STRESS ANALYSIS USING BREMSSTRAHLUNG RADIATION
|
|
- Patricia Stokes
- 5 years ago
- Views:
Transcription
1 Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume STRESS ANALYSIS USING BREMSSTRAHLUNG RADIATION F. A. Selim 1, D.P. Wells 1, J. F. Harmon 1, J. Kwofie 1, A. K. Roy 2, T. White 3 and T. Roney 3 1 Idaho State University, Idaho Accelerator Center, Campus Box 8263, Pocatello, ID University of Nevada, Box , Las Vegas, NV Idaho National Engineering and Environmental Laboratory, P.O. Box , Idaho Falls, ID ABSTRACT Diffraction methods are the most reliable nondestructive methods of measuring residual stress. X-ray diffraction is restricted to penetration depths of some 10 µm, whereas neutron diffraction can provide information at significantly higher depths, but the cost is very high and the availability of facilities is much lower. A sensitive nondestructive probe for detecting defects and measuring stresses in thick materials (tens of cm) does not exist. The first highly penetrating system to measure stress/strain in thick materials based on using bremsstrahlung beams from small electron accelerators (3-6 MeV Linacs), is presented in this paper. These bremsstrahlung beams, which exhibit excellent penetration, create positrons inside the materials via pair production. The positrons annihilate with the material electrons emitting 511 kev radiation, which is influenced by the momentum distributions of the atomic electrons. Because of the fact of positron trapping at defects, positron annihilation is very sensitive to any change in the microstructure and can probe nano-void defects. Open volume defects, voids or dislocations are reflected in the line width of the 511 kev peak. Tensile stresses and resultant strains have been measured in an engineering alloy using this technique. This technique can be used to infer residual stress and to detect defects in crystals, polymers, metals and alloys up to tens of gm/cm 2 for material science and engineering applications. The low cost and compact size of small electron accelerators, and the high penetrability of MeV bremsstrahlung beams allow the development of portable systems for industrial applications. INTRODUCTION Sensitive nondestructive probes for stress analysis in thick materials are important in a wide range of applications. Diffraction methods offer the most sensitive nondestructive probes for stress analysis. X-ray diffraction [1] is widely used to measure stress, but it is restricted to small penetration depths (about 10 µm maximum). Synchrotron radiation [2] can provide information at depths up to 100 µm. Neutron diffraction [3] can provide information at much higher depths but the number of neutron diffraction facilities is very limited and the cost is very high. Other nondestructive methods [4] are also limited by their small penetration depth or their poor sensitivity. Raman spectroscopy represents another nondestructive method for stress analysis, but it is also limited to surface regions. Ultrasound technique is useful for high penetration depths, but it is only sensitive to macroscopic effects. Magnetic methods have also poor sensitivity and are limited to magnetic materials.
2 This document was presented at the Denver X-ray Conference (DXC) on Applications of X-ray Analysis. Sponsored by the International Centre for Diffraction Data (ICDD). This document is provided by ICDD in cooperation with the authors and presenters of the DXC for the express purpose of educating the scientific community. All copyrights for the document are retained by ICDD. Usage is restricted for the purposes of education and scientific research. DXC Website ICDD Website -
3 Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume Positron annihilation spectroscopy has been established as a sensitive nondestructive tool to study open volume defects [5], and is considered to be a unique technique to probe atomic scale defects. However it is also limited to thin materials because of the limited range of positrons in matter. The purpose of this study is to develop a highly penetrating sensitive probe for stress analysis in thick materials based on γ-ray induced positron annihilation spectroscopy. We have showed very recently [6] that positron annihilation spectroscopy can be extended to thick materials up to tens of gm/cm 2 by using MeV γ- rays as the primary beam instead of a positron beam. The high-energy photons penetrate deeply inside the material creating positrons via pair production. The positrons thermalize and annihilate with the material electrons emitting annihilation radiation, which carry information about the electron momentum distributions. This paper shows that γ-ray induced positron annihilation spectroscopy can be used to analyze stress and strain in engineering materials such as Zircaloy-4 (Zr-4). The basis of positron annihilation spectroscopy of defects will be explained below. Further, the experimental setup of the proposed technique and some initial measurements will be presented. POSITRON SPECTROSCOPY OF DEFECTS Positron thermalizes in material and then annihilates with an electron emitting two 511 kev annihilation photons. Spectroscopic studies [7] of annihilation radiation are classified into two categories, which are distinguished by the sensitivity of positron annihilation to the electron density (positron lifetime measurements) and the sensitivity of positron annihilation to the electron momentum distributions (Doppler broadening and angular correlation of annihilation radiation measurements). Positron lifetime spectroscopy is based on the fact that positron annihilation is proportional to the electronic density at the annihilation site and so it can provide information about the electronic densities in materials. The other Positron annihilation spectroscopy techniques are based on the fact that in the annihilation process, the positron does not contribute extra momentum to the center of mass of the annihilating pair. This is because positron rapidly thermalizes in a solid and remains as delocalized particle until it annihilates. On the contrary, the electron in atom has a significant momentum. Because of conservation of momentum, the two annihilation photons are nearly collinear. The electron momentum causes them to be emitted at a slight angle relative to each other. This is the basis of angular correlation of annihilation radiation measurements. The electron momentum is also reflected in the Doppler broadening of the 511 kev annihilation line in energy dispersive measurements. Hence both Doppler broadening and angular correlation of annihilation radiation measurements can provide information about the electron momentum distributions in atoms. Positron trapping at defects( i.e. localization of positron wave function at the defect site until annihilation) was discovered in 1960 [8]. It can be understood as follows: the positive charge of nuclei creates repulsive coulomb potentials for the thermalized positron in material. The lack of a positive charge at open-volume defects, such as vacancies and dislocations, provides an attractive potential that traps positrons at these sites. Positron diffusion lengths through the lattice are sufficiently long ( 100 nm) that they can probe a high number of atoms before annihilation. This creates a very high sensitivity to defects of approximately one vacancy per 10 7 atoms. The trapping of
