Chemical Reactions Induced by Ionizing and Electron-beam Irradiation in Freon/Water (Ice) Films
|
|
- Mercy McDonald
- 6 years ago
- Views:
Transcription
1 Chemical Reactions Induced by Ionizing and Electron-beam Irradiation in Freon/Water (Ice) Films Johns Hopkins University (founded in 1876) Dr. C.C. Perry Prof. D.H. Fairborther School of Arts & Sciences Chemistry Department Rutgers University (founded in 1766) Dr. N.S. Faradzhev Prof. T.E. Madey Lab for Surface Modification Dpt of Physics and Astronomy
2 Chemical Reactions Induced by Ionizing and Electron-beam Irradiation in Freon/Water (Ice) Films 1. Introduction. Experimental setup utline 3. Results: - introductory characterization of the film - irradiation induced reaction; reaction kinetics (FTIR results) - volatile products (ESD and TPD studies) - chemical states as seen from XPS 4. Summary Pre-History Enhancement of F - and - yields in electron-induced dissociation of coadsorbed with PLAR molecules Possible explanation: - self-trapped electrons: low-e secondary electrons are trapped in clusters of molecules (like e - (H ) n ) with permanent dipole moments: e - + nh e s - (H ) n - trapped electrons tunneling to the molecule and form a vibrationally exicted intermediate state (like *- ): e s - + *- - dissociation of intermediate state molecule: *- CF + F - *- + - Coverage dependence intermolecular de-exitation effect decreases the dissociation probability: *- - increase of concentration leads to decrease of enhancement
3 Experimental setup gas flow IR chamber At RT: Torr Cold sample: Torr QMS flood gun shutter XPS chamber Torr x-ray source analyzer Side View freon LN air f low m anipulator Turbo Turbo, TSP, ion IR source nd manipulator analyzer Top View water detector ion gun manifold for gas admixture ~ Torr IR film analysis of chemical compounds MS analysis of volatile products XPS analysis of chemical states
4 Initial characterization of thick freon/water film: gas-phase spectra neat freon ~10-6 Torr gas phase C CF CF F C C CF CF H H freon/water + ~10-6 Torr background x5 ~5x10-8 Torr amu gas-phase spectra: - show REGULAR set of FRAGMENTS which correspond to molecular (for both neat freon and freon/water mixture films) and H (for freon/water mixture only) - D NT CHANGE for a long time (for instance, after night in manifold at RT) background spectra (shown one of the worst): trouble a lot of species like C, F, C, 78 amu, etc There is not any chemical interaction between freon and water in gas phase at RT
5 Initial characterization: IR spectra H 1099 cm -1 s-str 98 cm -1 C a-str cm -1 a-str 881 cm -1 FR Absorbance (R-R b ) cm -1 -H str freon/water H cm -1 bending T~90-95K neat freon Wavenumber, cm -1 NIST gas phase IR spectrum for Assignments: - are based on NIST gas phase spectra and earlier data obtained by D.H.Fairbrother s group (for water) and by other authors (for freon) - for H observed two wide bands; for two pairs of peaks or two doublets - spectra do not change for at least 1 hour There is not any chemical interaction between freon and water in condensed phase (on the surface) at LN temperature
6 Adsorption kinetics for freon on Au: derived from IR spectra Area of IR band (absorbance) 1144 & 1099 cm -1 bands of substrate at T~90-95K Dose, L It took a long time (30-60 min) to depose from gas phase at ~ Torr Straight line constant sticking coefficient
7 Electron-induced transformation of freon/water (ice) film: IR results Absorbance (R-R b ) shape changed -> H cm -1 -H str H C 345 cm -1 C str exposed +30 ev electrons 3x10 16 e/cm shape changed ->H 3 + initial cm -1 bending H Wavenumber, cm cm -1 υ, where υ is s-str 1936 cm -1 C str 1890 cm -1? C str of CF 143 cm -1 a-str 797 cm -1 υ 6 mode 881 cm -1 FR 98 cm -1 C a-str 1144 cm -1 a-str 1099 cm -1 s-str E-beam exposure leads to formation of new products in the film - Major products are C, and H 3 + ion - Very weak feature for phosgene (C ) at 1798 cm -1 - Decrease of molecular in the film 30 ev electrons + film of several hundred thickness -> may exist an erosion of the film Transmittance 1974 Chem. Phys. Lett., J.N.Pitts et al. Major product from reaction of ( 1 D) *) atoms with is *) ( 1 D) electronically excited oxygen atom Electrons induce chemical reactions in freon/water (ice) film which result in formation of, C and H 3 +
8 Transformation of freon/water (ice) film during X-ray irradiation: IR results 90 min of X-ray exposure 300W,15 kev Absorbance (R-R b ) initial Differencial spectrum: before and after irradiation C 345 cm -1 C str 139? HFC some times visible Wavenumber, cm -1 after 90 min of X-ray exposure 1936 cm -1 C str 1905 cm -1 s-str 143 cm -1 a-str Wavenumber, cm -1 During irradiation the same products are formed: C, and H 3 + ion Secondary electrons might be responsible for chemical reaction observed X-ray exposure also leads to formation of, C and H 3 + in the freon/water film
