou and Gregory P. Lopinski Measurement Science and Standards, National Research Council
More informationNanoscale chemical analysis by tip-enhanced Raman spectroscopy
18 February 2000 Ž. Chemical Physics Letters 318 2000 www.elsevier.nlrlocatercplett Nanoscale chemical analysis by tip-enhanced Raman spectroscopy Raoul M. Stockle, Yung Doug Suh, Volker Deckert 1, Renato
More informationPS 712 Advanced Polymer Analysis
PS 712 Advanced Polymer Analysis Course outline Prof. Peter Mallon (Course Convener) 1 Aim of this course: Polymer Science 712 Advanced Polymer Analysis 2012 Prof. Peter Mallon (Course Convener) Office:
More informationRaman spectroscopy study of rotated double-layer graphene: misorientation angle dependence of electronic structure
Supplementary Material for Raman spectroscopy study of rotated double-layer graphene: misorientation angle dependence of electronic structure Kwanpyo Kim 1,2,3, Sinisa Coh 1,3, Liang Z. Tan 1,3, William
More informationScanning Probe Microscopy (SPM)
http://ww2.sljus.lu.se/staff/rainer/spm.htm Scanning Probe Microscopy (FYST42 / FAFN30) Scanning Probe Microscopy (SPM) overview & general principles March 23 th, 2018 Jan Knudsen, room K522, jan.knudsen@sljus.lu.se
More informationScattering-type near-field microscopy for nanoscale optical imaging
Scattering-type near-field microscopy for nanoscale optical imaging Rainer Hillenbrand Nano-Photonics Group Max-Planck-Institut für Biochemie 82152 Martinsried, Germany Infrared light enables label-free
More informationCurrently, worldwide major semiconductor alloy epitaxial growth is divided into two material groups.
ICQNM 2014 Currently, worldwide major semiconductor alloy epitaxial growth is divided into two material groups. Cubic: Diamond structures: group IV semiconductors (Si, Ge, C), Cubic zinc-blende structures:
More informationAP5301/ Name the major parts of an optical microscope and state their functions.
Review Problems on Optical Microscopy AP5301/8301-2015 1. Name the major parts of an optical microscope and state their functions. 2. Compare the focal lengths of two glass converging lenses, one with
More information