4 Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume positrons at defects leads to characteristic changes in the measured parameters of positron annihilation spectroscopy. In lifetime measurements, the positron lifetime is increased in regions containing defects due to the lower electron density in such regions relative to regions without defects. On the other hand, when the positron wave function is localized at a defect site, its overlap with the core electrons will be decreased compared to its overlap with the less tightly bounded valence electrons and so, it will annihilate more with valence electrons. This is reflected in Doppler broadening measurements by a noticeable reduction in the broadening of the annihilation peak (i.e. a narrower 511 kev peak). Two parameters (S&W) have been often used to characterize the annihilation peak in Doppler broadening spectroscopy [9]. The S-parameter is sensitive to the annihilation with valence electrons and is defined as the ratio of the counts in the central region of the peak to the total counts in the peak. The W-parameter is more sensitive to the annihilation with high momentum core electrons and is defined as the ratio of the counts in the wing regions of the peak to the total counts in the peak. It is important to note that these peaks are a superposition of peaks associated with each atomic or molecular shell. The resulting peak is not gaussion and hence the non-standard spectroscopic functions S and W are used instead of gaussion peak fitting. EXPERIMENTAL SETUP AND SPECIMEN PREPARATION Doppler broadening spectroscopy was performed using bremsstrahlung beam-induced positrons to investigate the dependence of Doppler broadening on the tensile stress in thick materials. 6 MeV electron beams from a small-pulsed electron Linac were converted into bremsstrahlung beams by using a thick tungsten converter. Figure 1 shows the experimental setup. The bremsstrahlung beams were doubly collimated, with a stainless steel primary collimator followed by a lead collimator. The collimated beam with 2.5cm diameter was incident upon the specimen resulting in pair production and other electromagnetic processes. Positrons induced from pair production annihilate with the material electrons emitting 511 kev radiation. A high-energy resolution HPGe detector, shielded with 10 cm lead, was used to record the 511 kev radiation. The energy resolution of the detector was 1.1 kev at the 356 kev Ba-133 line and 1.3 kev at the 662 kev Cs-137 line. A detailed description of this experimental setup can be found elsewhere [6,10]. Measurements were made on cylindrical tensile specimens (10.16cm long, 2.54cm gauge length and 0.64cm gauge diameter) of Zr-4, which were previously subjected to varied amounts of tensile loading using a material-testing system machine. These tensile specimens were machined from annealed Zr-4 alloys in the longitudinal rolling direction. After the tensile stress test, each specimen has been exposed to the bremsstrahlung beam and the spectrum has been recorded during the pulse. Figure1: The experimental set-up of Doppler broadening spectroscopy using 6 MeV electron Linac.
5 Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume DATA TREATMENT& RESULTS For each specimen, the 511 kev peak was analyzed in terms of S&W parameters after subtracting background. Figure 2 shows the peak profile of the 511 kev line for one of the recorded spectrum. S is obtained by summing the counts in the central region of the peak with width of 1.2 kev, from to kev (1.2 kev represents the Doppler shift due to annihilation with valence electrons [9]) and dividing it by the total counts in the peak. W is obtained by summing the counts in the wing regions (from 508 to and from to 514 kev) and dividing it by the total counts in the peak. t-parameter is defined as the ratio between W and S. Figures 3 and 4 show the dependence of relative t parameter on the tensile stress and resultant strain respectively. The relative t represents the measured t-parameter for each specimen divided by t reference (the unstressed specimen). Uncertainties are dominated by statistical counting errors. Systematic errors in relative t- parameter values tend to cancel each other since the set up for each data point is exactly the same and we take ratio. The statistical error in the counts in each region was evaluated including the error from background subtraction. The statistical error in t- parameter was obtained by adding the errors in S & W quadratically, while neglecting the covariance term { eq.1}. 2 2 ( σ s) + ( w) 2cov( s, w sw σ t t = s σ w ) (1) Where σ s & σ w were also obtained by propagating the errors associated with the counts of each region. Notice that the covariance term has a negative sign and, if included, would reduce the uncertainty in the given numbers Counts Energy (kev) Figure 2: Peak profile of the 511 kev line
6 Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume Figure 3: Relative t as a function of stress in Zr-4, note that the large gap in stress is necessary to move past the elastic regime of the Zr-4 samples Figure 4: Relative t as a function of strain in Zr-4 Dislocation lines or any change in the spacing of the lattice planes due to residual stress act as vacancies and open volume defects. They form an attractive potential that trap positrons at these sites. This leads to more contribution from annihilation with valence electrons and consequently a decrease in the line width of the 511 peak, an increase in S parameter and a decrease in W and t parameters. This effect is clearly apparent in the reduction of t parameter with increased stress and strain values up to the maximum stress, as shown in Figures 3 and 4. The first point on each curve represents the reference specimen, which was not subjected to any stress. The second point represent the specimen subjected to 51.9 Kpsi (induced strain), which is slightly above the stress yield point (the minimum stress required to induce plastic deformation). Measurements have not performed below this point, since there is no plastic deformation or permanent change in the microstructure. The last points on the two curves represent a specimen, which was stressed to total failure. Most of the range of strain occurs at the last point (the jump from 0.05 to 0.28 in Figure 4), equivalent to a change in stress of only 72 to 78 Kpsi. This is because most of the plastic deformation occurs just before the complete failure. The high statistical errors in the data are due to the low counting rate associated with the pulsed beam, since the repetition rate of the electron Linac is only 200 Hz. This can be addressed by raising the repetition rate of the Linac or using continuous wave electron (CW) Linacs, which would increase the counting rate by approximately The photon beam size in the above measurements was about 2.5 cm and hence no spatial information about the stress distribution was available. However the fact that positron interacts with atomic scale defects raises the possibility that a high spatial resolution positron probe for stress analysis could be achieved if the photon beam size is greatly reduced. This may allow studying multi-axial stress fields by bremstrahlung-based positron annihilation. However this is still beyond the current capabilities of the technique.