9 Reaction kinetics during electron bombardment in Water (1:5) C 4 in Water (1:4) 30 ev ~1x10 17 e/cm ~ e/cm 00 ev Area under IR band C /10 /3 C 4 C C Electron exposure, x10 14 e/cm Decomposition kinetics of freon at different energies Amount in the film 1 freon/water 30 ev neat freon 30 ev freon/water 40 ev freon/water 300 ev Reaction rate for is at least one order higher than for C 4 Decomposition rate of in H under electrons does not depend considerably on electron energy secondary electrons and low energy inelastically backscattered electrons might play important role in reactions observed Exposure, x10 14 e/cm Decomposition rates of neat freon and in H are very similar in water decomposes and reacts under electron bombardment much faster than C 4 / H
10 Electron stimulated desorption from freon/water film H C C H 30 ev 5x10 14 e/cm Too noisy curves when use low electron flux ESD yield (rough data) 1x10 16 e/cm 5x10 16 e/cm Major volatile products are: H,, C, H, C, and 1.3x10 17 e/cm amu ~1x10 17 e/cm 30 ev ESD yields (curves scaled) H C Decrease of and water signal accompanied by increase of H and H 1000 Exposure, x10 14 e/cm Electron irradiation of / H film leads to desorption of C, H and as well as parent molecules: freon and water
11 Thermal desorption from exposed freon/water film H H C CF C HF (some times) H gas phase C C CF ESD ~10 17 e/cm CF After exposure to ~ 3x10 17 e/cm : - (no by IR, but still is in the film by TPD though considerably less) - H - H - might be H (intensity HCFCL fragment less than intensity of CF fragment probably, product of thermal reaction No evidence of desorption of in molecular form (after irradiation) TPD: T ~15K after exposure to 3x10 17 e/cm H 51 amu? H 67, 69 amu? HCF Max desorption rate for freon: - neat ~ 110K - in water ~ 160K amu Yield 100 ~160K H 10 H 1 Temperature Perhaps, thermo-reactivity of products of electron induced chemical reaction in freon/water film may lead to formation H during heating In water maximum desorption rate for freon shifts to higher temperatures
12 Mg Kα 15 kv, 300W KLL Au 4s F 1s Electron induced transformations from the point of view of XPS F KLL Au 4p 3/ 1s Au C 1s s p B.E., ev Au 4f Au 5p substrate 9E e +4E x 5E e +3E x 3E e +E x E e +E x initial - instantly after 10 min under X-ray irradiation ( initial ) C(1s), (p) and F(1s) spectral envelopes show at least chemical stages - irradiation (electron and/or x-ray) leads to growth of a new peaks centered at lower binding energies: C(1s) broadens towards lower BE production of largely dehalogenated carbonaceous species (p) same behavior production of - F(1s) growth of new peak at lower BE production of F - appearance of Au peak during e-beam irradiation evidence of desorption/erosion C(1s) (p) F(1s) -6 ev -3.5 ev -.9 ev C ev -.5 ev 9E e +4E x 9E e +4E x 9E e +4E x 5E e +3E x 5E e +3E x 3E e +E x 5E e +3E x C1s 3E e +E x p E e +E x F 1s 3E e +E x E e +E x E e +E x initial initial initial B.E., ev B.E., ev B.E., ev Both x-ray and electron irradiations results in rapid formation of negative ions: F -, - E-beam exposure leads to fast desorption of the film whereas x-ray does not (as seen from separate experiment)
13 Most reliable results Interaction of low energy electrons with / H (ice) film results in rapid chemical reaction. There is not any chemical interaction between parent molecules neither in gas phase at RT nor in condensed phase (on the surface). Electron irradiation induces: - decomposition of freon molecules and production of, C, protonated ions H 3 + in the film. - formation in the film dehalogenated carbonaceous species as well as F - and - - electron stimulated desorption of parent molecules (freon and water) and C, H and Decomposition of under electron bombardment: - in ice film decomposes and reacts much faster than C 4 in H - decomposition rates of neat freon and in H are very similar - decomposition rate of in H does not depend considerably on electron energy secondary electrons might play an important role in reactions observed
Surface Chemistry and Reaction Dynamics of Electron Beam Induced Deposition Processes
Surface Chemistry and Reaction Dynamics of Electron Beam Induced Deposition Processes e -? 2 nd FEBIP Workshop Thun, Switzerland 2008 Howard Fairbrother Johns Hopkins University Baltimore, MD, USA Outline
More informationPCCP PAPER. Electron induced reactions of surface adsorbed tungsten hexacarbonyl (W(CO) 6 ) Introduction
PAPER Cite this: Phys. Chem. Chem. Phys., 2013, 15, 4002 Electron induced reactions of surface adsorbed tungsten hexacarbonyl (W(CO) 6 ) Samantha G. Rosenberg, Michael Barclay and D. Howard Fairbrother*
More informationSecondary Ion Mass Spectrometry (SIMS)
CHEM53200: Lecture 10 Secondary Ion Mass Spectrometry (SIMS) Major reference: Surface Analysis Edited by J. C. Vickerman (1997). 1 Primary particles may be: Secondary particles can be e s, neutral species
More informationAcidic Water Monolayer on Ruthenium(0001)
Acidic Water Monolayer on Ruthenium(0001) Youngsoon Kim, Eui-seong Moon, Sunghwan Shin, and Heon Kang Department of Chemistry, Seoul National University, 1 Gwanak-ro, Seoul 151-747, Republic of Korea.
More information5.8 Auger Electron Spectroscopy (AES)
5.8 Auger Electron Spectroscopy (AES) 5.8.1 The Auger Process X-ray and high energy electron bombardment of atom can create core hole Core hole will eventually decay via either (i) photon emission (x-ray
More informationCharacterization of Secondary Emission Materials for Micro-Channel Plates. S. Jokela, I. Veryovkin, A. Zinovev
Characterization of Secondary Emission Materials for Micro-Channel Plates S. Jokela, I. Veryovkin, A. Zinovev Secondary Electron Yield Testing Technique We have incorporated XPS, UPS, Ar-ion sputtering,
More informationLaser Dissociation of Protonated PAHs
100 Chapter 5 Laser Dissociation of Protonated PAHs 5.1 Experiments The photodissociation experiments were performed with protonated PAHs using different laser sources. The calculations from Chapter 3
More informationUnderstanding electron energy loss mechanisms in EUV resists using EELS and first-principles calculations
Understanding electron energy loss mechanisms in EUV resists using EELS and first-principles calculations Robert Bartynski Sylvie Rangan Department of Physics & Astronomy and Laboratory for Surface Modification
More informationReduced preferential sputtering of TiO 2 (and Ta 2 O 5 ) thin films through argon cluster ion bombardment.
NATIOMEM Reduced preferential sputtering of TiO 2 (and Ta 2 O 5 ) thin films through argon cluster ion bombardment. R. Grilli *, P. Mack, M.A. Baker * * University of Surrey, UK ThermoFisher Scientific
More informationResist-outgas testing and EUV optics contamination at NIST
1 2012 International Workshop on EUVL, Maui, HI Resist-outgas testing and EUV optics contamination at NIST Shannon Hill, Nadir Faradzhev, Charles Tarrio, Steve Grantham, Lee Richter and Tom Lucatorto National
More informationSecondary Ion Mass Spectrometry (SIMS) Thomas Sky
1 Secondary Ion Mass Spectrometry (SIMS) Thomas Sky Depth (µm) 2 Characterization of solar cells 0,0 1E16 1E17 1E18 1E19 1E20 0,2 0,4 0,6 0,8 1,0 1,2 P Concentration (cm -3 ) Characterization Optimization
More informationSupporting Information
Temperature Effect on Transport, Charging and Binding of Low-Energy Electrons Interacting with Amorphous Solid Water Films Roey Sagi, Michelle Akerman, Sujith Ramakrishnan and Micha Asscher * Institute
More informationMass Spectrometry. Electron Ionization and Chemical Ionization
Mass Spectrometry Electron Ionization and Chemical Ionization Mass Spectrometer All Instruments Have: 1. Sample Inlet 2. Ion Source 3. Mass Analyzer 4. Detector 5. Data System http://www.asms.org Ionization
More informationTed Madey s Scientific Career at NBS/NIST: Aspects of Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), and Vacuum Science
Ted Madey s Scientific Career at NBS/NIST: Aspects of Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), and Vacuum Science Cedric J. Powell 1. Ted s 25-year career at NBS/NIST:
More informationSupporting Information s for
Supporting Information s for # Self-assembling of DNA-templated Au Nanoparticles into Nanowires and their enhanced SERS and Catalytic Applications Subrata Kundu* and M. Jayachandran Electrochemical Materials
More informationdesorption (ESD) of the O,/Si( 111) surface K. Sakamoto *, K. Nakatsuji, H. Daimon, T. Yonezawa, S. Suga
-!!!I c%sj ELSEVIER Surface Science 306 (1994) 93-98.:.:.j:::~:::~~~::::::~:~::~~:~~,:~.~...,.. ~. :...:E.:.:: :.:.::::::~.:.:.:.:.:.:.,:.:,:,:. ~.~:+::.:.::::::j:::~::::.:...( ~ :.:.::.:.:.:,:..:,: :,,...