7 Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume CONCLUSION: The feasibility of a new technique to measure stress in thick materials has been demonstrated. This technique employs bremsstrahlung beams from small electron accelerators to perform positron spectroscopy of defects. The high-energy γ-rays can penetrate deeply inside the materials probing very high depths up to tens of g/cm 2 (5-10cm in steel). By combining the high penetrability of γ-rays with the great sensitivity of positron spectroscopy to defects, a unique sensitive probe has been demonstrated, with the capability of analyzing defects and stresses in thick materials used in engineering applications. The presented measurements demonstrate the ability to measure tensile stresses. However this technique can be used to measure macroscopic or microscopic residual stresses. Because of the high sensitivity of positrons to defects, this technique can probe microscopic residual stresses, which operate over the grain or atomic scale of the material. ACKNOWLEDGEMENTS This work has been supported by Inland Northwest Research Alliance under contract ISU001. REFERENCES [1] I. C. Noyan and R. B. Cohen, Residual Stress Measurements By Diffraction and Interpretation, Springer-Verlag, New York 1987 [2] R. A. Owen, P. J. Withers and P. J. Webster, ICRS-6 Conf. Proc., Oxford, United Kingdom, July 2000., vol. 1, p.82 [3] A. Allen, M. T. Hutchings and C. G. Windsor, Adv. Phys. 34 (1985), p. 445 [4] F. A. Kandil, J.D. Lord, A. T. Fry and P. V. Grant, NPL Report MAT(A)04, NPL Materials Center, [5] P. Hautojarvi and A. Vehanen, in: Positrons in Solids, Ed: P.Hautojarvi, 1979, p.1 [6] F.A. Selim et al., Nucl. Inst. & Meth. B 192 (2002), p. 197 [7] P. J. Schultz and K. G. Lynn, Rev. Mod. Phys. 60(1988), p.701 [8] I.K. MacKenzie, T.L. Khoo, A.D. McDonald and B.T. A. Mckee, Phys. Lett. 19 (1967), p. 946 [9] P. Asoka-Kumar, K. G. Lynn and D. O. Welch, J. Appl. Phys. 76 (1994), p [10] F.A. Selim, D.P. Wells, J.F. Harmon, J. Kwofie, G. Erickson and T. Roney, Nucl. Inst. & Meth. A 495 (2002), p. 154
DEVELOPMENT OF A NEW POSITRON LIFETIME SPECTROSCOPY TECHNIQUE FOR DEFECT CHARACTERIZATION IN THICK MATERIALS
Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 59 DEVELOPMENT OF A NEW POSITRON LIFETIME SPECTROSCOPY TECHNIQUE FOR DEFECT CHARACTERIZATION IN
More informationLASER-COMPTON SCATTERING AS A POTENTIAL BRIGHT X-RAY SOURCE
Copyright(C)JCPDS-International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Vol.46 74 ISSN 1097-0002 LASER-COMPTON SCATTERING AS A POTENTIAL BRIGHT X-RAY SOURCE K. Chouffani 1, D. Wells
More informationNew Concept of EPOS Progress of the Mono-energetic Positron Beam (MePS) Gamma-induced Positron Spectroscopy (GiPS)
Progress of the EPOS Project: Gamma Induced Positron Spectroscopy (GiPS) R. Krause-Rehberg 1,*,W.Anwand 2,G.Brauer 2, M. Butterling 1,T.Cowan 2,M. Jungmann 1, A. Krille 1, R. Schwengner 2, A. Wagner 2
More informationResearch Center Dresden Rossendorf
News of the EPOS Project at the ELBE Radiation Source in the Research Center Dresden Rossendorf EPOS-Team & R. Krause-Rehberg Extended Concept of EPOS Progress of the mono-energetic Positron Beam (MePS)
More informationPositron Annihilation Spectroscopy - A non-destructive method for material testing -
Maik Butterling Institute of Radiation Physics http://www.hzdr.de Positron Annihilation Spectroscopy - A non-destructive method for material testing - Maik Butterling Positron Annihilation Spectroscopy
More informationThe intense, pulsed positron source EPOS at the Research Centre Dresden-Rossendorf
The intense, pulsed positron source EPOS at the Research Centre Dresden-Rossendorf The EPOS Team and R. Krause-Rehberg Martin-Luther University, Halle-Wittenberg, Dept. of Physics, 06099 Halle / Germany
More informationMCSHAPE: A MONTE CARLO CODE FOR SIMULATION OF POLARIZED PHOTON TRANSPORT
Copyright JCPDS - International Centre for Diffraction Data 2003, Advances in X-ray Analysis, Volume 46. 363 MCSHAPE: A MONTE CARLO CODE FOR SIMULATION OF POLARIZED PHOTON TRANSPORT J.E. Fernández, V.
More informationABNORMAL X-RAY EMISSION FROM INSULATORS BOMBARDED WITH LOW ENERGY IONS
302 ABNORMAL X-RAY EMISSION FROM INSULATORS BOMBARDED WITH LOW ENERGY IONS M. Song 1, K. Mitsuishi 1, M. Takeguchi 1, K. Furuya 1, R. C. Birtcher 2 1 High Voltage Electron Microscopy Station, National
More informationPositron program at the Idaho Accelerator Center. Giulio Stancari Idaho State University and Jefferson Lab
Positron program at the Idaho Accelerator Center Giulio Stancari Idaho State University and Jefferson Lab International Workshop on Positrons at Jefferson Lab Newport News, Virginia (USA), 26 March 2009
More informationELECTRIC FIELD INFLUENCE ON EMISSION OF CHARACTERISTIC X-RAY FROM Al 2 O 3 TARGETS BOMBARDED BY SLOW Xe + IONS
390 ELECTRIC FIELD INFLUENCE ON EMISSION OF CHARACTERISTIC X-RAY FROM Al 2 O 3 TARGETS BOMBARDED BY SLOW Xe + IONS J. C. Rao 1, 2 *, M. Song 2, K. Mitsuishi 2, M. Takeguchi 2, K. Furuya 2 1 Department
More informationOutlook: Application of Positron Annihilation for defects investigations in thin films. Introduction to Positron Annihilation Methods
Application of Positron Annihilation for defects investigations in thin films V. Bondarenko, R. Krause-Rehberg Martin-Luther-University Halle-Wittenberg, Halle, Germany Outlook: Introduction to Positron
More informationIntroduction into Positron Annihilation
Introduction into Positron Annihilation Introduction (How to get positrons? What is special about positron annihilation?) The methods of positron annihilation (positron lifetime, Doppler broadening, ACAR...)