More informationSupporting Information. for. Angew. Chem. Int. Ed. Z Wiley-VCH 2003
Supporting Information for Angew. Chem. Int. Ed. Z52074 Wiley-VCH 2003 69451 Weinheim, Germany Kinetic and Thermodynamic Control via Chemical Bond Rearrangement on Si(001) Surface Chiho Hamai, Akihiko
More informationSize-selected Metal Cluster Deposition on Oxide Surfaces: Impact Dynamics and Supported Cluster Chemistry
Size-selected Metal Cluster Deposition on Oxide Surfaces: Impact Dynamics and Supported Cluster Chemistry Sungsik Lee, Masato Aizawa, Chaoyang Fan, Tianpin Wu, and Scott L. Anderson Support: AFOSR, DOE
More informationEffects of methanol on crystallization of water in the deeply super cooled region
Effects of methanol on crystallization of water in the deeply super cooled region Ryutaro Souda Nanoscale Materials Center National Institute for Materials Science Japan PHYSICAL REVIEW B 75, 184116, 2007
More information12. Structure Determination: Mass Spectrometry and Infrared Spectroscopy
12. Structure Determination: Mass Spectrometry and Infrared Spectroscopy Determining the Structure of an Organic Compound The analysis of the outcome of a reaction requires that we know the full structure
More informationElectronic Supplementary Information
Electronic Supplementary Material (ESI) for Chemical Science. This journal is The Royal Society of Chemistry 218 Rel. intensity Rel. intensity Electronic Supplementary Information Under-cover stabilization
More informationOutlines 3/12/2011. Vacuum Chamber. Inside the sample chamber. Nano-manipulator. Focused ion beam instrument. 1. Other components of FIB instrument
Focused ion beam instruments Outlines 1. Other components of FIB instrument 1.a Vacuum chamber 1.b Nanomanipulator 1.c Gas supply for deposition 1.d Detectors 2. Capabilities of FIB instrument Lee Chow
More informationSUPPLEMENTARY INFORMATION
SUPPLEMENTARY INFORMATION Using first principles to predict bimetallic catalysts for the ammonia decomposition reaction Danielle A. Hansgen, Dionisios G. Vlachos, Jingguang G. Chen SUPPLEMENTARY INFORMATION.
More informationMa5: Auger- and Electron Energy Loss Spectroscopy
Ma5: Auger- and Electron Energy Loss Spectroscopy 1 Introduction Electron spectroscopies, namely Auger electron- and electron energy loss spectroscopy are utilized to determine the KLL spectrum and the
More informationTheoretical Models for Chemical Kinetics
Theoretical Models for Chemical Kinetics Thus far we have calculated rate laws, rate constants, reaction orders, etc. based on observations of macroscopic properties, but what is happening at the molecular
More informationThomas Schwarz-Selinger. Max-Planck-Institut for Plasmaphysics, Garching Material Science Division Reactive Plasma Processes
Max-Planck-Institut für Plasmaphysik Thomas Schwarz-Selinger Max-Planck-Institut for Plasmaphysics, Garching Material Science Division Reactive Plasma Processes personal research interests / latest work
More informationX-ray photoelectron spectroscopic characterization of molybdenum nitride thin films
Korean J. Chem. Eng., 28(4), 1133-1138 (2011) DOI: 10.1007/s11814-011-0036-2 INVITED REVIEW PAPER X-ray photoelectron spectroscopic characterization of molybdenum nitride thin films Jeong-Gil Choi Department
More informationX-Ray Photoelectron Spectroscopy (XPS) Prof. Paul K. Chu
X-Ray Photoelectron Spectroscopy (XPS) Prof. Paul K. Chu X-ray Photoelectron Spectroscopy Introduction Qualitative analysis Quantitative analysis Charging compensation Small area analysis and XPS imaging
More informationThermal and Low-energy Ion- mediated Surface Chemistry of Halocarbons on Si(111)7 7 7 and SiO 2. Zhenhua He Department of Chemistry
Thermal and Low-energy Ion- mediated Surface Chemistry of alocarbons on (111)7 7 7 and O 2 Zhenhua e Department of Chemistry 1 Outline Introduction (111) surface Experimental Motivation alocarbons Present
More informationIonization Techniques Part IV
Ionization Techniques Part IV CU- Boulder CHEM 5181 Mass Spectrometry & Chromatography Presented by Prof. Jose L. Jimenez High Vacuum MS Interpretation Lectures Sample Inlet Ion Source Mass Analyzer Detector
More informationGeneration of strong electric fields in an ice film capacitor
Generation of strong electric fields in an ice film capacitor Sunghwan Shin, Youngsoon Kim, Eui-seong Moon, Du Hyeong Lee, Hani Kang, Heon Kang Department of Chemistry, Seoul National University, 1 Gwanak-ro,
More informationEvidence for partial dissociation of water on flat MgO(1 0 0) surfaces
6 February 2002 Chemical Physics Letters 352 (2002) 318 322 www.elsevier.com/locate/cplett Evidence for partial dissociation of water on flat MgO(1 0 0) surfaces Y.D. Kim a, R.M. Lynden-Bell b, *, A. Alavi