More informationApplication of positrons in materials research
Application of positrons in materials research Trapping of positrons at vacancy defects Using positrons, one can get defect information. R. Krause-Rehberg and H. S. Leipner, Positron annihilation in Semiconductors,
More informationBasics and Means of Positron Annihilation
Basics and Means of Positron Annihilation Positron history Means of positron annihilation positron lifetime spectroscopy angular correlation Doppler-broadening spectroscopy Near-surface positron experiments:
More informationRESIDUAL STRESS MEASUREMENT IN STEEL BEAMS USING THE INCREMENTAL SLITTING TECHNIQUE
659 RESIDUAL STRESS MEASUREMENT IN STEEL BEAMS USING THE INCREMENTAL SLITTING TECHNIQUE DZL Hodgson 1, DJ Smith 1, A Shterenlikht 1 1 Department of Mechanical Engineering, University of Bristol University
More informationNEW CORRECTION PROCEDURE FOR X-RAY SPECTROSCOPIC FLUORESCENCE DATA: SIMULATIONS AND EXPERIMENT
Copyright JCPDS - International Centre for Diffraction Data 2005, Advances in X-ray Analysis, Volume 48. 266 NEW CORRECTION PROCEDURE FOR X-RAY SPECTROSCOPIC FLUORESCENCE DATA: SIMULATIONS AND EXPERIMENT
More informationPOSITRON AND POSITRONIUM INTERACTIONS WITH CONDENSED MATTER. Paul Coleman University of Bath
POSITRON AND POSITRONIUM INTERACTIONS WITH CONDENSED MATTER Paul Coleman University of Bath THE FATE OF POSITRONS IN CONDENSED MATTER POSITRON-SURFACE INTERACTIONS positron backscattering BACKSCATTERED
More informationANALYSIS OF LOW MASS ABSORPTION MATERIALS USING GLANCING INCIDENCE X-RAY DIFFRACTION
173 ANALYSIS OF LOW MASS ABSORPTION MATERIALS USING GLANCING INCIDENCE X-RAY DIFFRACTION N. A. Raftery, L. K. Bekessy, and J. Bowpitt Faculty of Science, Queensland University of Technology, GPO Box 2434,
More informationStrain and Stress Measurements with a Two-Dimensional Detector
Copyright ISSN (C) 97-, JCPDS-International Advances in X-ray Centre Analysis, or Volume Diraction 4 Data 999 5 Strain and Stress Measurements with a Two-Dimensional Detector Baoping Bob He and Kingsley
More informationMotivation. g-spectroscopy deals with g-ray detection and is one of the most relevant methods to investigate excited states in nuclei.
Motivation Spins and excited states of double-magic nucleus 16 O Decay spectra are caused by electro-magnetic transitions. g-spectroscopy deals with g-ray detection and is one of the most relevant methods
More informationTHE IMPORTANCE OF THE SPECIMEN DISPLACEMENT CORRECTION IN RIETVELD PATTERN FITTING WITH SYMMETRIC REFLECTION-OPTICS DIFFRACTION DATA
Copyright(c)JCPDS-International Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol.44 96 THE IMPORTANCE OF THE SPECIMEN DISPLACEMENT CORRECTION IN RIETVELD PATTERN FITTING WITH SYMMETRIC REFLECTION-OPTICS
More informationINFLUENCE OF GROWTH INTERRUPTION ON THE FORMATION OF SOLID-STATE INTERFACES
122 INFLUENCE OF GROWTH INTERRUPTION ON THE FORMATION OF SOLID-STATE INTERFACES I. Busch 1, M. Krumrey 2 and J. Stümpel 1 1 Physikalisch-Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig, Germany
More informationFACTORS AFFECTING IN-LINE PHASE CONTRAST IMAGING WITH A LABORATORY MICROFOCUS X-RAY SOURCE
Copyright JCPDS-International Centre for Diffraction Data 26 ISSN 197-2 FACTORS AFFECTING IN-LINE PHASE CONTRAST IMAGING WITH A LABORATORY MICROFOCUS X-RAY SOURCE 31 K. L. Kelly and B. K. Tanner Department
More informationFUNDAMENTAL PARAMETERS ANALYSIS OF ROHS ELEMENTS IN PLASTICS
45 ABSTRACT FUNDAMENTAL PARAMETERS ANALYSIS OF ROHS ELEMENTS IN PLASTICS W. T. Elam, Robert B. Shen, Bruce Scruggs, and Joseph A. Nicolosi EDAX, Inc. Mahwah, NJ 70430 European Community Directive 2002/95/EC
More informationStudy of semiconductors with positrons. Outlook:
Study of semiconductors with positrons V. Bondarenko, R. Krause-Rehberg Martin-Luther-University Halle-Wittenberg, Halle, Germany Introduction Positron trapping into defects Methods of positron annihilation
More informationSlow-Positron-Beam Techniques
Slow-Positron-Beam Techniques 1 Slow-Positron-Beam Techniques The main advantage of the conventional sample source sandwich arrangement is that the emitted positrons immediately penetrate the sample. A
More informationGLANCING INCIDENCE XRF FOR THE ANALYSIS OF EARLY CHINESE BRONZE MIRRORS
176 177 GLANCING INCIDENCE XRF FOR THE ANALYSIS OF EARLY CHINESE BRONZE MIRRORS Robert W. Zuneska, Y. Rong, Isaac Vander, and F. J. Cadieu* Physics Dept., Queens College of CUNY, Flushing, NY 11367. ABSTRACT
More informationIMPROVING THE ACCURACY OF RIETVELD-DERIVED LATTICE PARAMETERS BY AN ORDER OF MAGNITUDE
Copyright (c)jcpds-international Centre for Diffraction Data 2002, Advances in X-ray Analysis, Volume 45. 158 IMPROVING THE ACCURACY OF RIETVELD-DERIVED LATTICE PARAMETERS BY AN ORDER OF MAGNITUDE B. H.
More informationPositron Annihilation Spectroscopy
Positron Annihilation Spectroscopy (1) Angular Correlation θ N x, y = p x, y m C θ γ-ray (511keV ± E) 0 (2) Doppler Broadening Cp E = z 2 θ N p ~100µm 22 Na (e + Source) e - e + ~ 10-12 s Sample γ-ray
More informationEnergy Spectroscopy. Ex.: Fe/MgO
Energy Spectroscopy Spectroscopy gives access to the electronic properties (and thus chemistry, magnetism,..) of the investigated system with thickness dependence Ex.: Fe/MgO Fe O Mg Control of the oxidation
More informationPERFORMANCE OF A ROOM TEMPERATURE GAS PROPORTIONAL SCINTILLATION COUNTER IN X-RAY ANALYSIS OF METALLIC ALLOYS EXCITED WITH ALPHA PARTICLES
249 PERFORMANCE OF A ROOM TEMPERATURE GAS PROPORTIONAL SCINTILLATION COUNTER IN X-RAY ANALYSIS OF METALLIC ALLOYS EXCITED WITH ALPHA PARTICLES F. I. G. M. Borges, S. J. C. do Carmo, T. H. V. T. Dias, F.
More informationTechnical Status Update on PA Lifetime Spectroscopy Experiments and Results
Technical Status Update on PA Lifetime Spectroscopy Experiments and Results Dustin McNulty Idaho State University mcnudust@isu.edu October 9, 2012 Technical Status Update on PA Lifetime Spectroscopy Experiments
More informationStrain, Stress and Cracks Klaus Attenkofer PV Reliability Workshop (Orlando) April 7-8, 2015
Strain, Stress and Cracks Klaus Attenkofer PV Reliability Workshop (Orlando) April 7-8, 2015 1 BROOKHAVEN SCIENCE ASSOCIATES Overview Material s response to applied forces or what to measure Definitions
More informationISU Physics: Overview
ISU Physics: Overview Steve Shropshire Department of Physics Idaho State University Slides prepared by Dan Dale ISU s Dept. of Physics Mission: Education and Research in Nuclear Science. ISU Campus: Idaho
More informationM. Werner, E. Altstadt, M. Jungmann, G. Brauer, K. Noack, A. Rogov, R. Krause-Rehberg. Thermal Analysis of EPOS components
M. Werner, E. Altstadt, M. Jungmann, G. Brauer, K. Noack, A. Rogov, R. Krause-Rehberg Thermal Analysis of EPOS components Dresden, June 27, 2008 Page 2 FZD Abstract: We present a simulation study of the
More informationCALCULATION METHODS OF X-RAY SPECTRA: A COMPARATIVE STUDY
Copyright -International Centre for Diffraction Data 2010 ISSN 1097-0002 CALCULATION METHODS OF X-RAY SPECTRA: A COMPARATIVE STUDY B. Chyba, M. Mantler, H. Ebel, R. Svagera Technische Universit Vienna,
More informationRADIOACTIVE SAMPLE EFFECTS ON EDXRF SPECTRA
90 RADIOACTIVE SAMPLE EFFECTS ON EDXRF SPECTRA Christopher G. Worley Los Alamos National Laboratory, MS G740, Los Alamos, NM 87545 ABSTRACT Energy dispersive X-ray fluorescence (EDXRF) is a rapid, straightforward
More informationMaterial Science using Positron Annihilation
Material Science using Positron Annihilation R. Krause-Rehberg Universität Halle, Inst. für Physik 9.3.2018 Some historical remarks Techniques of Positron Annihilation Study of Defects in Semiconductors
More informationRIETVELD REFINEMENT WITH XRD AND ND: ANALYSIS OF METASTABLE QANDILITE-LIKE STRUCTURES
Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 261 RIETVELD REFINEMENT WITH XRD AND ND: ANALYSIS OF METASTABLE QANDILITE-LIKE STRUCTURES G. Kimmel
More informationMagnetic measurements (Pt. IV) advanced probes
Magnetic measurements (Pt. IV) advanced probes Ruslan Prozorov October 2018 Physics 590B types of local probes microscopic (site-specific) NMR neutrons Mossbauer stationary Bitter decoration magneto-optics
More informationX-RAY MICRODIFFRACTION STUDY OF THE HALF-V SHAPED SWITCHING LIQUID CRYSTAL
Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 321 X-RAY MICRODIFFRACTION STUDY OF THE HALF-V SHAPED SWITCHING LIQUID CRYSTAL Kazuhiro Takada 1,
More informationDEVELOPMENT OF MEASURING SYSTEM FOR STRESS BY MEANS OF IMAGE PLATE FOR LABORATORY X-RAY EXPERIMENT
Copyright JCPDS - International Centre for Diffraction Data 003, Advances in X-ray Analysis, Volume 46. 6 DEVELOPMENT OF MEASURING SYSTEM FOR STRESS BY MEANS OF IMAGE PLATE FOR LABORATORY X-RAY EXPERIMENT
More informationThe EPOS System (ELBE Positron Source) at Helmholtz Centre Dresden- Rossendorf and first experiments at photovoltaic CIGS layers
The EPOS System (ELBE Positron Source) at Helmholtz Centre Dresden- Rossendorf and first experiments at photovoltaic CIGS layers R. Krause-Rehberg 1, A. Wagner 2 and many colleagues of Univ. Halle and
More informationSchool on Pulsed Neutrons: Characterization of Materials October Neurton Sources & Scattering Techniques (1-2)
1866-6 School on Pulsed Neutrons: Characterization of Materials 15-26 October 2007 Neurton Sources & Scattering Techniques (1-2) Guenter Bauer Forschungzentrum Julich GmbH Julich Germany The Abdus Salam
More informationSYNCHROTRON X-RAY MICROBEAM CHARACTERIZATION OF SMECTIC A LIQUID CRYSTALS UNDER ELECTRIC FIELD
73 SYNCHROTRON X-RAY MICROBEAM CHARACTERIZATION OF SMECTIC A LIQUID CRYSTALS UNDER ELECTRIC FIELD Atsuo Iida 1), Yoichi Takanishi 2) 1)Photon Factory, Institute of Materials Structure Science, High Energy
More informationMagnetic measurements (Pt. IV) advanced probes
Magnetic measurements (Pt. IV) advanced probes Ruslan Prozorov 26 February 2014 Physics 590B types of local probes microscopic (site-specific) NMR neutrons Mossbauer stationary Bitter decoration magneto-optics
More informationPeter L Warren, Pamela Y Shadforth ICI Technology, Wilton, Middlesbrough, U.K.