More informationAdvanced Lab Course. X-Ray Photoelectron Spectroscopy 1 INTRODUCTION 1 2 BASICS 1 3 EXPERIMENT Qualitative analysis Chemical Shifts 7
Advanced Lab Course X-Ray Photoelectron Spectroscopy M210 As of: 2015-04-01 Aim: Chemical analysis of surfaces. Content 1 INTRODUCTION 1 2 BASICS 1 3 EXPERIMENT 3 3.1 Qualitative analysis 6 3.2 Chemical
More informationPhotocatalytic degradation of dyes over graphene-gold nanocomposites under visible light irradiation
Photocatalytic degradation of dyes over graphene-gold nanocomposites under visible light irradiation Zhigang Xiong, Li Li Zhang, Jizhen Ma, X. S. Zhao* Department of Chemical and Biomolecular Engineering,
More informationMethods of surface analysis
Methods of surface analysis Nanomaterials characterisation I RNDr. Věra Vodičková, PhD. Surface of solid matter: last monoatomic layer + absorbed monolayer physical properties are effected (crystal lattice
More informationExperimental and Quantum Investigation on Ice Surface Structure and Reactivity
Experimental and Quantum Investigation on Ice Surface Structure and Reactivity A.Allouche J.P.Aycard F.Borget T.Chiavassa I.Couturier C.Manca F.Marinelli C.Martin S.Raunier P.Roubin Physique des Interactions
More informationApplication of Surface Analysis for Root Cause Failure Analysis
Application of Surface Analysis for Root Cause Failure Analysis David A. Cole Evans Analytical Group East Windsor, NJ Specialists in Materials Characterization Outline Introduction X-Ray Photoelectron
More informationOn the formation of ozone in oxygen-rich solar system ices via ionizing radiation
PCCP Dynamic Article Links Cite this: Phys. Chem. Chem. Phys., 2011, 13, 9469 9482 www.rsc.org/pccp PAPER On the formation of ozone in oxygen-rich solar system ices via ionizing radiation Courtney P. Ennis,
More informationTMT4320 Nanomaterials November 10 th, Thin films by physical/chemical methods (From chapter 24 and 25)
1 TMT4320 Nanomaterials November 10 th, 2015 Thin films by physical/chemical methods (From chapter 24 and 25) 2 Thin films by physical/chemical methods Vapor-phase growth (compared to liquid-phase growth)
More informationLecture 5. X-ray Photoemission Spectroscopy (XPS)
Lecture 5 X-ray Photoemission Spectroscopy (XPS) 5. Photoemission Spectroscopy (XPS) 5. Principles 5.2 Interpretation 5.3 Instrumentation 5.4 XPS vs UV Photoelectron Spectroscopy (UPS) 5.5 Auger Electron
More informationAuger Electron Spectroscopy (AES) Prof. Paul K. Chu
Auger Electron Spectroscopy (AES) Prof. Paul K. Chu Auger Electron Spectroscopy Introduction Principles Instrumentation Qualitative analysis Quantitative analysis Depth profiling Mapping Examples The Auger
More informationSupporting Information
Supporting Information Yao et al. 10.1073/pnas.1416368111 Fig. S1. In situ LEEM imaging of graphene growth via chemical vapor deposition (CVD) on Pt(111). The growth of graphene on Pt(111) via a CVD process
More informationTPD and FT-IRAS Investigation of Ethylene Oxide (EtO) Adsorption on a Au(211) Stepped Surface
3886 Langmuir 2005, 21, 3886-3891 TPD and FT-IRAS Investigation of Ethylene Oxide (EtO) Adsorption on a Au(211) Stepped Surface Jooho Kim and Bruce E. Koel* Department of Chemistry, University of Southern
More informationX-Rays, Electrons and Lithography: Fundamental Processes in Molecular Radiation Chemistry
X-Rays, Electrons and Lithography: Fundamental Processes in Molecular Radiation Chemistry D. Frank Ogletree Molecular Foundry, Berkeley Lab Berkeley CA USA Our Berkeley Lab Team EUV Lithography and Pattern
More informationstructure and paramagnetic character R. Kakavandi, S-A. Savu, A. Caneschi, T. Chassé, M. B. Casu Electronic Supporting Information
At the interface between organic radicals and TiO 2 (110) single crystals: electronic structure and paramagnetic character R. Kakavandi, S-A. Savu, A. Caneschi, T. Chassé, M. B. Casu Electronic Supporting
More informationTHE ROLE OF LABORATORY IN ASTROPHYSICS: LABORATORY EXPERIMENTS ON ICES AND ASTROPHYSICAL APPLICATIONS. 1 Introduction
THE ROLE OF LABORATORY IN ASTROPHYSICS: LABORATORY EXPERIMENTS ON ICES AND ASTROPHYSICAL APPLICATIONS MIGUEL ÁNGEL SATORRE, MANUEL DOMINGO, OSCAR GOMIS, RAMÓN LUNA Departamento de Física Aplicada, Escuela
More informationVibrational Spectroscopies. C-874 University of Delaware
Vibrational Spectroscopies C-874 University of Delaware Vibrational Spectroscopies..everything that living things do can be understood in terms of the jigglings and wigglings of atoms.. R. P. Feymann Vibrational
More informationA process whereby an electron is either removed from or added to the atom or molecule producing an ion in its ground state.
12.3 Processes and techniques 12.3.1 Ionization nomenclature Adiabatic ionization A process whereby an electron is either removed from or added to the atom or molecule producing an ion in its ground state.