783 SCOPE AND LIMITATIONS XRF ANALYSIS FOR SEMI-QUANTITATIVE Introduction Peter L Warren, Pamela Y Shadforth ICI Technology, Wilton, Middlesbrough, U.K. Historically x-ray fluorescence spectrometry has
More informationRadiation Detection for the Beta- Delayed Alpha and Gamma Decay of 20 Na. Ellen Simmons
Radiation Detection for the Beta- Delayed Alpha and Gamma Decay of 20 Na Ellen Simmons 1 Contents Introduction Review of the Types of Radiation Charged Particle Radiation Detection Review of Semiconductor
More informationTime-Resolved μ-xrf and Elemental Mapping of Biological Materials
296 Time-Resolved μ-xrf and Elemental Mapping of Biological Materials K. Tsuji 1,2), K. Tsutsumimoto 1), K. Nakano 1,2), K. Tanaka 1), A. Okhrimovskyy 1), Y. Konishi 1), and X. Ding 3) 1) Department of
More informationEffect of Co-60 Single Escape Peak on Detection of Cs-137 in Analysis of Radionuclide from Research Reactor. Abstract
Organized and hosted by the Canadian Nuclear Society. Vancouver, BC, Canada. 2006 September 10-14 Effect of Co-60 Single Escape Peak on Detection of Cs-137 in Analysis of Radionuclide from Research Reactor
More informationEFFECT OF THE HOLE-BOTTOM FILLET RADIUS ON THE RESIDUAL STRESS ANALYSIS BY THE HOLE DRILLING METHOD
63 EFFECT OF THE HOLE-BOTTOM FILLET RADIUS ON THE RESIDUAL STRESS ANALYSIS BY THE HOLE DRILLING METHOD M. Scafidi a, E. Valentini b, B. Zuccarello a scafidi@dima.unipa.it, emilio.valentini@sintechnology.com,
More informationin Si by means of Positron Annihilation
Investigation of the Rp/2 /2-effect in Si by means of Positron Annihilation R. Krause-Rehberg, F. Börner, F. Redmann Universität Halle Martin-Luther-Universität R. Kögler, W. Skorupa Forschungszentrum
More informationLASER SPECTROSCOPIC STUDIES OF NEUTRON-DEFICIENT EUROPIUM AND GADOLINIUM ISOTOPES
LASER SPECTROSCOPIC STUDIES OF NEUTRON-DEFICIENT EUROPIUM AND GADOLINIUM ISOTOPES A.E. Barzakh, D.V. Fedorov, A.M. Ionan, V.S. Ivanov, F.V. Moroz, K.A. Mezilev, S.Yu. Orlov, V.N. Panteleev, Yu.M. Volkov
More informationFission fragment mass distributions via prompt γ -ray spectroscopy
PRAMANA c Indian Academy of Sciences Vol. 85, No. 3 journal of September 2015 physics pp. 379 384 Fission fragment mass distributions via prompt γ -ray spectroscopy L S DANU, D C BISWAS, B K NAYAK and
More informationNuclear Physics. (PHY-231) Dr C. M. Cormack. Nuclear Physics This Lecture
Nuclear Physics (PHY-31) Dr C. M. Cormack 11 Nuclear Physics This Lecture This Lecture We will discuss an important effect in nuclear spectroscopy The Mössbauer Effect and its applications in technology
More informationPositron Annihilation techniques for material defect studies
Positron Annihilation techniques for material defect studies H. Schut Section : Neutron and Positron Methods in Materials (NPM 2 ) Department: Radiation, Radionuclides and Reactors (R 3 ) Faculty of Applied
More informationNuclear Decays. Alpha Decay
Nuclear Decays The first evidence of radioactivity was a photographic plate, wrapped in black paper and placed under a piece of uranium salt by Henri Becquerel on February 26, 1896. Like many events in
More informationInternational Journal of Scientific & Engineering Research, Volume 5, Issue 3, March-2014 ISSN
316 Effective atomic number of composite materials by Compton scattering - nondestructive evaluation method Kiran K U a, Ravindraswami K b, Eshwarappa K M a and Somashekarappa H M c* a Government Science
More informationPositron theoretical prediction
Positron theoretical prediction Schrödinger equation: ˆ 2 p x, t Vx, t x, t i 22 m tt non-relativistic equation of motion for electron Erwin Schrödinger 1933 Nobel prize Positron theoretical prediction
More informationPositron Annihilation in Material Research
Positron Annihilation in Material Research Introduction Positron sources, positron beams Interaction of positrons with matter Annihilation channels: Emission of 1, 2 or 3 γ-quanta Annihilation spectroscopies:
More informationEmphasis on what happens to emitted particle (if no nuclear reaction and MEDIUM (i.e., atomic effects)
LECTURE 5: INTERACTION OF RADIATION WITH MATTER All radiation is detected through its interaction with matter! INTRODUCTION: What happens when radiation passes through matter? Emphasis on what happens
More informationGeant4 Monte Carlo code application in photon interaction parameter of composite materials and comparison with XCOM and experimental data
Indian Journal of Pure & Applied Physics Vol. 54, Februray 2016, pp. 137-143 Geant4 Monte Carlo code application in photon interaction parameter of composite materials and comparison with XCOM and experimental
More information1. Nuclear Size. A typical atom radius is a few!10 "10 m (Angstroms). The nuclear radius is a few!10 "15 m (Fermi).