More informationNanoEngineering of Hybrid Carbon Nanotube Metal Composite Materials for Hydrogen Storage Anders Nilsson
NanoEngineering of Hybrid Carbon Nanotube Metal Composite Materials for Hydrogen Storage Anders Nilsson Stanford Synchrotron Radiation Laboratory (SSRL) and Stockholm University Coworkers and Ackowledgement
More information4. Inelastic Scattering
1 4. Inelastic Scattering Some inelastic scattering processes A vast range of inelastic scattering processes can occur during illumination of a specimen with a highenergy electron beam. In principle, many
More informationNanocrystalline Si formation inside SiN x nanostructures usingionized N 2 gas bombardment
연구논문 한국진공학회지제 16 권 6 호, 2007 년 11 월, pp.474~478 Nanocrystalline Si formation inside SiN x nanostructures usingionized N 2 gas bombardment Min-Cherl Jung 1, Young Ju Park 2, Hyun-Joon Shin 1, Jun Seok Byun
More informationkev e - and H + ECR source Shock wave Molecular ices 3 C 2 H 2 C 6 H 6 2 C 3 H 3 Dust impact Europa
B Sivaraman kev e - and H + Shock wave Molecular ices ECR source 3 C 2 H 2 C 6 H 6 Europa Dust impact 2 C 3 H 3 C 6 H 6 Temperature, K 273 K 70 / 80 90 K 50 60 K < 20 K New molecules (ISM) C 60 - C 70
More informationXPS/UPS and EFM. Brent Gila. XPS/UPS Ryan Davies EFM Andy Gerger
XPS/UPS and EFM Brent Gila XPS/UPS Ryan Davies EFM Andy Gerger XPS/ESCA X-ray photoelectron spectroscopy (XPS) also called Electron Spectroscopy for Chemical Analysis (ESCA) is a chemical surface analysis
More informationHarris: Quantitative Chemical Analysis, Eight Edition
Harris: Quantitative Chemical Analysis, Eight Edition CHAPTER 21: MASS SPECTROMETRY CHAPTER 21: Opener 21.0 Mass Spectrometry Mass Spectrometry provides information about 1) The elemental composition of
More informationHydrogenation of solid hydrogen cyanide HCN and methanimine CH 2 NH at low temperature
Hydrogenation of solid hydrogen cyanide HCN and methanimine CH 2 NH at low temperature P. Theule, F. Borget, F. Mispelaer, G. Danger, F. Duvernay, J. C. Guillemin, and T. Chiavassa 5 534,A64 (2011) By
More informationAuger Electron Spectroscopy
Auger Electron Spectroscopy Auger Electron Spectroscopy is an analytical technique that provides compositional information on the top few monolayers of material. Detect all elements above He Detection
More informationChemistry Instrumental Analysis Lecture 34. Chem 4631
Chemistry 4631 Instrumental Analysis Lecture 34 From molecular to elemental analysis there are three major techniques used for elemental analysis: Optical spectrometry Mass spectrometry X-ray spectrometry
More informationInfrared Spectroscopy
Infrared Spectroscopy IR Spectroscopy Used to identify organic compounds IR spectroscopy provides a 100% identification if the spectrum is matched. If not, IR at least provides information about the types
More informationIR Spectrography - Absorption. Raman Spectrography - Scattering. n 0 n M - Raman n 0 - Rayleigh
RAMAN SPECTROSCOPY Scattering Mid-IR and NIR require absorption of radiation from a ground level to an excited state, requires matching of radiation from source with difference in energy states. Raman
More informationIII. Energy Deposition in the Detector and Spectrum Formation
1 III. Energy Deposition in the Detector and Spectrum Formation a) charged particles Bethe-Bloch formula de 4πq 4 z2 e 2m v = NZ ( ) dx m v ln ln 1 0 2 β β I 0 2 2 2 z, v: atomic number and velocity of
More informationIonizing radiation produces tracks defined by the geometry of the energy deposition events. An incident ion loses energy by Coulombic interactions
Track Structure Ionizing radiation produces tracks defined by the geometry of the energy deposition events. An incident ion loses energy by Coulombic interactions with electrons of the medium. These primary
More informationE cient hydration of Cs ions scattered from ice lms
Nuclear Instruments and Methods in Physics Research B 157 (1999) 191±197 www.elsevier.nl/locate/nimb E cient hydration of Cs ions scattered from ice lms T.-H. Shin, S.-J. Han, H. Kang * Department of Chemistry
More informationTPD-MS. Photocatalytic Studies Using Temperature Programmed Desorption Mass Spectrometry (TPD-MS) APPLICATION NOTE NOTE
TPD-MS APPLICATION NOTE NOTE Photocatalytic Studies Using Temperature Programmed Desorption Mass Spectrometry (TPD-MS) Thermal analysis consists of many techniques for the exploration of the physical properties
More informationThe Benefit of Wide Energy Range Spectrum Acquisition During Sputter Depth Profile Measurements
The Benefit of Wide Energy Range Spectrum Acquisition During Sputter Depth Profile Measurements Uwe Scheithauer, 82008 Unterhaching, Germany E-Mail: scht.uhg@googlemail.com Internet: orcid.org/0000-0002-4776-0678;
More informationSPECTROSCOPY MEASURES THE INTERACTION BETWEEN LIGHT AND MATTER
SPECTROSCOPY MEASURES THE INTERACTION BETWEEN LIGHT AND MATTER c = c: speed of light 3.00 x 10 8 m/s (lamda): wavelength (m) (nu): frequency (Hz) Increasing E (J) Increasing (Hz) E = h h - Planck s constant
More informationETCHING Chapter 10. Mask. Photoresist
ETCHING Chapter 10 Mask Light Deposited Substrate Photoresist Etch mask deposition Photoresist application Exposure Development Etching Resist removal Etching of thin films and sometimes the silicon substrate
More informationAuger Electron Spectrometry. EMSE-515 F. Ernst
Auger Electron Spectrometry EMSE-515 F. Ernst 1 Principle of AES electron or photon in, electron out radiation-less transition Auger electron electron energy properties of atom 2 Brief History of Auger
More informationX-ray Photoelectron Spectroscopy (XPS)