1. Nuclear Size We have known since Rutherford s! " scattering work at Manchester in 1907, that almost all the mass of the atom is contained in a very small volume with high electric charge. Nucleus with
More informationCoulomb crystal extraction from an ion trap for application to nano-beam source"
Coulomb crystal extraction from an ion trap for application to nano-beam source" K. Ito, K. Izawa, H. Higaki and H. Okamoto,! Aadvanced Sciences of Matter, Hiroshima University,! 1-3-1 Kagamiyama, Higashi-Hiroshima,
More informationGaetano L Episcopo. Scanning Electron Microscopy Focus Ion Beam and. Pulsed Plasma Deposition
Gaetano L Episcopo Scanning Electron Microscopy Focus Ion Beam and Pulsed Plasma Deposition Hystorical background Scientific discoveries 1897: J. Thomson discovers the electron. 1924: L. de Broglie propose
More informationInteractions with Matter Photons, Electrons and Neutrons
Interactions with Matter Photons, Electrons and Neutrons Ionizing Interactions Jason Matney, MS, PhD Interactions of Ionizing Radiation 1. Photon Interactions Indirectly Ionizing 2. Charge Particle Interactions
More informationTHE COMPTON EFFECT Last Revised: January 5, 2007
B2-1 THE COMPTON EFFECT Last Revised: January 5, 2007 QUESTION TO BE INVESTIGATED: How does the energy of a scattered photon change after an interaction with an electron? INTRODUCTION: When a photon is
More informationRb, which had been compressed to a density of 1013
Modern Physics Study Questions for the Spring 2018 Departmental Exam December 3, 2017 1. An electron is initially at rest in a uniform electric field E in the negative y direction and a uniform magnetic
More informationConclusion. 109m Ag isomer showed that there is no such broadening. Because one can hardly
Conclusion This small book presents a description of the results of studies performed over many years by our research group, which, in the best period, included 15 physicists and laboratory assistants
More information4. Inelastic Scattering
1 4. Inelastic Scattering Some inelastic scattering processes A vast range of inelastic scattering processes can occur during illumination of a specimen with a highenergy electron beam. In principle, many
More informationADVANTAGES AND DISADVANTAGES OF BAYESIAN METHODS FOR OBTAINING XRF NET INTENSITIES
187 188 ADVANTAGES AND DISADVANTAGES OF BAYESIAN METHODS FOR OBTAINING XRF NET INTENSITIES ABSTRACT W. T. Elam, B. Scruggs, F. Eggert, and J. A. Nicolosi EDAX, a unit of Ametek Inc., 91 McKee Drive, Mahwah,
More informationA COMPACT X-RAY SPECTROMETER WITH MULTI-CAPILLARY X-RAY LENS AND FLAT CRYSTALS
Copyright(c)JCPDS-International Centre for Diffraction Data 2001,Advances in X-ray Analysis,Vol.44 320 A COMPACT X-RAY SPECTROMETER WITH MULTI-CAPILLARY X-RAY LENS AND FLAT CRYSTALS Hiroyoshi SOEJIMA and
More informationFUNDAMENTAL PARAMETER METHOD USING SCATTERING X-RAYS IN X-RAY FLUORESCENCE ANALYSIS
FUNDAMENTAL PARAMETER METHOD USING SCATTERING X-RAYS IN X-RAY FLUORESCENCE ANALYSIS 255 Yoshiyuki Kataoka 1, Naoki Kawahara 1, Shinya Hara 1, Yasujiro Yamada 1, Takashi Matsuo 1, Michael Mantler 2 1 Rigaku
More informationAn Introduction to Diffraction and Scattering. School of Chemistry The University of Sydney
An Introduction to Diffraction and Scattering Brendan J. Kennedy School of Chemistry The University of Sydney 1) Strong forces 2) Weak forces Types of Forces 3) Electromagnetic forces 4) Gravity Types
More informationIdentification of Getter Defects in high-energy self-implanted Silicon at Rp/2
Identification of Getter Defects in high-energy self-implanted Silicon at Rp R. Krause-Rehberg 1, F. Börner 1, F. Redmann 1, J. Gebauer 1, R. Kögler 2, R. Kliemann 2, W. Skorupa 2, W. Egger 3, G. Kögel
More informationCHARACTERIZING PROCESS SEMICONDUCTOR THIN FILMS WITH A CONFOCAL MICRO X-RAY FLUORESCENCE MICROSCOPE
CHARACTERIZING PROCESS SEMICONDUCTOR THIN FILMS WITH A CONFOCAL MICRO X-RAY FLUORESCENCE MICROSCOPE 218 Chris M. Sparks 1, Elizabeth P. Hastings 2, George J. Havrilla 2, and Michael Beckstead 2 1. ATDF,
More informationCHAPTER-II Experimental Techniques and Data Analysis (Positron annihilation spectroscopy)
CHAPTER-II Experimental Techniques and Data Analysis (Positron annihilation spectroscopy) 64 Techniques in Positron annihilation spectroscopy PAS comprises of different techniques which provide information
More informationPOLYCAPILLARY OPTICS BASED NEUTRON FOCUSING FOR SMALL SAMPLE NEUTRON CRYSTALLOGRAPHY
Copyright (c)jcpds-international Centre for Diffraction Data 2002, Advances in X-ray Analysis, Volume 45. 306 POLYCAPILLARY OPTICS BASED NEUTRON FOCUSING FOR SMALL SAMPLE NEUTRON CRYSTALLOGRAPHY W.M. Gibson
More informationExercise 1 Atomic line spectra 1/9
Exercise 1 Atomic line spectra 1/9 The energy-level scheme for the hypothetical one-electron element Juliettium is shown in the figure on the left. The potential energy is taken to be zero for an electron
More informationIMPROVEMENT OF DETECTION LIMITS OF A PORTABLE TXRF BY REDUCING ELECTRICAL NOISE
Copyright JCPDS-International Centre for Diffraction Data 2012 ISSN 1097-0002 281 IMPROVEMENT OF DETECTION LIMITS OF A PORTABLE TXRF BY REDUCING ELECTRICAL NOISE Susumu Imashuku 1, Deh Ping Tee 1, Yasukazu
More informationMATERIALS CHARACTERIZATION USING A NOVEL SIMULTANEOUS NEAR-INFRARED/X-RAY DIFFRACTION INSTRUMENT
Copyright JCPDS - International Centre for Diffraction Data 2004, Advances in X-ray Analysis, Volume 47. 249 MATERIALS CHARACTERIZATION USING A NOVEL SIMULTANEOUS NEAR-INFRARED/X-RAY DIFFRACTION INSTRUMENT