X-ray Photoelectron Spectroscopy (XPS) As part of the course Characterization of Catalysts and Surfaces Prof. Dr. Markus Ammann Paul Scherrer Institut markus.ammann@psi.ch Resource for further reading:
More informationMetal Deposition. Filament Evaporation E-beam Evaporation Sputter Deposition
Metal Deposition Filament Evaporation E-beam Evaporation Sputter Deposition 1 Filament evaporation metals are raised to their melting point by resistive heating under vacuum metal pellets are placed on
More informationSecondary ion mass spectrometry (SIMS)
Secondary ion mass spectrometry (SIMS) Lasse Vines 1 Secondary ion mass spectrometry O Zn 10000 O 2 Counts/sec 1000 100 Li Na K Cr ZnO 10 ZnO 2 1 0 20 40 60 80 100 Mass (AMU) 10 21 10 20 Si 07 Ge 0.3 Atomic
More informationRepetition: Practical Aspects
Repetition: Practical Aspects Reduction of the Cathode Dark Space! E x 0 Geometric limit of the extension of a sputter plant. Lowest distance between target and substrate V Cathode (Target/Source) - +
More informationELEMENTARY RADIATION CHEMISTRY
ELEMENTARY RADIATION CEMISTRY RADIOLYSIS The overall process of forming chemically stable products after the absorption and redistribution of the excess of energy of ionizing radiation The resulting compounds
More informationPhoton Interaction. Spectroscopy
Photon Interaction Incident photon interacts with electrons Core and Valence Cross Sections Photon is Adsorbed Elastic Scattered Inelastic Scattered Electron is Emitted Excitated Dexcitated Stöhr, NEXAPS
More informationToF-SIMS or XPS? Xinqi Chen Keck-II
ToF-SIMS or XPS? Xinqi Chen Keck-II 1 Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Not ToF MS (laser, solution) X-ray Photoelectron Spectroscopy (XPS) 2 3 Modes of SIMS 4 Secondary Ion Sputtering
More informationEvidence for structure sensitivity in the high pressure CO NO reaction over Pd(111) and Pd(100)
Evidence for structure sensitivity in the high pressure CO NO reaction over Pd(111) and Pd(100) Scott M. Vesecky, Peijun Chen, Xueping Xu, and D. Wayne Goodman a) Department of Chemistry, Texas A&M University,
More informationAbstract... I. Acknowledgements... III. Table of Content... V. List of Tables... VIII. List of Figures... IX
Abstract... I Acknowledgements... III Table of Content... V List of Tables... VIII List of Figures... IX Chapter One IR-VUV Photoionization Spectroscopy 1.1 Introduction... 1 1.2 Vacuum-Ultraviolet-Ionization
More informationPhotoemission Spectroscopy
FY13 Experimental Physics - Auger Electron Spectroscopy Photoemission Spectroscopy Supervisor: Per Morgen SDU, Institute of Physics Campusvej 55 DK - 5250 Odense S Ulrik Robenhagen,
More informationKinetics. Chapter 14. Chemical Kinetics
Lecture Presentation Chapter 14 Yonsei University In kinetics we study the rate at which a chemical process occurs. Besides information about the speed at which reactions occur, kinetics also sheds light
More informationCHEM 103: Chemistry in Context
CHEM 103: Chemistry in Context Unit 4.2 Atmospheric Chemistry: the chemistry of global climate change Reading: Chapter 3 Unit 4.2: Chemistry Behind Global Climate Change Solar energy balance Earth s surface
More informationElectron Rutherford Backscattering, a versatile tool for the study of thin films
Electron Rutherford Backscattering, a versatile tool for the study of thin films Maarten Vos Research School of Physics and Engineering Australian National University Canberra Australia Acknowledgements:
More informationCombinatorial RF Magnetron Sputtering for Rapid Materials Discovery: Methodology and Applications
Combinatorial RF Magnetron Sputtering for Rapid Materials Discovery: Methodology and Applications Philip D. Rack,, Jason D. Fowlkes,, and Yuepeng Deng Department of Materials Science and Engineering University
More informationMolecular alignment, wavepacket interference and Isotope separation
Molecular alignment, wavepacket interference and Isotope separation Sharly Fleischer, Ilya Averbukh and Yehiam Prior Chemical Physics, Weizmann Institute Yehiam.prior@weizmann.ac.il Frisno-8, Ein Bokek,
More informationEnergy Spectroscopy. Excitation by means of a probe
Energy Spectroscopy Excitation by means of a probe Energy spectral analysis of the in coming particles -> XAS or Energy spectral analysis of the out coming particles Different probes are possible: Auger
More informationFormation of Halogen Bond-Based 2D Supramolecular Assemblies by Electric Manipulation
Formation of Halogen Bond-Based 2D Supramolecular Assemblies by Electric Manipulation Qing-Na Zheng, a,b Xuan-He Liu, a,b Ting Chen, a Hui-Juan Yan, a Timothy Cook, c Dong Wang* a, Peter J. Stang, c Li-Jun
More information1 Molecular collisions
1 Molecular collisions The present exercise starts with the basics of molecular collisions as presented in Chapter 4 of the lecture notes. After that, particular attention is devoted to several specific
More informationTable 1: Residence time (τ) in seconds for adsorbed molecules
1 Surfaces We got our first hint of the importance of surface processes in the mass spectrum of a high vacuum environment. The spectrum was dominated by water and carbon monoxide, species that represent
More informationPHI 5000 Versaprobe-II Focus X-ray Photo-electron Spectroscopy
PHI 5000 Versaprobe-II Focus X-ray Photo-electron Spectroscopy The very basic theory of XPS XPS theroy Surface Analysis Ultra High Vacuum (UHV) XPS Theory XPS = X-ray Photo-electron Spectroscopy X-ray
More informationFourier Transform IR Spectroscopy
Fourier Transform IR Spectroscopy Absorption peaks in an infrared absorption spectrum arise from molecular vibrations Absorbed energy causes molecular motions which create a net change in the dipole moment.