More informationAn Analysis of Secondary Enhancement Effects in Quantitative XRFA
An Analysis of Secondary Enhancement Effects in Quantitative XRFA Michael Mantler Institut fur Angewandte und Technische Physik Vienna University of Technology, Vienna, Austria Secondary enhancement effects
More informationEnergy Spectroscopy. Excitation by means of a probe
Energy Spectroscopy Excitation by means of a probe Energy spectral analysis of the in coming particles -> XAS or Energy spectral analysis of the out coming particles Different probes are possible: Auger
More informationInteraction of Particles and Matter
MORE CHAPTER 11, #7 Interaction of Particles and Matter In this More section we will discuss briefly the main interactions of charged particles, neutrons, and photons with matter. Understanding these interactions
More informationBENEFITS OF IMPROVED RESOLUTION FOR EDXRF
135 Abstract BENEFITS OF IMPROVED RESOLUTION FOR EDXRF R. Redus 1, T. Pantazis 1, J. Pantazis 1, A. Huber 1, B. Cross 2 1 Amptek, Inc., 14 DeAngelo Dr, Bedford MA 01730, 781-275-2242, www.amptek.com 2
More informationVacuum System of Synchrotron radiation sources
3 rd ILSF Advanced School on Synchrotron Radiation and Its Applications September 14-16, 2013 Vacuum System of Synchrotron radiation sources Prepared by: Omid Seify, Vacuum group, ILSF project Institute
More informationInteraction of ion beams with matter
Interaction of ion beams with matter Introduction Nuclear and electronic energy loss Radiation damage process Displacements by nuclear stopping Defects by electronic energy loss Defect-free irradiation
More informationApplication of a Laser-Wakefield Driven Monochromatic Photon Source to Nuclear Resonance Fluorescence
2009 IEEE Nuclear Science Symposium Conference Record N04-4 Application of a Laser-Wakefield Driven Monochromatic Photon Source to Nuclear Resonance Fluorescence W.J. Walsh, S.D. Clarke, S.A. Pozzi, IEEE
More informationGamma ray coincidence and angular correlation
University of Cape Town Department of Physics Course III laboratory Gamma ray coincidence and angular correlation Introduction Medical imaging based on positron emission tomography (PET) continues to have
More informationChemical Analysis in TEM: XEDS, EELS and EFTEM. HRTEM PhD course Lecture 5
Chemical Analysis in TEM: XEDS, EELS and EFTEM HRTEM PhD course Lecture 5 1 Part IV Subject Chapter Prio x-ray spectrometry 32 1 Spectra and mapping 33 2 Qualitative XEDS 34 1 Quantitative XEDS 35.1-35.4
More informationDavid B. Cassidy. Department of Physics and Astronomy, University of California, Riverside, USA. Varenna, July 09
Experimental production of many- positron systems: L2, techniques David B. Cassidy Department of Physics and Astronomy, University of California, Riverside, USA cassidy@physics.ucr.edu Varenna, July 09
More informationAiro International Research Journal October, 2015 Volume VI, ISSN:
1 INTERACTION BETWEEN CHARGED PARTICLE AND MATTER Kamaljeet Singh NET Qualified Declaration of Author: I hereby declare that the content of this research paper has been truly made by me including the title
More informationPositron Probe Microanalyzer (PPMA) facilities at AIST
Positron Probe Microanalyzer (PPMA) and other accelerator based slow positron facilities at AIST B. E. O Rourke, N. Oshima, A. Kinomura, T. Ohdaira and R. Suzuki National Institute of Advanced Industrial
More informationat Oak Ridge National Laboratory.
361 Designs for Neutron Radiography at Oak Ridge National Laboratory and Computed Tomography Dudley A. Raine lipv4, Camden R. Hubbard, Paul M. Whaley, and Michael C. Wright3 Oak Ridge National Laboratory
More informationQuantitative Assessment of Scattering Contributions in MeV-Industrial X-ray Computed Tomography
11th European Conference on Non-Destructive Testing (ECNDT 2014), October 6-10, 2014, Prague, Czech Republic More Info at Open Access Database www.ndt.net/?id=16530 Quantitative Assessment of Scattering
More informationOptimization studies of photo-neutron production in high-z metallic targets using high energy electron beam for ADS and transmutation
PRAMANA c Indian Academy of Sciences Vol. 68, No. 2 journal of February 2007 physics pp. 235 241 Optimization studies of photo-neutron production in high-z metallic targets using high energy electron beam
More informationStudying Metal to Insulator Transitions in Solids using Synchrotron Radiation-based Spectroscopies.
PY482 Lecture. February 28 th, 2013 Studying Metal to Insulator Transitions in Solids using Synchrotron Radiation-based Spectroscopies. Kevin E. Smith Department of Physics Department of Chemistry Division
More informationThe annealing of interstitial carbon atoms in high resistivity n-type silicon after proton irradiation
ROSE/TN/2002-01 The annealing of interstitial carbon atoms in high resistivity n-type silicon after proton irradiation M. Kuhnke a,, E. Fretwurst b, G. Lindstroem b a Department of Electronic and Computer
More informationQuartz-Crystal Spectrometer for the Analysis of Plutonium K X-Rays
Quartz-Crystal Spectrometer for the Analysis of Plutonium K X-Rays Alison V. Goodsell, William S. Charlton alisong@tamu.edu, charlton@ne.tamu.edu Nuclear Security Science & Policy Institute Texas A&M University,
More informationDetermination of the boron content in polyethylene samples using the reactor Orphée
Determination of the boron content in polyethylene samples using the reactor Orphée F. Gunsing, A. Menelle CEA Saclay, F-91191 Gif-sur-Yvette, France O. Aberle European Organization for Nuclear Research
More information