More informationLecture 20 Auger Electron Spectroscopy
Lecture 20 Auger Electron Spectroscopy Auger history cloud chamber Although Auger emission is intense, it was not used until 1950 s. Evolution of vacuum technology and the application of Auger Spectroscopy
More information"Let me tell you the secret that has led me to my goal. My strength lies solely in my tenacity." -Louis Pasteur-
CHEMISTRY 101 Hour Exam III December 4, 2014 Adams/Esbenshade Name Signature Section "Let me tell you the secret that has led me to my goal. My strength lies solely in my tenacity." -Louis Pasteur- This
More informationChapter 21. Preview. Lesson Starter Objectives Mass Defect and Nuclear Stability Nucleons and Nuclear Stability Nuclear Reactions
Preview Lesson Starter Objectives Mass Defect and Nuclear Stability Nucleons and Nuclear Stability Nuclear Reactions Section 1 The Nucleus Lesson Starter Nuclear reactions result in much larger energy
More informationPHYSICAL AND CHEMICAL PROPERTIES OF ATMOSPHERIC PRESSURE PLASMA POLYMER FILMS
PHYSICAL AND CHEMICAL PROPERTIES OF ATMOSPHERIC PRESSURE PLASMA POLYMER FILMS O. Goossens, D. Vangeneugden, S. Paulussen and E. Dekempeneer VITO Flemish Institute for Technological Research, Boeretang
More informationEXAFS. Extended X-ray Absorption Fine Structure
AOFSRR Cheiron School 2010, SPring-8 EXAFS Oct. 14th, 2010 Extended X-ray Absorption Fine Structure Iwao Watanabe Ritsumeikan University EXAFS Theory Quantum Mechanics Models Approximations Experiment
More informationLocal Anodic Oxidation of GaAs: A Nanometer-Scale Spectroscopic Study with PEEM
Local Anodic Oxidation of GaAs: A Nanometer-Scale Spectroscopic Study with PEEM S. Heun, G. Mori, M. Lazzarino, D. Ercolani, G. Biasiol, and L. Sorba Laboratorio TASC-INFM, 34012 Basovizza, Trieste A.
More informationIdentification of Defect Sites on MgO(100) Surfaces
Langmuir 2002, 18, 3999-4004 3999 Identification of Defect Sites on MgO(100) Surfaces Y. D. Kim, J. Stultz, and D. W. Goodman* Department of Chemistry, Texas A& MUniversity, College Station, Texas 77842-3012
More informationMeasurement of the chemistry and growth of alkali antimonides using in-situ AFM and XPS
Susanne Schubert sschubert@bnl.gov P3 workshop, Cornell Oct. 2012 Measurement of the chemistry and growth of alkali antimonides using in-situ AFM and XPS SETUP AT THE CENTER OF FUNCTIONAL NANOMATERIALS,
More informationSupporting information. Highly Efficient Photocatalytic Degradation of Organic Pollutants by PANI-modified TiO 2 Composite
Supporting information Highly Efficient Photocatalytic Degradation of Organic Pollutants by PANI-modified Composite Yangming Lin, Danzhen Li*, Junhua Hu, Guangcan Xiao, Jinxiu Wang, Wenjuan Li, Xianzhi
More informationAsymmetric transport efficiencies of positive and negative ion defects in amorphous ice
Asymmetric transport efficiencies of positive and negative ion defects in amorphous ice E.-S. Moon, Y. Kim, S. Shin, H. Kang Phys. Rev. Lett. 2012, 108, 226103 Soumabha Bag CY08D021 18-08-12 Introduction:
More informationIntroduction to Thin Film Processing
Introduction to Thin Film Processing Deposition Methods Many diverse techniques available Typically based on three different methods for providing a flux of atomic or molecular material Evaporation Sputtering
More informationThe Low Temperature Conversion of Methane to Methanol on CeO x /Cu 2 O catalysts: Water Controlled Activation of the C H Bond
The Low Temperature Conversion of Methane to Methanol on CeO x /Cu 2 O catalysts: Water Controlled Activation of the C H Bond Zhijun Zuo, a Pedro J. Ramírez, b Sanjaya Senanayake, a Ping Liu c,* and José
More information